Patents by Inventor Alain Dubus

Alain Dubus has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus for particle therapy verification
    Patent number: 9186525
    Abstract: The invention is related to an apparatus and method for charged hadron therapy verification by detecting and/or quantifying prompt gammas produced when irradiating a target (6) with a charged hadron beam. The apparatus comprises a collimator (1) provided with a slit-shaped portion (2) configured to be arranged perpendicularly to the beam line and facing the target, a detection means (3,4) suitable for detecting said prompt gammas and a calculation and representation means. In the apparatus and method of the invention, the slit is configured to allow the passage of prompt gammas emitted from a range of depths in said target (6), said depths being measured in the direction of the charged hadron beam.
    Type: Grant
    Filed: February 3, 2012
    Date of Patent: November 17, 2015
    Assignees: Ion Beam Applications S.A., Université Libre de Bruxelles
    Inventors: Damien Prieels, Frédéric Stichelbaut, Julien Smeets, Alain Dubus, Jean-Claude Dehaes
  • Apparatus For Particle Therapy Verification
    Publication number: 20140061493
    Abstract: The invention is related to an apparatus and method for charged hadron therapy verification by detecting and/or quantifying prompt gammas produced when irradiating a target (6) with a charged hadron beam. The apparatus comprises a collimator (1) provided with a slit-shaped portion (2) configured to be arranged perpendicularly to the beam line and facing the target, a detection means (3,4) suitable for detecting said prompt gammas and a calculation and representation means. In the apparatus and method of the invention, the slit is configured to allow the passage of prompt gammas emitted from a range of depths in said target (6), said depths being measured in the direction of the charged hadron beam.
    Type: Application
    Filed: February 3, 2012
    Publication date: March 6, 2014
    Inventors: Damien Prieels, Frédéric Stichelbaut, Julien Smeets, Alain Dubus, Jean-Claude Dehaes
  • Method of quantitative analysis by means of the mean atomic number of phases containing a light element using a scanning microscope and an image analyser
    Patent number: 4847495
    Abstract: The invention relates to an accurate method of quantitative analysis by the quantitative determination of the mean atomic number of phases containing two light elements or one light element combined with heavy elements using a scanning microscope connected to an image analyser of the intensity of the back-scattered electrons. This method of quantitative analysis by the quantitative determination of the mean atomic number (Z.sub.1) with a precision of .+-.0.1 unit of an unknown phase present in the plane micrographic section of a sample, containing either two light elements (3.ltoreq.Z.ltoreq.11) or at least one heavy element (Z>12) and a single light element (3.ltoreq.Z.ltoreq.
    Type: Grant
    Filed: March 17, 1988
    Date of Patent: July 11, 1989
    Assignee: Pechiney
    Inventor: Alain Dubus