Patents by Inventor Alamgir A. Tamboli

Alamgir A. Tamboli has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • PLL LOOP FILTER CAPACITOR TEST CIRCUIT AND METHOD FOR ON CHIP TESTING OF ANALOG LEAKAGE OF A CIRCUIT
    Publication number: 20060164067
    Abstract: A test circuit within an existing design to enable the test circuit to test directly within the circuit. This invention provides a way to test and measure the leakage of the PLL loop filter capacitor leakage during test with a simple digital tester using existing pins. The test PLL circuit has circuit a plurality of capacitors and responsive amplifiers circuits for measuring leakage including a first capacitor set having multiple transistors coupled in series and with a reference resistor circuit coupled to a first amplifier and a second capacitor set having multiple transistors coupled in series and said reference resistor circuit coupled to a second amplifier to measure the leaking across the respective capacitors coupled to said first and second amplifiers and to provide an output of the leakage for measurement with the output of said first and second amplifiers.
    Type: Application
    Filed: January 21, 2005
    Publication date: July 27, 2006
    Applicant: International Business Machines Corporation
    Inventors: James Eckhardt, Paul Muench, George Smith, Alamgir Tamboli
  • PLL loop filter capacitor test circuit and method for on chip testing of analog leakage of a circuit
    Patent number: 7078887
    Abstract: A test circuit within an existing design to enable the test circuit to test directly within the circuit. This invention provides a way to test and measure the leakage of the PLL loop filter capacitor leakage during test with a simple digital tester using existing pins. The test PLL circuit has circuit a plurality of capacitors and responsive amplifiers circuits for measuring leakage including a first capacitor set having multiple transistors coupled in series and with a reference resistor circuit coupled to a first amplifier and a second capacitor set having multiple transistors coupled in series and said reference resistor circuit coupled to a second amplifier to measure the leaking across the respective capacitors coupled to said first and second amplifiers and to provide an output of the leakage for measurement with the output of said first and second amplifiers.
    Type: Grant
    Filed: January 21, 2005
    Date of Patent: July 18, 2006
    Assignee: International Business Machines Corporation
    Inventors: James P. Eckhardt, Paul D. Muench, George E. Smith, III, Alamgir A. Tamboli