Patents by Inventor Alan Henry Leek
Alan Henry Leek has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11805596Abstract: In described examples, an enclosure for circuitry includes a platform, a charge source, a first capacitive plate, a second capacitive plate, and a capacitive sensor. The circuitry is fixedly coupled to the platform. The first capacitive plate is also fixedly coupled to the platform, and either alone, or together with the platform, surrounds a volume containing the circuitry and the charge source, the charge source electrically coupled to and configured to charge the first capacitive plate. The second capacitive plate is fixedly coupled to the platform without touching the first capacitive plate, and either alone, or together with the platform, surrounds the first capacitive plate. The second capacitive plate is configured so that there is an electric potential difference between the first capacitive plate and the second capacitive plate.Type: GrantFiled: February 16, 2021Date of Patent: October 31, 2023Assignee: TEXAS INSTRUMENTS INCORPORATEDInventors: Alan Henry Leek, Jace Hunter Hall
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Publication number: 20210168933Abstract: In described examples, an enclosure for circuitry includes a platform, a charge source, a first capacitive plate, a second capacitive plate, and a capacitive sensor. The circuitry is fixedly coupled to the platform. The first capacitive plate is also fixedly coupled to the platform, and either alone, or together with the platform, surrounds a volume containing the circuitry and the charge source, the charge source electrically coupled to and configured to charge the first capacitive plate. The second capacitive plate is fixedly coupled to the platform without touching the first capacitive plate, and either alone, or together with the platform, surrounds the first capacitive plate. The second capacitive plate is configured so that there is an electric potential difference between the first capacitive plate and the second capacitive plate.Type: ApplicationFiled: February 16, 2021Publication date: June 3, 2021Inventors: Alan Henry Leek, Jace Hunter Hall
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Patent number: 10925154Abstract: In described examples, an enclosure for circuitry includes a platform, a charge source, a first capacitive plate, a second capacitive plate, and a capacitive sensor. The circuitry is fixedly coupled to the platform. The first capacitive plate is also fixedly coupled to the platform, and either alone, or together with the platform, surrounds a volume containing the circuitry and the charge source, the charge source electrically coupled to and configured to charge the first capacitive plate. The second capacitive plate is fixedly coupled to the platform without touching the first capacitive plate, and either alone, or together with the platform, surrounds the first capacitive plate. The second capacitive plate is configured so that there is an electric potential difference between the first capacitive plate and the second capacitive plate.Type: GrantFiled: January 31, 2019Date of Patent: February 16, 2021Assignee: Texas Instruments IncorporatedInventors: Alan Henry Leek, Jace Hunter Hall
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Publication number: 20200253042Abstract: In described examples, an enclosure for circuitry includes a platform, a charge source, a first capacitive plate, a second capacitive plate, and a capacitive sensor. The circuitry is fixedly coupled to the platform. The first capacitive plate is also fixedly coupled to the platform, and either alone, or together with the platform, surrounds a volume containing the circuitry and the charge source, the charge source electrically coupled to and configured to charge the first capacitive plate. The second capacitive plate is fixedly coupled to the platform without touching the first capacitive plate, and either alone, or together with the platform, surrounds the first capacitive plate. The second capacitive plate is configured so that there is an electric potential difference between the first capacitive plate and the second capacitive plate.Type: ApplicationFiled: January 31, 2019Publication date: August 6, 2020Inventors: Alan Henry Leek, Jace Hunter Hall
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Patent number: 10514348Abstract: A system includes a controller to provide at least one control output to an automated system in response to a control command received at a control input of the controller. The control output controls the operation of the automated system based on the control command. A signature analyzer generates the control command to the controller and receives an impedance signature related to a property of a material or object encountered by the automated system. The signature analyzer compares the impedance signature to at least one comparison signature to determine the property of the material or object. The signature analyzer adjusts the control command to the controller to control the operation of the automated system based on the determined property.Type: GrantFiled: January 24, 2018Date of Patent: December 24, 2019Assignee: TEXAS INSTRUMENTS INCORPORATEDInventors: Charles Kasimer Sestok, IV, Alan Henry Leek, Bjoern Oliver Eversmann, Matthew Justin Calvo
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Patent number: 10474307Abstract: A material-discerning proximity sensor is arranged to include an antenna that is arranged to radiate a radio-frequency signal. A capacitive sensor is arranged to detect a change in capacitance of the capacitive sensor and to receive the radio-frequency signal. An electrical quantity sensor is arranged to detect a change of the received radio-frequency signal.Type: GrantFiled: November 30, 2015Date of Patent: November 12, 2019Assignee: TEXAS INSTRUMENTS INCORPORATEDInventor: Alan Henry Leek
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Patent number: 10191097Abstract: A microcontroller-based system for measuring the impedance of a device under test (DUT), responsive to a square wave stimulus, includes parallel stimulus signal paths, selectable by a switch, that can correspond to different stimulus frequency ranges. At least one of the paths includes an off-chip PLL and integer divider circuit to modify the frequency of the stimulus. A discrete Fourier transform executed by a processor is used to determine the impedance of the DUT at the stimulus frequency. Multiple frequencies can be analyzed at the same time by using a summation circuit and/or by analyzing odd harmonics of the stimulus frequency.Type: GrantFiled: December 22, 2016Date of Patent: January 29, 2019Assignee: TEXAS INSTRUMENTS INCORPORATEDInventors: Charles Kasimer Sestok, IV, Srinath Ramaswamy, Anand Ganesh Dabak, Domingo G. Garcia, Baher Haroun, Alan Henry Leek, Ryan Michael Brown
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Publication number: 20180186006Abstract: A system includes a controller to provide at least one control output to an automated system in response to a control command received at a control input of the controller. The control output controls the operation of the automated system based on the control command. A signature analyzer generates the control command to the controller and receives an impedance signature related to a property of a material or object encountered by the automated system. The signature analyzer compares the impedance signature to at least one comparison signature to determine the property of the material or object. The signature analyzer adjusts the control command to the controller to control the operation of the automated system based on the determined property.Type: ApplicationFiled: January 24, 2018Publication date: July 5, 2018Inventors: CHARLES KASIMER SESTOK, IV, ALAN HENRY LEEK, BJOERN OLIVER EVERSMANN, MATTHEW JUSTIN CALVO
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Publication number: 20180180652Abstract: A microcontroller-based system for measuring the impedance of a device under test (DUT), responsive to a square wave stimulus, includes parallel stimulus signal paths, selectable by a switch, that can correspond to different stimulus frequency ranges. At least one of the paths includes an off-chip PLL and integer divider circuit to modify the frequency of the stimulus. A discrete Fourier transform executed by a processor is used to determine the impedance of the DUT at the stimulus frequency. Multiple frequencies can be analyzed at the same time by using a summation circuit and/or by analyzing odd harmonics of the stimulus frequency.Type: ApplicationFiled: December 22, 2016Publication date: June 28, 2018Inventors: CHARLES KASIMER SESTOK, IV, SRINATH RAMASWAMY, ANAND GANESH DABAK, DOMINGO G. GARCIA, BAHER HAROUN, ALAN HENRY LEEK, RYAN MICHAEL BROWN
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Patent number: 9902068Abstract: A system includes a controller to provide at least one control output to an automated system in response to a control command received at a control input of the controller. The control output controls the operation of the automated system based on the control command. A signature analyzer generates the control command to the controller and receives an impedance signature related to a property of a material or object encountered by the automated system. The signature analyzer compares the impedance signature to at least one comparison signature to determine the property of the material or object. The signature analyzer adjusts the control command to the controller to control the operation of the automated system based on the determined property.Type: GrantFiled: December 29, 2016Date of Patent: February 27, 2018Assignee: TEXAS INSTRUMENTS INCORPORATEDInventors: Charles Kasimer Sestok, IV, Alan Henry Leek, Bjoern Oliver Eversmann, Matthew Justin Calvo
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Publication number: 20160077639Abstract: A material-discerning proximity sensor is arranged to include an antenna that is arranged to radiate a radio-frequency signal. A capacitive sensor is arranged to detect a change in capacitance of the capacitive sensor and to receive the radio-frequency signal. An electrical quantity sensor is arranged to detect a change of the received radio-frequency signal.Type: ApplicationFiled: November 30, 2015Publication date: March 17, 2016Inventor: Alan Henry Leek
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Patent number: 9201548Abstract: A material-discerning proximity sensor is arranged to include an antenna that is arranged to radiate a radio-frequency signal. A capacitive sensor is arranged to detect a change in capacitance of the capacitive sensor and to receive the radio-frequency signal. An electrical quantity sensor is arranged to detect a change of the received radio-frequency signal.Type: GrantFiled: June 26, 2012Date of Patent: December 1, 2015Assignee: TEXAS INSTRUMENTS INCORPORATEDInventor: Alan Henry Leek
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Publication number: 20130293244Abstract: A material-discerning proximity sensor is arranged to include an antenna that is arranged to radiate a radio-frequency signal. A capacitive sensor is arranged to detect a change in capacitance of the capacitive sensor and to receive the radio-frequency signal. An electrical quantity sensor is arranged to detect a change of the received radio-frequency signal.Type: ApplicationFiled: June 26, 2012Publication date: November 7, 2013Applicant: TEXAS INSTRUMENTS, INCORPORATEDInventor: Alan Henry Leek