Patents by Inventor Alan R. Bayly

Alan R. Bayly has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Secondary ion mass spectrometer with independently variable extraction field
    Patent number: 5034605
    Abstract: A method and apparatus for the micro-analysis of a sample surface wherein a mass analyzer is used to analyze secondary ions emitted from the surface in response to the impact of primary radiation. The method comprises: extracting the secondary ions in an electric extraction field maintained by applying an extraction potential difference between the sample and an extraction means, and also maintaining an accelerating potential difference between the sample and the mass analyzer thereby increasing the kinetic energy of the secondary ions to be substantially equal to the energy required for analysis in the mass analyzer; the extraction potential difference being less than the accelerating potential difference. In this way the extraction field can be controlled independently of the accelerating potential between the sample and the mass analyzer.
    Type: Grant
    Filed: November 17, 1989
    Date of Patent: July 23, 1991
    Assignee: VG Instruments Group Limited
    Inventor: Alan R. Bayly