Abstract: A residual current device (RCD) comprises test circuitry which issues intermittent first test pulses each simulating a residual current fault for which a corresponding fault signal is generated. In the case of a fault in which a corresponding fault signal is not received in respect of a first pulse, the RCD attempts to force the load contacts open. The test circuitry further issues intermittent second test pulses at a frequency less than that of the first test pulses, each second test pulse simulating a residual current for which a corresponding fault signal is generated. The duration of each corresponding fault signal is greater than the response time of the load contacts to allow the load contacts to open. If the test circuitry detects that the load contacts do not open, the RCD attempts to force the load contacts open.

Abstract: A residual current device (RCD) comprises test circuitry which issues intermittent first test pulses each simulating a residual current fault for which a corresponding fault signal is generated. In the case of a fault in which a corresponding fault signal is not received in respect of a first pulse, the RCD attempts to force the load contacts open. The test circuitry further issues intermittent second test pulses at a frequency less than that of the first test pulses, each second test pulse simulating a residual current for which a corresponding fault signal is generated. The duration of each corresponding fault signal is greater than the response time of the load contacts to allow the load contacts to open. If the test circuitry detects that the load contacts do not open, the RCD attempts to force the load contacts open.

Abstract: A residual current device (RCD) comprises test circuitry which issues intermittent first test pulses each simulating a residual current fault for which a corresponding fault signal is generated. In the case of a fault in which a corresponding fault signal is not received in respect of a first pulse, the RCD attempts to force the load contacts open. The test circuitry further issues intermittent second test pulses at a frequency less than that of the first test pulses, each second test pulse simulating a residual current for which a corresponding fault signal is generated. The duration of each corresponding fault signal is greater than the response time of the load contacts to allow the load contacts to open. If the test circuitry detects that the load contacts do not open, the RCD attempts to force the load contacts open.

Abstract: A residual current device (RCD) comprises test circuitry which issues intermittent first test pulses each simulating a residual current fault for which a corresponding fault signal is generated. In the case of a fault in which a corresponding fault signal is not received in respect of a first pulse, the RCD attempts to force the load contacts open. The test circuitry further issues intermittent second test pulses at a frequency less than that of the first test pulses, each second test pulse simulating a residual current for which a corresponding fault signal is generated. The duration of each corresponding fault signal is greater than the response time of the load contacts to allow the load contacts to open. If the test circuitry detects that the load contacts do not open, the RCD attempts to force the load contacts open.