Abstract: A method and system for accessing support content are described herein. In one embodiment, a method comprises receiving first and second messages relating to respective first and second devices at a computer system via respective first and second communication links, where the first and second messages comprise respective first and second identification codes. The method further comprises accessing a database to read first information mapped to the first identification code, and selecting, based on the first information, an identity of a first support content item from among identities of a plurality of support content items. The method further comprises generating and sending a third message to a server configured to implement an automated support system comprising the first support content item, where the third message comprises the identity of the first support content item.

Abstract: In one embodiment, a first mobile device reads first information associated with a first device or first service contained in a first asset tag. The first mobile device generates a first message in response to reading the first information, wherein the first message comprises the first information. The first mobile device transmits the first message to a computer system via a wireless communication link. The first mobile device receives a first reply in response to transmitting the first message. In response to the first mobile device receiving the first reply, the first mobile device displays first content for a user of the first mobile device to diagnose and/or solve a problem with the first device or first service.

Abstract: A method of enabling access to a test mode of a semiconductor memory in response to user commands. The method enables test mode access only when a number of "keys" are presented in the proper sequence via the memory device pins. During the first phase of the unlocking process, an array controller determines whether the correct confirmation codes were input via the address and data pins. If they were, the array controller proceeds to the second phase of the unlocking process. During the second phase voltage levels on selected control pins are checked for a transition to a first voltage level. If the control pins transition as required, the array controller proceeds to the third phase. During the third phase, the array controller waits a limited time for receipt of a second test mode enable command. The second test mode enable command must be followed by correct confirmation codes. If the third phase is successfully completed, the array controller writes to a test mode enable access register.