Patents by Inventor Alexander Drabenstedt
Alexander Drabenstedt has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10018460Abstract: A device for the interferometric measuring of an object, including a light source to generate an emitted beam, a beam splitting device for splitting the emitted beam into a measuring beam and at least first and second reference beams, an optic interference device, and first and second detectors, with the interference device and the first detector being embodied cooperating such that the measuring beam, at least partially reflected by the object, and the first reference beam are interfered on at least one detector area of the first detector. The interference device and the second detector are embodied cooperating such that the measuring beam, at least partially scattered by the object, and the second reference beam are interfered on at least one detector area of the second detector. A method is also provided for the interferometric measuring of an object.Type: GrantFiled: November 2, 2012Date of Patent: July 10, 2018Assignee: Polytec GmbHInventors: Matthias Schussler, Christian Rembe, Alexander Drabenstedt, Robert Kowarsch, Wanja Ochs
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Patent number: 9910056Abstract: A device for the interferometric measuring of an object, including a source to generate a source beam, a beam splitting device to split the source beam into a measuring beam and a reference beam, an optic interference device and a first detector, which cooperate such that the measuring beam reflected by the object at least partially is at least partially interfered as the receiver beam and the reference beam on a detector area of the first detector. The beam splitting device splits the source beam into a measuring beam, a first partial reference beam, and at least one second partial reference beam. There is at least one second detector embodied such that the first receiver beam is interfered with the first partial reference beam on a detection area of the first detector and the second partial receiver beam with a second partial reference beam on a detection area of the second detector, each with the formation of an optic interference.Type: GrantFiled: January 23, 2017Date of Patent: March 6, 2018Assignee: Polytec GmbHInventors: Matthias Schussler, Christian Rembe, Alexander Drabenstedt, Sebastian Boedecker, Thian-Hua Xu
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Patent number: 9851243Abstract: A device for the optical non-contact vibration measurement of an vibrating object, including a laser Doppler vibrometer that has a laser as the light source for a laser beam, a first beam splitter assembly for splitting the laser beam into a measuring beam and a reference beam, a means for shifting the frequency of the reference beam or of the measuring beam in a defined manner, a second beam splitter assembly by which the measuring beam back-scattered by the oscillating object is merged with the reference beam and superimposed on the same, and a detector for receiving the superimposed measuring and reference beam and for generating a measurement signal. The laser is provided with a polarization filter arranged inside the optical resonator of the laser and the laser is frequency stabilized by regulating to a beat signal of the laser.Type: GrantFiled: March 16, 2012Date of Patent: December 26, 2017Assignee: POLYTEC GMBHInventors: Christian Rembe, Alexander Drabenstedt, Matthias Schussler, Christian Ehrmann, Volkmar Roth
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Publication number: 20170199214Abstract: A device for the interferometric measuring of an object, including a source to generate a source beam, a beam splitting device to split the source beam into a measuring beam and a reference beam, an optic interference device and a first detector, which cooperate such that the measuring beam reflected by the object at least partially is at least partially interfered as the receiver beam and the reference beam on a detector area of the first detector. The beam splitting device splits the source beam into a measuring beam, a first partial reference beam, and at least one second partial reference beam. There is at least one second detector embodied such that the first receiver beam is interfered with the first partial reference beam on a detection area of the first detector and the second partial receiver beam with a second partial reference beam on a detection area of the second detector, each with the formation of an optic interference.Type: ApplicationFiled: January 23, 2017Publication date: July 13, 2017Applicant: Polytec GmbHInventors: Matthias Schussler, Christian Rembe, Alexander Drabenstedt, Sebastian Boedecker, Thian-Hua Xu
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Patent number: 9551726Abstract: A device for the interferometric measuring of an object, including a source to generate a source beam, a beam splitting device to split the source beam into a measuring beam and a reference beam, an optic interference device and a first detector, which cooperate such that the measuring beam reflected by the object at least partially is at least partially interfered as the receiver beam and the reference beam on a detector area of the first detector. The beam splitting device splits the source beam into a measuring beam, a first partial reference beam, and at least one second partial reference beam. There is at least one second detector embodied such that the first receiver beam is interfered with the first partial reference beam on a detection area of the first detector and the second partial receiver beam with a second partial reference beam on a detection area of the second detector, each with the formation of an optic interference.Type: GrantFiled: July 1, 2013Date of Patent: January 24, 2017Assignee: Polytec GmbHInventors: Matthias Schussler, Christian Rembe, Alexander Drabenstedt, Sebastian Boedecker, Thian-Hua Xu
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Patent number: 9212896Abstract: An optical interferometer including an output-beam beam input for coupling-in an output beam, and a beam splitter device for splitting the output beam into at least one first sub-beam and one second sub-beam, the interferometer being embodied as a heterodyne interferometer by virtue of at least one optical frequency shifter being arranged in the beam path of the interferometer and the interferometer including one or more optical waveguide elements, by which optical waveguides are formed, at least between the output-beam beam input, beam splitter device and frequency shifter. The frequency shifter is arranged in the beam path of the first or second sub-beam.Type: GrantFiled: May 27, 2014Date of Patent: December 15, 2015Assignee: POLYTEC GMBHInventors: Michael Wortge, Christian Rembe, Alexander Drabenstedt, Tobias Braun
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Patent number: 8913247Abstract: A device for interferometric vibration measurement, having a radiation source for generating an original beam, a first beam splitter for dividing it into measuring and reference beams, a detector and a focusing device. The measuring beam at least partly reflected by the object and the reference beam are superimposed on a detection area of the detector, and the focusing device in the beam path of the measuring beam between the image unit and object focuses it onto a measuring point. Here, a measuring beam having a wavelength greater than 1100 nm is generated and the device has an image unit for two-dimensional imaging of the object surrounding the measuring point. The measuring beam focus lies in the focal plane of the image unit and, by use of the focusing device, the focal point of the measuring beam and the focal plane of the imaging unit are displaceable simultaneously.Type: GrantFiled: October 19, 2010Date of Patent: December 16, 2014Assignee: Polytec GmbHInventors: Christian Rembe, Alexander Dräbenstedt, Michael Gartner, Mike Herberich, Andreas Leonhardt
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Publication number: 20140347670Abstract: An optical interferometer including an output-beam beam input for coupling-in an output beam, and a beam splitter device for splitting the output beam into at least one first sub-beam and one second sub-beam, the interferometer being embodied as a heterodyne interferometer by virtue of at least one optical frequency shifter being arranged in the beam path of the interferometer and the interferometer including one or more optical waveguide elements, by which optical waveguides are formed, at least between the output-beam beam input, beam splitter device and frequency shifter. The frequency shifter is arranged in the beam path of the first or second sub-beam.Type: ApplicationFiled: May 27, 2014Publication date: November 27, 2014Applicant: POLYTEC GMBHInventors: Michael Wortge, Christian Rembe, Alexander Drabenstedt, Tobias Braun
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Publication number: 20140041456Abstract: A device for the optical non-contact vibration measurement of an vibrating object, including a laser Doppler vibrometer that has a laser (1) as the light source for a laser beam, a first beam splitter assembly (S1) for splitting the laser beam into a measuring beam (2) and a reference beam (3), a means (4) for shifting the frequency of the reference beam (3) or of the measuring beam (2) in a defined manner, a second beam splitter assembly (S2, S3) by which the measuring beam (2) back-scattered by the oscillating object (6) is merged with the reference beam (3) and superimposed on the same, and a detector (5) for receiving the superimposed measuring and reference beam (7) and for generating a measurement signal. The laser (1) is provided with a polarization filter arranged inside the optical resonator of the laser and the laser (1) is frequency stabilized by regulating to a beat signal of the laser.Type: ApplicationFiled: March 16, 2012Publication date: February 13, 2014Applicant: POLYTEC GMBHInventors: Christian Rembe, Alexander Dräbenstedt, Matthias Schüssler, Christian Ehrmann, Volkmar Roth
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Publication number: 20140009750Abstract: A device for the interferometric measuring of an object, including a source to generate a source beam, a beam splitting device to split the source beam into a measuring beam and a reference beam, an optic interference device and a first detector, which cooperate such that the measuring beam reflected by the object at least partially is at least partially interfered as the receiver beam and the reference beam on a detector area of the first detector. The beam splitting device splits the source beam into a measuring beam, a first partial reference beam, and at least one second partial reference beam. There is at least one second detector embodied such that the first receiver beam is interfered with the first partial reference beam on a detection area of the first detector and the second partial receiver beam with a second partial reference beam on a detection area of the second detector, each with the formation of an optic interference.Type: ApplicationFiled: July 1, 2013Publication date: January 9, 2014Inventors: Mathias Schussler, Christian Rembe, Alexander Drabenstedt, Sebastian Boedecker, Thian-Hua Xu
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Publication number: 20110090508Abstract: A device for interferometric vibration measurement on an object (8), having a radiation source (1) for generating an original beam, a first beam splitter for dividing the original beam into a measuring beam and a reference beam (4, 5), a detector (10) and a focusing device (9). The device is implemented in such a way that the measuring beam at least partly reflected by the object and the reference beam are superimposed on a detection area of the detector, and the focusing device is arranged in the beam path of the measuring beam for focusing the measuring beam onto a measuring point (7) on the object. It is important that, by using the device, a measuring beam having a wavelength greater than 1100 nm can be generated and that the device additionally has an image unit (12) for two-dimensional imaging of at least a sub-region of the object surrounding the measuring point.Type: ApplicationFiled: October 19, 2010Publication date: April 21, 2011Applicant: POLYTEC GMBHInventors: Christian Rembe, Alexander Drabenstedt, Michael Gartner, Mike Herberich, Andreas Leonhardt
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Patent number: 7852487Abstract: A device for the optic measuring of an object (1), including a signal processing unit (2) as well as an interferometer with a light source (3) and with at least one detector (4a, 4d). The interferometer is embodied such that a light beam (12) created by the light source (3) is split at least into a working beam (12a) and a reference beam (12b), with the working beam (12a) impinging the object (1) and the working beam (12a) is at least partially reflected by the object and interfered with the reference beam (12b) on the detector (4a, 4b). The signal processing unit (2) is connected to the detector (4a, 4b) and includes a vibrometer processing unit (2f), which detects the motion of the object (1) from the measuring signals of the detector (4a, 4d).Type: GrantFiled: February 29, 2008Date of Patent: December 14, 2010Assignee: Polytec GmbHInventors: Christian Rembe, Alexander Drabenstedt, Georg Siegmund
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Publication number: 20080285049Abstract: A device for the optic measuring of an object (1), including a signal processing unit (2) as well as an interferometer with a light source (3) and with at least one detector (4a, 4d). The interferometer is embodied such that a light beam (12) created by the light source (3) is split at least into a working beam (12a) and a reference beam (12b), with the working beam (12a) impinging the object (1) and the working beam (12a) is at least partially reflected by the object and interfered with the reference beam (12b) on the detector (4a, 4b). The signal processing unit (2) is connected to the detector (4a, 4b) and includes a vibrometer processing unit (2f), which detects the motion of the object (1) from the measuring signals of the detector (4a, 4d).Type: ApplicationFiled: February 29, 2008Publication date: November 20, 2008Applicant: POLYTEC GMBHInventors: Christian Rembe, Alexander Drabenstedt, Georg Siegmund
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Patent number: 7079227Abstract: An optical assembly to be mounted on a microscope for measuring micro-structures is provided, which images a first object image (7) onto a second object image (8) lying above the optical assembly and in this way shifts the object image at a standardized interface for a camera (12), as well as the interface for the camera itself, upwards. The optical assembly permits a stroboscope lamp (6) to be coupled into the incident beam path of the microscope over a beam splitter (5) without requiring any structural modifications to the microscope. Instead, the optical assembly according to the invention is simply mounted on the C-mount of the microscope. The invention enables the use of stroboscope lamps in commercially available microscopes, which otherwise are not suitable for stroboscopic examinations.Type: GrantFiled: January 28, 2004Date of Patent: July 18, 2006Assignee: Polytec GmbHInventors: Christian Rembe, Alexander Dräbenstedt
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Publication number: 20040196448Abstract: An optical assembly to be mounted on a microscope for measuring micro-structures is provided, which images a first object image (7) onto a second object image (8) lying above the optical assembly and in this way shifts the object image at a standardized interface for a camera (12), as well as the interface for the camera itself, upwards. The optical assembly permits a stroboscope lamp (6) to be coupled into the incident beam path of the microscope over a beam splitter (5) without requiring any structural modifications to the microscope. Instead, the optical assembly according to the invention is simply mounted on the C-mount of the microscope. The invention enables the use of stroboscope lamps in commercially available microscopes, which otherwise are not suitable for stroboscopic examinations.Type: ApplicationFiled: January 28, 2004Publication date: October 7, 2004Applicant: Polytec GmbHInventors: Christian Rembe, Alexander Drabenstedt