Patents by Inventor Alexander Groholski
Alexander Groholski has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Publication number: 20220316062Abstract: The present disclosure provides a gas injection system that can include a housing configured to hold a plurality of precursor cartridges comprising one or more precursor materials, and a nozzle extending from the housing, the nozzle having a tip configured for insertion into a sample chamber of a material processing apparatus. The precursor cartridges are fluidly connected to the nozzle to selectively deliver one or more precursor gasses to the sample chamber.Type: ApplicationFiled: January 14, 2022Publication date: October 6, 2022Inventors: Alexander Groholski, Valery Ray, Joseph Favata
-
Patent number: 11261527Abstract: The present disclosure provides a gas injection system that can include a housing configured to hold a plurality of precursor cartridges comprising one or more precursor materials, and a nozzle extending from the housing, the nozzle having a tip configured for insertion into a sample chamber of a material processing apparatus. The precursor cartridges are fluidly connected to the nozzle to selectively deliver one or more precursor gasses to the sample chamber.Type: GrantFiled: August 12, 2020Date of Patent: March 1, 2022Assignee: MEO Engineering Company, Inc.Inventors: Alexander Groholski, Valery Ray, Joseph Favata
-
Publication number: 20210047731Abstract: The present disclosure provides a gas injection system that can include a housing configured to hold a plurality of precursor cartridges comprising one or more precursor materials, and a nozzle extending from the housing, the nozzle having a tip configured for insertion into a sample chamber of a material processing apparatus. The precursor cartridges are fluidly connected to the nozzle to selectively deliver one or more precursor gasses to the sample chamber.Type: ApplicationFiled: August 12, 2020Publication date: February 18, 2021Inventors: Alexander Groholski, Valery Ray, Joseph Favata
-
Patent number: 9536699Abstract: The present disclosure relates to a gas field ion source having a gun housing, an electrically conductive gun can base attached to the gun housing, an inner tube mounted to the gun can base, the inner tube being made of an electrically isolating ceramic, an electrically conductive tip attached to the inner tube, an outer tube mounted to the gun can base, the outer tube being made of an electrically isolating ceramic, and an extractor electrode attached to the outer tube. The extractor electrode can have an opening for the passage of ions generated in proximity to the electrically conductive tip.Type: GrantFiled: June 25, 2014Date of Patent: January 3, 2017Assignee: Carl Zeiss Microscopy, LLCInventors: John A. Notte, IV, Weijie Huang, Raymond Hill, FHM-Faridur Rahman, Alexander Groholski, Shawn McVey
-
Patent number: 9530611Abstract: The present disclosure relates to a charged particle beam system, comprising a noble gas field ion beam source, a charged particle beam column, and a housing defining a first vacuum region and a second vacuum region. A noble gas field ion beam source is arranged within the first vacuum region. A first mechanical vacuum pump is functionally attached to the first vacuum region, an ion getter pump is attached to the charged particle beam column, and a gas supply is attached to the first vacuum region configured to supply a noble gas to the noble gas field ion beam source.Type: GrantFiled: June 25, 2014Date of Patent: December 27, 2016Assignee: Carl Zeiss Microscopy, LLCInventors: John A. Notte, IV, Alexander Groholski, Robert Conners, Mark D. DiManna, Raymond Hill
-
Patent number: 9530612Abstract: The present disclosure relates to a charged particle beam system comprising a charged particle beam source, a charged particle column, a sample chamber, a plurality of electrically powered devices arranged within or at either one of the charged particle column, the charged particle beam source and the sample chamber, and at least one first converter to convert an electrical AC voltage power into an electrical DC voltage. The first converter is positioned at a distance from either of the charged particle beam source, the charged particle column and the charged particle chamber, and all elements of the plurality of electrically powered devices, when operated during operation of the charged particle beam source, are configured to be exclusively powered by the DC voltage provided by the converter.Type: GrantFiled: June 25, 2014Date of Patent: December 27, 2016Assignee: Carl Zeiss Microscopy, LLCInventors: John A. Notte, IV, Mark D. DiManna, Raymond Hill, Robert Conners, Alexander Groholski
-
Patent number: 9029765Abstract: Ion sources, systems and methods are disclosed. In some embodiments, the ion sources, systems and methods can exhibit relatively little undesired vibration and/or can sufficiently dampen undesired vibration. This can enhance performance (e.g., increase reliability, stability and the like). In certain embodiments, the ion sources, systems and methods can enhance the ability to make tips having desired physical attributes (e.g., the number of atoms on the apex of the tip). This can enhance performance (e.g., increase reliability, stability and the like).Type: GrantFiled: May 13, 2013Date of Patent: May 12, 2015Assignee: Carl Zeiss Microscopy, LLCInventors: Richard Comunale, Alexander Groholski, John A. Notte, IV, Randall G. Percival, Billy W. Ward
-
Publication number: 20150008342Abstract: The present disclosure relates to a charged particle beam system comprising a charged particle beam source, a charged particle column, a sample chamber, a plurality of electrically powered devices arranged within or at either one of the charged particle column, the charged particle beam source and the sample chamber, and at least one first converter to convert an electrical AC voltage power into an electrical DC voltage. The first converter is positioned at a distance from either of the charged particle beam source, the charged particle column and the charged particle chamber, and all elements of the plurality of electrically powered devices, when operated during operation of the charged particle beam source, are configured to be exclusively powered by the DC voltage provided by the converter.Type: ApplicationFiled: June 25, 2014Publication date: January 8, 2015Inventors: John A. Notte, IV, Mark D. DiManna, Raymond Hill, Robert Conners, Alexander Groholski
-
Publication number: 20150008341Abstract: The present disclosure relates to a charged particle beam system, comprising a noble gas field ion beam source, a charged particle beam column, and a housing defining a first vacuum region and a second vacuum region. A noble gas field ion beam source is arranged within the first vacuum region. A first mechanical vacuum pump is functionally attached to the first vacuum region, an ion getter pump is attached to the charged particle beam column, and a gas supply is attached to the first vacuum region configured to supply a noble gas to the noble gas field ion beam source.Type: ApplicationFiled: June 25, 2014Publication date: January 8, 2015Inventors: John A. Notte, IV, Alexander Groholski, Robert Conners, Mark D. DiManna, Raymond Hill
-
Publication number: 20150008332Abstract: The present disclosure relates to a gas field ion source having a gun housing, an electrically conductive gun can base attached to the gun housing, an inner tube mounted to the gun can base, the inner tube being made of an electrically isolating ceramic, an electrically conductive tip attached to the inner tube, an outer tube mounted to the gun can base, the outer tube being made of an electrically isolating ceramic, and an extractor electrode attached to the outer tube. The extractor electrode can have an opening for the passage of ions generated in proximity to the electrically conductive tip.Type: ApplicationFiled: June 25, 2014Publication date: January 8, 2015Inventors: John A. Notte, IV, Weijie Huang, Raymond Hill, FHM-Faridur Rahman, Alexander Groholski, Shawn McVey
-
Patent number: 8633451Abstract: Ion sources, systems and methods are disclosed. In some embodiments, the ion sources, systems and methods can exhibit relatively little undesired vibration and/or can sufficiently dampen undesired vibration. This can enhance performance (e.g., increase reliability, stability and the like).Type: GrantFiled: June 20, 2008Date of Patent: January 21, 2014Assignee: Carl Zeiss Microscopy, LLCInventors: Billy W. Ward, Colin A. Sanford, John Notte, IV, Alexander Groholski, Mark D. DiManna
-
Publication number: 20130256532Abstract: Ion sources, systems and methods are disclosed. In some embodiments, the ion sources, systems and methods can exhibit relatively little undesired vibration and/or can sufficiently dampen undesired vibration. This can enhance performance (e.g., increase reliability, stability and the like). In certain embodiments, the ion sources, systems and methods can enhance the ability to make tips having desired physical attributes (e.g., the number of atoms on the apex of the tip). This can enhance performance (e.g., increase reliability, stability and the like).Type: ApplicationFiled: May 13, 2013Publication date: October 3, 2013Applicant: Carl Zeiss Microscopy, LLCInventors: Richard Comunale, Alexander Groholski, John A. Notte, IV, Randall G. Percival, Billy W. Ward
-
Patent number: 8461557Abstract: Ion sources, systems and methods are disclosed. In some embodiments, the ion sources, systems and methods can exhibit relatively little undesired vibration and/or can sufficiently dampen undesired vibration. This can enhance performance (e.g., increase reliability, stability and the like). In certain embodiments, the ion sources, systems and methods can enhance the ability to make tips having desired physical attributes (e.g., the number of atoms on the apex of the tip). This can enhance performance (e.g., increase reliability, stability and the like).Type: GrantFiled: June 13, 2008Date of Patent: June 11, 2013Assignee: Carl Zeiss Microscopy, LLCInventors: Richard Comunale, Alexander Groholski, John A. Notte, IV, Randall Percival, Billy W. Ward
-
Publication number: 20130118184Abstract: Cooled charged particle sources and methods are disclosed. In some embodiments, a charged particle source is thermally coupled to a solid cryogen, such as solid nitrogen. The thermal coupling can be design to provide good thermal conductivity to maintain the charged particle source at a desirably low temperature.Type: ApplicationFiled: June 4, 2012Publication date: May 16, 2013Applicant: CARL ZEISS NTS, LLCInventors: Alexander Groholski, Mark D. DiManna, Brian M. Bassett, Louise Barriss, Colin A. Sanford, John Notte IV
-
Publication number: 20120241640Abstract: Ion sources, systems and methods are disclosed. In some embodiments, the ion sources, systems and methods can exhibit relatively little undesired vibration and/or can sufficiently dampen undesired vibration. This can enhance performance (e.g., increase reliability, stability and the like).Type: ApplicationFiled: June 20, 2008Publication date: September 27, 2012Applicant: CARL ZEISS NTS, LLC.Inventors: Billy W. Ward, Colin A. Sanford, John Notte, VI, Alexander Groholski, Mark D. DiManna
-
Publication number: 20110240853Abstract: Ion sources, systems and methods are disclosed. In some embodiments, the ion sources, systems and methods can exhibit relatively little undesired vibration and/or can sufficiently dampen undesired vibration. This can enhance performance (e.g., increase reliability, stability and the like). In certain embodiments, the ion sources, systems and methods can enhance the ability to make tips having desired physical attributes (e.g., the number of atoms on the apex of the tip). This can enhance performance (e.g., increase reliability, stability and the like).Type: ApplicationFiled: June 13, 2008Publication date: October 6, 2011Applicant: CARL ZEISS NTS, LLCInventors: Richard Comunale, Alexander Groholski, John A. Notte, IV, Randall Percival, Billy W. Ward
-
Patent number: 7786451Abstract: Ion sources, systems and methods are disclosed.Type: GrantFiled: November 15, 2006Date of Patent: August 31, 2010Assignee: ALIS CorporationInventors: Billy W. Ward, John A. Notte, IV, Louis S. Farkas, III, Randall G. Percival, Raymond Hill, Alexander Groholski, Richard Comunale
-
Patent number: 7745801Abstract: Ion sources, systems and methods are disclosed.Type: GrantFiled: November 15, 2006Date of Patent: June 29, 2010Assignee: ALIS CorporationInventors: Billy W. Ward, John A. Notte, IV, Louis S. Farkas, III, Randall G. Percival, Raymond Hill, Alexander Groholski, Richard Comunale
-
Publication number: 20070158582Abstract: Ion sources, systems and methods are disclosed.Type: ApplicationFiled: November 15, 2006Publication date: July 12, 2007Inventors: Billy Ward, John Notte, Louis Farkas, Randall Percival, Raymond Hill, Alexander Groholski, Richard Comunale
-
Patent number: 6661009Abstract: The present invention provides a column tilt apparatus and method for providing an off-normal angle of incidence of a beam in a scanned beam system onto a substrate passing through the eucentric point that is electro-mechanically adjustable during operation while maintaining vacuum integrity of the column and work chamber, and without introducing significant vibrations.Type: GrantFiled: May 31, 2002Date of Patent: December 9, 2003Assignee: FEI CompanyInventors: Alexander Groholski, Riccardo Drainoni, Michael Tanguay