Patents by Inventor Alexander Kaya

Alexander Kaya has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8907677
    Abstract: An electrochemical sensor allows even extremely small quantities or concentrations of a target chemical substance to be detected or quantified with a high precision in a particularly reliable manner. The novel sensor has a detector zone formed by nanoparticles which are embedded in a matrix and have a higher electric conductivity than the matrix material. The electric conductivity of the zone is determined by electron tunneling, ionization or hopping processes among the nanoparticles and by the electrochemical interaction thereof with a target substance to be detected.
    Type: Grant
    Filed: October 22, 2009
    Date of Patent: December 9, 2014
    Assignee: Nanoscale Systems, Nanoss GmbH
    Inventor: Alexander Kaya
  • Publication number: 20120019258
    Abstract: An electrochemical sensor allows even extremely small quantities or concentrations of a target chemical substance to be detected or quantified with a high precision in a particularly reliable manner. The novel sensor has a detector zone formed by nanoparticles which are embedded in a matrix and have a higher electric conductivity than the matrix material. The electric conductivity of the zone is determined by electron tunneling, ionization or hopping processes among the nanoparticles and by the electrochemical interaction thereof with a target substance to be detected.
    Type: Application
    Filed: October 22, 2009
    Publication date: January 26, 2012
    Applicant: NANOSCALE SYSTEMS NAOSS GMBH
    Inventor: Alexander Kaya
  • Patent number: 7997125
    Abstract: A miniaturized spring element is intended to be particularly suitable for use as a beam probe or cantilever for detecting atomic or molecular forces, in particular in an atomic force microscope, and, to this end, is intended to make it possible to detect its deflection in a particularly reliable manner and with high resolution. For this purpose, the spring element contains a basic body which is formed from a matrix containing embedded nanoparticles or defects. The spring element is produced using the principle of local deposition with focused energetic particles or electromagnetic waves or by pyrolytically induced deposition.
    Type: Grant
    Filed: August 1, 2008
    Date of Patent: August 16, 2011
    Assignees: Nanoscale Systems, Nanoss GmbH, Johann Wolfgang Goethe-Universitaet
    Inventors: Alexander Kaya, Michael Huth
  • Publication number: 20090025465
    Abstract: A miniaturized spring element is intended to be particularly suitable for use as a beam probe or cantilever for detecting atomic or molecular forces, in particular in an atomic force microscope, and, to this end, is intended to make it possible to detect its deflection in a particularly reliable manner and with high resolution. For this purpose, the spring element contains a basic body which is formed from a matrix containing embedded nanoparticles or defects. The spring element is produced using the principle of local deposition with focused energetic particles or electromagnetic waves or by pyrolytically induced deposition.
    Type: Application
    Filed: August 1, 2008
    Publication date: January 29, 2009
    Applicants: NANOSCALE SYSTEMS, NANOSS GMBH, JOHAN WOLFGANG GOETHE-UNIVERSITäT
    Inventors: Alexander Kaya, Michael Huth
  • Patent number: 6967714
    Abstract: The matter for which the refractive index is to be determined, is made available in the form of a theoretically determinable scattering or diffraction pattern. Two or more orders of diffraction may then be defined to form at least one intensity ratio. At least one intensity distribution may be formed by irradiating the scattering pattern using one light beam of a defined shape. Subsequently thereto, the intensity ratio may be formed based on the orders of diffraction of the intensity distribution. In addition, at least one portion of a characteristic curve may be determined, which represents the dependency of the intensity ratio on the refractive index, and, with whose assistance, the corresponding refractive index can be assigned to the intensity ratio formed.
    Type: Grant
    Filed: March 24, 2001
    Date of Patent: November 22, 2005
    Assignee: NaWoTec GmbH
    Inventors: Hans W. P. Koops, Alexander Kaya, Ottokar Leminger
  • Patent number: 6903549
    Abstract: Inordinate localised systems are used at room temperature in a novel device in the form of an electron spectrometer for utilising single-electron electronic applications. Said electron spectrometer device consists of a nanocrystalline metal or a nanocrystalline semiconductor material used as conductor strip connection in the form of an inlet or an outlet for single-electron electronic components and circuits consisting of lithographically produced quantum dots. The resulting single-electron electronic device consisting of quantum dots is supplied with energetically very sharply defined electrons. Said device can thus be operated at room temperature, undisturbed by phonons.
    Type: Grant
    Filed: August 8, 2001
    Date of Patent: June 7, 2005
    Assignee: NaWoTec GmbH
    Inventors: Hans W. P. Koops, Alexander Kaya
  • Publication number: 20040204640
    Abstract: Inordinate localised systems are used at room temperature in a novel device in the form of an electron spectrometer for utilising single-electron electronic applications. Said electron spectrometer device consists of a nanocrystalline metal or a nanocrystalline semiconductor material used as conductor strip connection in the form of an inlet or an outlet for single-electron electronic components and circuits consisting of lithographically produced quantum dots. The resulting single-electron electronic device consisting of quantum dots is supplied with energetically very sharply defined electrons. Said device can thus be operated at room temperature, undisturbed by phonons.
    Type: Application
    Filed: June 27, 2003
    Publication date: October 14, 2004
    Inventors: Hans W P Koops, Alexander Kaya
  • Publication number: 20030179365
    Abstract: In the context of the method according to the present invention, the matter for which the refractive index is to be determined, is made available in the form of a theoretically determinable scattering or diffraction pattern. Two or more orders of diffraction are then defined to form at least one intensity ratio. At least one intensity distribution is formed by irradiating the scattering pattern using one light beam of a defined shape. Subsequently thereto, the intensity ratio is formed based on the orders of diffraction of the intensity distribution. In addition, at least one portion of a characteristic curve is determined, which represents the dependency of the intensity ratio on the refractive index, and, with whose assistance, the corresponding refractive index can be assigned to the intensity ratio formed.
    Type: Application
    Filed: May 22, 2003
    Publication date: September 25, 2003
    Inventors: Hans W.P. Koops, Alexander Kaya, Ottokar Leminger
  • Patent number: 6246055
    Abstract: In a photon detector wherein material of light-dependent conductivity is disposed between electrically conductive connections, the material is nanocrystalline composite material, said nanocrystalline composite material, in the process of making it, being applied to a substrate by corpuscular-beam-induced deposition, organo-metallic compounds being used as starting materials, said organo-metallic compounds being adsorbed on the surface of the substrate owing to their high vapor pressure.
    Type: Grant
    Filed: November 24, 1998
    Date of Patent: June 12, 2001
    Assignee: Deutsche Telekom AG
    Inventors: Hans Wilfried Peter Koops, Alexander Kaya