Patents by Inventor Alexander Mordehai

Alexander Mordehai has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9482642
    Abstract: The collision cross section (CCS) of a sample ion may be calculated by measuring a total drift time taken by the sample ion to travel through an ion mobility spectrometry drift cell to an ion detector. The CCS may be calculated based on the total drift time measured, and on a proportionality coefficient that defines the time taken by the sample ion to travel through a mobility dominated region between the drift cell and the detector. The proportionality coefficient may be determined from measuring the total drift times of reference ions. Calculation of the CCS of the sample ion may also be based on a proportionality coefficient that defines the time taken by the sample ion to travel through a mobility-independent region where the velocity of the ion depends on the electrostatic field strength, mass and the charge state of the ion.
    Type: Grant
    Filed: January 31, 2014
    Date of Patent: November 1, 2016
    Assignee: Agilent Technologies, Inc.
    Inventors: Alexander Mordehai, Ruwan T. Kurulugama, Christian Klein, John Fjeldsted
  • Patent number: 9455132
    Abstract: An interface for an ion mobility spectrometry-mass spectrometry (IMS-MS) system includes a first ion guide for receiving ions from an IMS drift cell, and a second ion guide for receiving ions from the first ion guide, and positioned in a chamber separate from the first ion guide. Electrodes of the second ion guide subject the ions to an axial DC electric field while the second ion guide is held at a lower pressure than the first ion guide. In some embodiments, the first ion guide may be an ion funnel and the second ion guide may be a linear multipole device.
    Type: Grant
    Filed: May 30, 2013
    Date of Patent: September 27, 2016
    Assignee: Agilent Technologies, Inc.
    Inventors: Alexander Mordehai, Layne Howard, Mark H. Werlich, Ruwan T. Kurulugama, Thomas A. Knotts
  • Patent number: 9281173
    Abstract: An ion processing device includes electrically conductive vacuum manifold segments serially positioned and enclosing a volume along an axis. The segments are electrically isolated from each other and independently addressable by a voltage source. An ion optics device is positioned in the volume. A voltage differential between each manifold segment and the ion optics device is maintained below a maximum value by applying different voltages to respective manifold segments. The voltage differential may be controlled to avoid voltage breakdown in a low-pressure, high-voltage gas environment. The ion optics device may in some cases be an ion mobility drift cell.
    Type: Grant
    Filed: May 30, 2013
    Date of Patent: March 8, 2016
    Assignee: Agilent Technologies, Inc.
    Inventors: Alexander Mordehai, Mark H. Werlich, Ruwan T. Kurulugama, Thomas A. Knotts
  • Publication number: 20150219598
    Abstract: The collision cross section (CCS) of a sample ion may be calculated by measuring a total drift time taken by the sample ion to travel through an ion mobility spectrometry drift cell to an ion detector. The CCS may be calculated based on the total drift time measured, and on a proportionality coefficient that defines the time taken by the sample ion to travel through a mobility dominated region between the drift cell and the detector. The proportionality coefficient may be determined from measuring the total drift times of reference ions. Calculation of the CCS of the sample ion may also be based on a proportionality coefficient that defines the time taken by the sample ion to travel through a mobility-independent region where the velocity of the ion depends on the electrostatic field strength, mass and the charge state of the ion.
    Type: Application
    Filed: January 31, 2014
    Publication date: August 6, 2015
    Applicant: Agilent Technologies, Inc.
    Inventors: Alexander Mordehai, Ruwan T. Kurulugama, Christian Klein, John Fjeldsted
  • Publication number: 20140353493
    Abstract: An interface for an ion mobility spectrometry-mass spectrometry (IMS-MS) system includes a first ion guide for receiving ions from an IMS drift cell, and a second ion guide for receiving ions from the first ion guide, and positioned in a chamber separate from the first ion guide. Electrodes of the second ion guide subject the ions to an axial DC electric field while the second ion guide is held at a lower pressure than the first ion guide. In some embodiments, the first ion guide may be an ion funnel and the second ion guide may be a linear multipole device.
    Type: Application
    Filed: May 30, 2013
    Publication date: December 4, 2014
    Inventors: Alexander Mordehai, Layne Howard, Mark H. Werlich, Ruwan T. Kurulugama, Thomas A. Knotts
  • Publication number: 20140353483
    Abstract: An ion processing device includes electrically conductive vacuum manifold segments serially positioned and enclosing a volume along an axis. The segments are electrically isolated from each other and independently addressable by a voltage source. An ion optics device is positioned in the volume. A voltage differential between each manifold segment and the ion optics device is maintained below a maximum value by applying different voltages to respective manifold segments. The voltage differential may be controlled to avoid voltage breakdown in a low-pressure, high-voltage gas environment. The ion optics device may in some cases be an ion mobility drift cell.
    Type: Application
    Filed: May 30, 2013
    Publication date: December 4, 2014
    Inventors: Alexander Mordehai, Mark H. Werlich, Ruwan T. Kurulugama, Thomas A. Knotts
  • Patent number: 8653446
    Abstract: A method is provided increasing the useful dynamic range of an ion mobility spectrometry (IMS) or an IMS-mass spectrometry (IMS-MS) device. The method includes accumulating a first sample of ions over a first time interval; providing the first sample of ions to an ion detector to provide a first frame, accumulating a second sample of ions over a second time interval, where the second time interval is different than the first time interval, and providing the second sample of ions to the ion detector to provide a second frame. First data points of the first frame are selectively combined with second data points of the second frame to provide an accumulation frame of the first and second samples of ions.
    Type: Grant
    Filed: December 31, 2012
    Date of Patent: February 18, 2014
    Assignee: Agilent Technologies, Inc.
    Inventors: Alexander Mordehai, Edward Darland
  • Publication number: 20140034827
    Abstract: A mass spectrum is acquired by accumulating parent ions in an ion trap, ejecting parent ions of a selected m/z ratio into a collision cell, producing fragment ions from the parent ions, and analyzing the fragment ions in a mass analyzer. The other parent ions remain stored in the ion trap, and thus the process may be repeated by mass-selectively scanning parent ions from the ion trap. In this manner, the full mass range of parent ions or any desired subset of the full mass range may be analyzed without significant ion loss or undue time expenditure. The collision cell may provide a large ion acceptance aperture and relatively smaller ion emission aperture. The collision cell may pulse ions out to the mass analyzer. The mass analyzer may be a time-of-flight analyzer. The timing of pulsing of ions out from the collision cell may be matched with the timing of pulsing of ions into the time-of-flight analyzer.
    Type: Application
    Filed: March 14, 2013
    Publication date: February 6, 2014
    Applicant: Agilent Technologies, Inc.
    Inventors: Alexander Mordehai, Kenneth R. Newton
  • Patent number: 8637816
    Abstract: A mass spectrum is acquired by accumulating parent ions in an ion trap, ejecting parent ions of a selected m/z ratio into a collision cell, producing fragment ions from the parent ions, and analyzing the fragment ions in a mass analyzer. The other parent ions remain stored in the ion trap, and thus the process may be repeated by mass-selectively scanning parent ions from the ion trap. In this manner, the full mass range of parent ions or any desired subset of the full mass range may be analyzed without significant ion loss or undue time expenditure. The collision cell may provide a large ion acceptance aperture and relatively smaller ion emission aperture. The collision cell may pulse ions out to the mass analyzer. The mass analyzer may be a time-of-flight analyzer. The timing of pulsing of ions out from the collision cell may be matched with the timing of pulsing of ions into the time-of-flight analyzer.
    Type: Grant
    Filed: March 14, 2013
    Date of Patent: January 28, 2014
    Assignee: Agilent Technologies, Inc.
    Inventors: Alexander Mordehai, Kenneth R. Newton
  • Patent number: 8530832
    Abstract: Improved apparatuses and methods are provided for ionizing samples and analyzing the samples with mass spectrometry.
    Type: Grant
    Filed: October 3, 2011
    Date of Patent: September 10, 2013
    Assignee: Agilent Technologies, Inc.
    Inventors: Alexander Mordehai, Mark H. Werlich, Craig P. Love, James L. Bertsch
  • Patent number: 8324565
    Abstract: An interface for use in a mass spectrometer is disclosed. The interface comprises a first ion funnel comprising a first inlet and a first outlet, and a first axis between the first inlet and the first outlet. The interface further comprises a second ion funnel in tandem with the first ion funnel, the second ion funnel comprising a second inlet and a second outlet, and a second axis between the second inlet and the second outlet. The first axis and the second axis are offset relative to one another. A mass spectrometer comprising the interface and a method are disclosed.
    Type: Grant
    Filed: December 17, 2009
    Date of Patent: December 4, 2012
    Assignee: Agilent Technologies, Inc.
    Inventors: Alexander Mordehai, Mark H. Werlich
  • Patent number: 8147222
    Abstract: A vacuum divider is positioned between rotor blades of a turbo-molecular pump and a vacuum manifold formed from multiple vacuum chambers. A first coupling aperture passes through the vacuum divider and allows gas to pass from a first of the multiple vacuum chambers to the turbo-molecular pump. A second coupling aperture passes through the vacuum divider and allows gas to pass from a second of the multiple vacuum chambers to the turbo-molecular pump.
    Type: Grant
    Filed: May 15, 2007
    Date of Patent: April 3, 2012
    Assignee: Agilent Technologies, Inc.
    Inventors: Alexander Mordehai, Mark Werlich
  • Publication number: 20120025071
    Abstract: Improved apparatuses and methods are provided for ionizing samples and analyzing the samples with mass spectrometry.
    Type: Application
    Filed: October 3, 2011
    Publication date: February 2, 2012
    Inventors: Alexander MORDEHAI, Mark H. Werlich, Craig P. Love, James L. Bertsch
  • Patent number: 8039795
    Abstract: Improved apparatuses and methods are provided for ionizing samples and analyzing the samples with mass spectrometry.
    Type: Grant
    Filed: April 3, 2009
    Date of Patent: October 18, 2011
    Assignee: Agilent Technologies, Inc.
    Inventors: Alexander Mordehai, Mark H Werlich, Craig P Love, James L. Bertsch
  • Publication number: 20110147575
    Abstract: An interface for use in a mass spectrometer is disclosed. The interface comprises a first ion funnel comprising a first inlet and a first outlet, and a first axis between the first inlet and the first outlet. The interface further comprises a second ion funnel in tandem with the first ion funnel, the second ion funnel comprising a second inlet and a second outlet, and a second axis between the second inlet and the second outlet. The first axis and the second axis are offset relative to one another. A mass spectrometer comprising the interface and a method are disclosed.
    Type: Application
    Filed: December 17, 2009
    Publication date: June 23, 2011
    Applicant: AGILENT TECHNOLOGIES, INC.
    Inventors: Alexander Mordehai, Mark H. Werlich
  • Patent number: 7755040
    Abstract: An electric field source for a mass spectrometer and a mass spectrometer are described.
    Type: Grant
    Filed: September 24, 2007
    Date of Patent: July 13, 2010
    Assignee: Agilent Technologies, Inc.
    Inventors: Gangqiang Li, Alexander Mordehai
  • Publication number: 20090250608
    Abstract: Improved apparatuses and methods are provided for ionizing samples and analyzing the samples with mass spectrometry.
    Type: Application
    Filed: April 3, 2009
    Publication date: October 8, 2009
    Inventors: Alexander Mordehai, Mark H. Werlich, Craig P. Love, James L. Bertsch
  • Publication number: 20090078866
    Abstract: An electric field source for a mass spectrometer and a mass spectrometer are described.
    Type: Application
    Filed: September 24, 2007
    Publication date: March 26, 2009
    Inventors: Gangqiang LI, Alexander Mordehai
  • Publication number: 20080283125
    Abstract: A vacuum divider is positioned between rotor blades of a turbo-molecular pump and a vacuum manifold formed from multiple vacuum chambers. A first coupling aperture passes through the vacuum divider and allows gas to pass from a first of the multiple vacuum chambers to the turbo-molecular pump. A second coupling aperture passes through the vacuum divider and allows gas to pass from a second of the multiple vacuum chambers to the turbo-molecular pump.
    Type: Application
    Filed: May 15, 2007
    Publication date: November 20, 2008
    Applicant: AGILENT TECHNOLOGIES, INC.
    Inventors: Alexander Mordehai, Mark Werlich
  • Patent number: 7423262
    Abstract: The invention provides an ion trap assembly. In general terms, the ion trap assembly contains: a) a segmented linear ion trap; b) an insulator disposed around the segmented linear ion trap; and c) a bonding material for attaching and spacing the insulator and said segmented linear ion trap. The ion trap assembly is generally made by mounting an elongated conductive workpiece to a set of rigidly connected insulators using a bonding material, and cutting the elongated conductive workpiece into a plurality of rods using wire electrical discharge machining. Also provided is a mass spectrometry system containing the precision segmented linear ion trap.
    Type: Grant
    Filed: November 14, 2005
    Date of Patent: September 9, 2008
    Assignee: Agilent Technologies, Inc.
    Inventors: Alexander Mordehai, James Bertsch