Abstract: A switching unit serves for the arithmetic linking of at least two input signals supplied to the switching unit. For this purpose, the switching unit provides a switching matrix to which the at least two input signals are supplied. The switching matrix applies at least one summation operation to at least two input signals and/or at least one multiplication operation to at least one input signal. Additionally or alternatively, the switching matrix can also connect at least one input signal directly through to a first output. The switching matrix comprises for this purpose several current switches.

Abstract: Disclosed is a probe for an oscilloscope comprising a multi-stage transistor amplifier that acts as an impedance transformer. Said amplifier is a d.c.-coupled emitter follower circuit that is composed of bipolar transistors or a d.c.-coupled source follower circuit which is composed of field effect transistors and the successive amplifier elements of which are dimensioned and tuned to each other in such a way that the resulting offset direct voltage between the input and the output is minimal.

Abstract: A switching unit serves for the arithmetic linking of at least two input signals supplied to the switching unit. For this purpose, the switching unit provides a switching matrix to which the at least two input signals are supplied. The switching matrix applies at least one summation operation to at least two input signals and/or at least one multiplication operation to at least one input signal. Additionally or alternatively, the switching matrix can also connect at least one input signal directly through to a first output. The switching matrix comprises for this purpose several current switches.

Abstract: Disclosed is a probe (21) for an oscilloscope (24) comprising a multi-stage transistor amplifier (26) which is used as an impedance transformer and the output of which is connected to the oscilloscope (24). An electronic switching device (27) that can be remote-controlled by means of the oscilloscope (24) is assigned to the input (Vin) of the amplifier (26). Said electronic switching device (27) allows frame potential or a reference voltage to be alternatively connected to the amplifier input (Vin) instead of the measuring-circuit voltage of the measuring tip (22) such that the direct voltage offset is measured when the amplifier input (Vin) is connected to frame while the gain error in the oscilloscope (24) is measured when the reference voltage is applied, and said direct voltage offset or gain error is adequately taken into account when the measuring-circuit voltage in the oscilloscope is evaluated.

Abstract: In an oscilloscope probe with a transistor amplifier constructed on a semiconductor substrate using integrated circuit technology, at least one part of the input-voltage divider is also constructed together with the amplifier using integrated-circuit technology on the semiconductor substrate.

Abstract: Disclosed is a probe (21) for an oscilloscope (24) comprising a multi-stage transistor amplifier (26) which is used as an impedance transformer and the output of which is connected to the oscilloscope (24). An electronic switching device (27) that can be remote-controlled by means of the oscilloscope (24) is assigned to the input (Vin) of the amplifier (26). Said electronic switching device (27) allows frame potential or a reference voltage to be alternatively connected to the amplifier input (Vin) instead of the measuring-circuit voltage of the measuring tip (22) such that the direct voltage offset is measured when the amplifier input (Vin) is connected to frame while the gain error in the oscilloscope (24) is measured when the reference voltage is applied, and said direct voltage offset or gain error is adequately taken into account when the measuring-circuit voltage in the oscilloscope is evaluated.

Abstract: In an oscilloscope probe with a transistor amplifier constructed on a semiconductor substrate using integrated circuit technology, at least one part of the input-voltage divider is also constructed together with the amplifier using integrated-circuit technology on the semiconductor substrate.

Abstract: Disclosed is a probe for an oscilloscope comprising a multi-stage transistor amplifier that acts as an impedance transformer. Said amplifier is a d.c.-coupled emitter follower circuit that is composed of bipolar transistors or a d.c.-coupled source follower circuit which is composed of field effect transistors and the successive amplifier elements of which are dimensioned and tuned to each other in such a way that the resulting offset direct voltage between the input and the output is minimal.