Patents by Inventor Alexandre Obotnine

Alexandre Obotnine has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11410405
    Abstract: A sensor calibration target configured for sensor calibration relative to a common frame of reference is disclosed. The sensor calibration target comprises a first surface at a first predefined depth bearing a first set of indicia at respective first heights and having respective first predefined shifts, each of the first indicia encoding a corresponding first height. The sensor calibration target further comprises a second surface at a second predefined depth bearing a second set of indicia at respective second heights and having respective second predefined shifts, each of the second indicia encoding a corresponding second height.
    Type: Grant
    Filed: March 5, 2018
    Date of Patent: August 9, 2022
    Assignee: Symbol Technologies, LLC
    Inventor: Alexandre Obotnine
  • Patent number: 10770603
    Abstract: Provided herein is a device and method for improved operating of cameras and light sources of a mobile automation apparatus. Light sources are operated to periodically provide illumination light for a camera operating according to a given exposure time and frequency, with a pulse duration having a respective frequency that is an integer multiple of the camera frequency, and higher than a threshold frequency where successive activations of the light sources are imperceptible. Furthermore, a light source paired with a camera is located at a distance from the paired camera that illuminates an object imaged by the paired camera, and where parasitic reflections from the paired light source are not reflected into the paired camera.
    Type: Grant
    Filed: December 3, 2019
    Date of Patent: September 8, 2020
    Assignee: Symbol Technologies, LLC
    Inventors: Paul D. Haist, Alexandre Obotnine
  • Publication number: 20200105950
    Abstract: Provided herein is a device and method for improved operating of cameras and light sources of a mobile automation apparatus. Light sources are operated to periodically provide illumination light for a camera operating according to a given exposure time and frequency, with a pulse duration having a respective frequency that is an integer multiple of the camera frequency, and higher than a threshold frequency where successive activations of the light sources are imperceptible. Furthermore, a light source paired with a camera is located at a distance from the paired camera that illuminates an object imaged by the paired camera, and where parasitic reflections from the paired light source are not reflected into the paired camera.
    Type: Application
    Filed: December 3, 2019
    Publication date: April 2, 2020
    Inventors: Paul D. Haist, Alexandre Obotnine
  • Patent number: 10505057
    Abstract: Provided herein is a device and method for improved operating of cameras and light sources of a mobile automation apparatus. Light sources are operated to periodically provide illumination light for a camera operating according to a given exposure time and frequency, with a pulse duration having a respective frequency that is an integer multiple of the camera frequency, and higher than a threshold frequency where successive activations of the light sources are imperceptible. Furthermore, a light source paired with a camera is located at a distance from the paired camera that illuminates an object imaged by the paired camera, and where parasitic reflections from the paired light source are not reflected into the paired camera.
    Type: Grant
    Filed: May 1, 2017
    Date of Patent: December 10, 2019
    Assignee: Symbol Technologies, LLC
    Inventors: Paul D. Haist, Alexandre Obotnine
  • Publication number: 20190073550
    Abstract: A sensor calibration target configured for sensor calibration relative to a common frame of reference is disclosed. The sensor calibration target comprises a first surface at a first predefined depth bearing a first set of indicia at respective first heights and having respective first predefined shifts, each of the first indicia encoding a corresponding first height. The sensor calibration target further comprises a second surface at a second predefined depth bearing a second set of indicia at respective second heights and having respective second predefined shifts, each of the second indicia encoding a corresponding second height.
    Type: Application
    Filed: March 5, 2018
    Publication date: March 7, 2019
    Inventor: Alexandre Obotnine
  • Publication number: 20180315865
    Abstract: Provided herein is a device and method for improved operating of cameras and light sources of a mobile automation apparatus. Light sources are operated to periodically provide illumination light for a camera operating according to a given exposure time and frequency, with a pulse duration having a respective frequency that is an integer multiple of the camera frequency, and higher than a threshold frequency where successive activations of the light sources are imperceptible. Furthermore, a light source paired with a camera is located at a distance from the paired camera that illuminates an object imaged by the paired camera, and where parasitic reflections from the paired light source are not reflected into the paired camera.
    Type: Application
    Filed: May 1, 2017
    Publication date: November 1, 2018
    Inventors: Paul D. Haist, Alexandre Obotnine
  • Patent number: 9940535
    Abstract: Sensor calibration relative to common coordinates with depth, height and shift dimensions includes obtaining, via a mobile apparatus camera, an image of a calibration target. The calibration target includes first and second surfaces at first and second predefined depths, bearing first and second sets of indicia at heights encoded by the indicia and having predefined shifts.
    Type: Grant
    Filed: September 7, 2017
    Date of Patent: April 10, 2018
    Assignee: Symbol Technologies, LLC
    Inventor: Alexandre Obotnine
  • Patent number: 8736846
    Abstract: An optical sensor device (38) for use in a measuring and/or inspection apparatus comprises an optical sensor head (40) including a white light sensor (44) having a wideband radiation source (50), a wavelength-sensitive receiver (52) and a beam splitting means (60); and an objective (46) for directing a measuring beam onto an object to be measured and detecting a reflection beam reflected from the object to be measured. The optical sensor device (38) further comprises a video sensor (80), wherein the beam path of the video sensor (80) passes through the same objective (46) as that of the white light sensor (44) of the optical sensor head (40).
    Type: Grant
    Filed: October 10, 2008
    Date of Patent: May 27, 2014
    Assignee: Werth Messtechnik GmbH
    Inventors: Eric Gurny, Alexandre Obotnine
  • Publication number: 20110037987
    Abstract: An optical sensor device (38) for use in a measuring and/or inspection apparatus comprises an optical sensor head (40) including a white light sensor (44) having a wideband radiation source (50), a wavelength-sensitive receiver (52) and a beam splitting means (60); and an objective (46) for directing a measuring beam onto an object to be measured and detecting a reflection beam reflected from the object to be measured. The optical sensor device (38) further comprises a video sensor (80), wherein the beam path of the video sensor (80) passes through the same objective (46) as that of the white light sensor (44) of the optical sensor head (40).
    Type: Application
    Filed: October 10, 2008
    Publication date: February 17, 2011
    Inventors: Eric Gurny, Alexandre Obotnine
  • Patent number: 7700903
    Abstract: The invention is directed at a method and apparatus for auto-focusing an infinity corrected microscope. Light beams are directed and then converged towards a specimen of interest and at least one image is formed from the reflected light. The image, or images, are then reviewed and calibration measurements are retrieved from the image. These calibration measurement are then used to determine focusing measurements which are used to auto-focus the microscope.
    Type: Grant
    Filed: June 11, 2007
    Date of Patent: April 20, 2010
    Assignee: WDI Wise Device Inc.
    Inventors: Adam Weiss, Alexandre Obotnine, Andrew Lasinski
  • Publication number: 20080002252
    Abstract: The invention is directed at a method and apparatus for auto-focussing an infinity corrected microscope. Light beams are directed and then converged towards a specimen of interest and at least one image is formed from the reflected light. The image, or images, are then reviewed and calibration measurements are retrieved from the image. These calibration measurement are then used to determine focussing measurements which are used to auto-focus the microscope.
    Type: Application
    Filed: June 11, 2007
    Publication date: January 3, 2008
    Applicant: Wegu-Device Inc.
    Inventors: Adam WEISS, Alexandre Obotnine, Andrew Lasinski
  • Patent number: 7180084
    Abstract: In an inspection system for planar objects having periodic structures, programmable optical Fourier filtering in the focal plane of a telecentric lens system is used to directly identify physical phenomena indicative of non-periodic defects. Lens assemblies and a coherent optical source are used to generate and observe a spatial Fourier transform of a periodic structure in the Fourier plane. Optical Fourier filtering (OFF) is performed in the focal plane using an electrically programmable and electrically alignable spatial light modulator. The spatial light modulator with high signal to noise ratio is electrically reconfigurable according to a feedback-driven, filter construction and alignment algorithm. The OFF enhances any non-periodic components present in the Fourier plane and final image plane of the object. A system having a plurality of inspection channels provides high-throughput inspection of objects with small non-periodic defects while maintaining high detection sensitivity.
    Type: Grant
    Filed: March 15, 2006
    Date of Patent: February 20, 2007
    Assignee: Photon Dynamics, Inc.
    Inventors: Adam Weiss, Afsar Saranli, Oleksiy Lopatin, Alexandre Obotnine
  • Publication number: 20060186361
    Abstract: In an inspection system for planar objects having periodic structures, programmable optical Fourier filtering in the focal plane of a telecentric lens system is used to directly identify physical phenomena indicative of non-periodic defects. Lens assemblies and a coherent optical source are used to generate and observe a spatial Fourier transform of a periodic structure in the Fourier plane. Optical Fourier filtering (OFF) is performed in the focal plane using an electrically programmable and electrically alignable spatial light modulator. The spatial light modulator with high signal to noise ratio is electrically reconfigurable according to a feedback-driven, filter construction and alignment algorithm. The OFF enhances any non-periodic components present in the Fourier plane and final image plane of the object. A system having a plurality of inspection channels provides high-throughput inspection of objects with small non-periodic defects while maintaining high detection sensitivity.
    Type: Application
    Filed: March 15, 2006
    Publication date: August 24, 2006
    Applicant: Photon Dynamics, Inc.
    Inventors: Adam Weiss, Afsar Saranli, Oleksiy Lopatin, Alexandre Obotnine
  • Patent number: 7041998
    Abstract: In an inspection system for planar objects having periodic structures, programmable optical Fourier filtering in the focal plane of a telecentric lens system is used to directly identify physical phenomena indicative of non-periodic defects. Lens assemblies and a coherent optical source are used to generate and observe a spatial Fourier transform of a periodic structure in the Fourier plane. Optical Fourier filtering (OFF) is performed in the focal plane using an electrically programmable and electrically alignable spatial light modulator. The spatial light modulator with high signal to noise ratio is electrically reconfigurable according to a feedback-driven, filter construction and alignment algorithm. The OFF enhances any non-periodic components present in the Fourier plane and final image plane of the object. A system having a plurality of inspection channels provides high-throughput inspection of objects with small non-periodic defects while maintaining high detection sensitivity.
    Type: Grant
    Filed: March 24, 2003
    Date of Patent: May 9, 2006
    Assignee: Photon Dynamics, Inc.
    Inventors: Adam Weiss, Afsar Saranli, Oleksiy Lopatin, Alexandre Obotnine
  • Publication number: 20040188643
    Abstract: In an inspection system for planar objects having periodic structures, programmable optical Fourier filtering in the focal plane of a telecentric lens system is used to directly identify physical phenomena indicative of non-periodic defects. Lens assemblies and a coherent optical source are used to generate and observe a spatial Fourier transform of a periodic structure in the Fourier plane. Optical Fourier filtering (OFF) is performed in the focal plane using an electrically programmable and electrically alignable spatial light modulator. The spatial light modulator with high signal to noise ratio is electrically reconfigurable according to a feedback-driven, filter construction and alignment algorithm. The OFF enhances any non-periodic components present in the Fourier plane and final image plane of the object. A system having a plurality of inspection channels provides high-throughput inspection of objects with small non-periodic defects while maintaining high detection sensitivity.
    Type: Application
    Filed: March 24, 2003
    Publication date: September 30, 2004
    Applicant: Photon Dynamics, Inc.
    Inventors: Adam Weiss, Afsar Saranli, Oleksiy Lopatin, Alexandre Obotnine
  • Patent number: 6633377
    Abstract: Apparatus and a method for the detection and identification of light diverting and transparent defects with optical properties in a transparent medium. The apparatus has a light source with an aperture stop, a lens system focusing an image of the aperture stop at a plane, and means to pass the transparent medium through said column of light. The apparatus and method provide dark view images of the defects. The apparatus and method may be combined with a viewing area inspection system. The transparent medium may be curved, and especially face plates for cathode ray tubes.
    Type: Grant
    Filed: April 20, 2000
    Date of Patent: October 14, 2003
    Assignee: Image Processing Systems Inc.
    Inventors: Adam Weiss, Alexandre Obotnine
  • Patent number: 6512239
    Abstract: Apparatus and a method for the detection and identification of defects in a transparent medium, especially light diverting and transparent defects with optical properties. The apparatus comprises an extended source of illumination, first and second optical recording devices, and a means to pass the transparent medium between the extended source of illumination and the first and second optical recording devices. The first and second optical recording devices are disposed to record images at opposed acute angles from a common location on the transparent medium. The second optical recording device has two sources of laser illumination attached thereto, which are directed at the common location in a spaced apart relationship such that scattered of laser light from surfaces of the transparent medium is recorded by the first optical recording device.
    Type: Grant
    Filed: June 27, 2000
    Date of Patent: January 28, 2003
    Assignee: Photon Dynamics Canada Inc.
    Inventors: Adam Weiss, Alexandre Obotnine
  • Patent number: 6437357
    Abstract: An inspection system for a sheet of glass. The system comprises a first laser and a second laser, each of which provide a sheet of light, a cylindrical lens system, and a first light detection system and a second light detection system. The first laser is located at the focal point of the lens system. The second laser is located at a distance from the lens system that is greater than that of the first laser, and off of the axis of the lens system. The first light detection system receives light from the first laser and the second light detection system receives light from the second laser. The inspection system is adapted to position a sheet of glass between the lens system and the detection systems. A method is also described.
    Type: Grant
    Filed: October 29, 1999
    Date of Patent: August 20, 2002
    Assignee: Photon Dynamics Canada Inc.
    Inventors: Adam Weiss, Alexandre Obotnine