Abstract: A method can be used for manufacturing a high-voltage transistor in and on a high-voltage region of a silicon-on-insulator type bulk that includes a semiconductor film having a first thickness, electrically insulated from a carrier bulk by a buried dielectric layer. The semiconductor film in the high-voltage region is selectively epitaxially grown to a second thickness that is greater than the first thickness while the semiconductor film remains at the first thickness in a region outside the high-voltage region.

Abstract: A memory cell with one MOS transistor formed in a floating body region isolated on its lower surface by a junction. A region of the same conductivity type as the floating body region but more heavily doped than said region is arranged under the drain region of the MOS transistor.

Abstract: A vertical IMOS-type transistor including: a stack of a first semiconductor portion doped with dopant elements of a first type, of a second substantially undoped intrinsic semiconductor portion, and of a third semiconductor portion doped with dopant elements of a second type forming a PIN-type diode; and a conductive gate placed against the stack with an interposed insulating layer.

Abstract: A memory cell with one transistor on a floating body region isolated by its lower surface by a junction. According to the present invention, the junction is non-planar and, for example, includes a protrusion directed towards the transistor surface.

Abstract: A memory cell with one MOS transistor formed in a floating body region isolated on its lower surface by a junction. A region of the same conductivity type as the floating body region but more heavily doped than said region is arranged under the drain region of the MOS transistor.

Abstract: A memory cell with one transistor on a floating body region isolated by its lower surface by a junction. According to the present invention, the junction is non-planar and, for example, includes a protrusion directed towards the transistor surface.

Abstract: A memory cell with one MOS transistor formed in a floating body region in which the lower surface of the source and drain regions, outside of the source extension and drain extension regions, rests on an insulating layer.

Abstract: A vertical IMOS-type transistor including: a stack of a first semiconductor portion doped with dopant elements of a first type, of a second substantially undoped intrinsic semiconductor portion, and of a third semiconductor portion doped with dopant elements of a second type forming a PIN-type diode; and a conductive gate placed against the stack with an interposed insulating layer.

Abstract: An integrated memory circuit includes at least one memory cell formed by a single transistor whose gate (GR) has a lower face insulated from a channel region by an insulation layer containing a succession of potential wells, which are substantially arranged at a distance from the gate and from the channel region in a plane substantially parallel to the lower face of the gate. The potential wells are capable of containing an electric charge which is confined in the plane and can be controlled to move in the plane towards a first confinement region next to the source region or towards a second confinement region next to the drain region so as to define two memory states for the cell.

Abstract: An integrated memory circuit includes at least one memory cell formed by a single transistor whose gate (GR) has a lower face insulated from a channel region by an insulation layer containing a succession of potential wells, which are substantially arranged at a distance from the gate and from the channel region in a plane substantially parallel to the lower face of the gate. The potential wells are capable of containing an electric charge which is confined in the plane and can be controlled to move in the plane towards a first confinement region next to the source region or towards a second confinement region next to the drain region so as to define two memory states for the cell.

Abstract: An integrated memory location structure includes an isolated semiconductor layer between the source region and the drain region of a transistor, and between the channel region and the control gate of the transistor. The isolated semiconductor layer includes two potential well zones separated by a potential barrier zone under the control gate of the transistor. A write circuit biases the memory location structure to confine charge carriers selectively in one of the two potential well zones. A read circuit biases the memory location structure to measure the drain current of the transistor and determine therefrom the stored logic state imposed by the position of the charges in one of the potential well zones.

Abstract: The source, drain and channel regions are produced in a silicon layer, completely isolated vertically from a carrier substrate by an insulating layer, and are bounded laterally by a lateral isolation region of the shallow trench type.

Abstract: An integrated memory location structure includes an isolated semiconductor layer between the source region and the drain region of a transistor, and between the channel region and the control gate of the transistor. The isolated semiconductor layer includes two potential well zones separated by a potential barrier zone under the control gate of the transistor. A write circuit biases the memory location structure to confine charge carriers selectively in one of the two potential well zones. A read circuit biases the memory location structure to measure the drain current of the transistor and determine therefrom the stored logic state imposed by the position of the charges in one of the potential well zones.

Abstract: The source, drain and channel regions are produced in a silicon layer completely isolated vertically from a carrier substrate by an insulating layer, and are bounded laterally by a lateral isolation region of the shallow trench type.