Abstract: High-speed silicon CMOS circuits and high-power AlGaN/GaN amplifiers are integrated on the same wafer. A thin layer of high resistivity silicon is bonded on a substrate. Following the bonding, an AlGaN/GaN structure is grown over the bonded silicon layer. A silicon nitride or a silicon oxide layer is then deposited over the AlGaN/GaN structure. Following this, a thin layer of silicon is bonded to the silicon nitride/silicon oxide layer. An area for the fabrication of AlGaN/GaN devices is defined, and the silicon is etched away from those areas. Following this, CMOS devices are fabricated on the silicon layer and AlGaN/GaN devices fabricated on the AlGaN/GaN surface.

Abstract: A semiconductor wafer structure which includes at least one bipolar transistor defined in the semiconductor wafer structure as well as at least one CMOS transistor device also defined in the semiconductor wafer structure. The CMOS transistor device is comprised of a thin film of semiconductor on an insulating layer with each transistor of the CMOS transistor device being defined in the thin film. The bipolar transistor has a plurality of semiconductor layers of predetermined conductivities, without any of the semiconductor layers of the bipolar transistor extending into the area occupied by the CMOS transistor device. A method of fabricating the structure is also disclosed.