Patents by Inventor Alfredo Iglesias Lago

Alfredo Iglesias Lago has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Neutron dosimetry for radiotherapy
    Patent number: 8188440
    Abstract: A system includes emission of a first treatment beam associated with a first energy toward a neutron dose detector, determination of a first number of soft errors experienced by a semiconductor-based device exposed to neutrons generated by the first treatment beam, determination of a first neutron dose based on the first treatment beam using the neutron dose detector, and association of the first energy of the first treatment beam with the first number of soft errors and the first neutron dose. Some aspects include emission of a second treatment beam associated with the first energy toward a target, determination of a second number of soft errors experienced by the semiconductor-based device exposed to neutrons generated by the second treatment beam, and determination of a second neutron dose at the target based on the association between the first energy, the first number of soft errors and the first neutron dose.
    Type: Grant
    Filed: September 20, 2006
    Date of Patent: May 29, 2012
    Assignees: Siemens Medical Solutions USA, Inc., University of Santiago de Compostela
    Inventors: Faustino Gómez Rodríguez, Francisco Miguel Hernandez-Guerra, Alfredo Iglesias Lago
  • Neutron dosimetry for radiotherapy
    Publication number: 20100258732
    Abstract: A system includes emission of a first treatment beam associated with a first energy toward a neutron dose detector, determination of a first number of soft errors experienced by a semiconductor-based device exposed to neutrons generated by the first treatment beam, determination of a first neutron dose based on the first treatment beam using the neutron dose detector, and association of the first energy of the first treatment beam with the first number of soft errors and the first neutron dose. Some aspects include emission of a second treatment beam associated with the first energy toward a target, determination of a second number of soft errors experienced by the semiconductor-based device exposed to neutrons generated by the second treatment beam, and determination of a second neutron dose at the target based on the association between the first energy, the first number of soft errors and the first neutron dose.
    Type: Application
    Filed: September 20, 2006
    Publication date: October 14, 2010
    Inventors: Faustino Gomez Rodriguez, Francisco Miguel Hernandez-Guerra, Alfredo Iglesias Lago