Abstract: In one example implementation, the present disclosure provides a modular approach to reducing flicker noise in metal-oxide semiconductor field-effect transistors (MOSFETs) in a device. First, a circuit designer may select one or more surface channel MOSFETs in a device. Then, the one or more surface channel MOSFETs are converted to one or more buried channel MOSFETs to reduce flicker noise. One or more masks may be applied to the channel(s) of the one or more surface channel MOSFETs. The technique maybe used at the input(s) of operational amplifiers, and more particularly, rail-to-rail operational amplifiers, as well as other analog and digital circuits such a mixers, ring oscillators, current mirrors, etc.

Abstract: In one example implementation, the present disclosure provides a modular approach to reducing flicker noise in metal-oxide semiconductor field-effect transistors (MOSFETs) in a device. First, a circuit designer may select one or more surface channel MOSFETs in a device. Then, the one or more surface channel MOSFETs are converted to one or more buried channel MOSFETs to reduce flicker noise. One or more masks may be applied to the channel(s) of the one or more surface channel MOSFETs. The technique maybe used at the input(s) of operational amplifiers, and more particularly, rail-to-rail operational amplifiers, as well as other analog and digital circuits such a mixers, ring oscillators, current mirrors, etc.

Abstract: A shared output visible imager pixel array combines a high optical fill factor with low read noise. A relatively small group of pixels are connected to a relatively short common bus line. An amplifier located in close proximity with the pixels is connected to the common bus line and shared among the pixels. By reducing the amount of amplifier circuitry associated with each pixel, the optical fill factor is increased. Also, since the bus line is relatively short, the bus capacitance is much lower relative to the traditional passive-pixel designs. On average, the transistor count per pixel can be less than two, for large arrays.

Abstract: A method and apparatus three-dimensionally images a subject scene by first illuminating it with a laser pulse, then receiving reflected light from the scene using an optical system and a pixellated array or photodetectors operating in a linear mode. The distances to the various surfaces in the scene are determined by determining the relative times of arrival of the reflected photons at each pixel on the photodetector array. Based on the light detected and its time of arrival at each pixel, a three dimensional image is constructed and displayed. High sensitivity photodetectors operating in a linear, non-geiger mode are preferably integrated with a high-gain, fast charge amplifier and a timing circuit at each pixel, enabling image acquisition in as few as one pulse. A multi-pulse embodiment allows more accurate “vernier” depth measurement, with a small number of pulses.

Abstract: An integrated image processing system includes an array of cells arranged in rows and columns. Each cell corresponds to a pixel of an image and includes a photosensitive element for detecting the luminous intensity of its respective pixel and for generating a value. A first switch controls the transfer of the value from a respective photosensitive element to the corresponding capacitor, which stores the value. A second switch couples each of the cells in parallel to a common line. A control circuit receives the values from each cell on the common line and generates a signal for regulating the switching time interval of the first switch.

Abstract: A method and a respective circuit arrangement capable of markedly limiting the absorption of current by a current comparator circuit. The invention consists in limiting the absorption of current through the branch of the comparator circuit, along which is forced the highest current to the value of the lowest current, which is in turn forced through the other branch of the comparator circuit. This condition is obtained without interfering in any way with other characteristics of switching speed and sensitivity of the comparator circuit.