Patents by Inventor Alla Nadein

Alla Nadein has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230401469
    Abstract: Systems and methods for weakly supervised unit test quality scoring are disclosed. According to one embodiment, a method may include: parsing, by a generative model computer program, a plurality of code snippets in a repository using an abstract syntax tree; receiving, by the generative model computer program, a plurality of binary labelling functions from a labelling function repository; creating, by the generative model computer program, a labelling matrix by applying the binary labelling functions to the parsed code snippets; training, by the generative model computer program, a probabilistic generative model using the labelling matrix resulting in a vector of pseudo-labels; building, by a unit test scoring computer program, a discriminative model, wherein the discriminative model receives an array of real value inputs; and training, by the unit test scoring computer program, the discriminative model using the parsed code snippets, the vector of pseudo labels, and the abstract syntax tree.
    Type: Application
    Filed: September 19, 2022
    Publication date: December 14, 2023
    Inventors: Georgios PAPADOPOULOS, Alla NADEIN, Fanny SILAVONG, Shanshan JIANG, Sean MORAN, Rob OTTER, Brett SANFORD
  • Patent number: 11636024
    Abstract: Various methods, apparatuses/systems, and media for automatic risk-based testing of an application are disclosed. A processor accesses a database to obtain data corresponding to a plurality of test results of test runs conducted over a certain period of time for a set of plurality of tests and data corresponding to a change set; generates historical data based on the data corresponding to the plurality of test results and the change set; assigns a test failing probability value for each test among the set of plurality of tests based on analyzing the historical data; identities a first test whose assigned test failing probability value is below a predetermined threshold value; and filters out the identified first test from the set of plurality of tests whose assigned test failing probability value is below the predetermined threshold value so that the identified first test is not utilized for future test runs.
    Type: Grant
    Filed: November 5, 2020
    Date of Patent: April 25, 2023
    Assignee: JPMORGAN CHASE BANK, N.A.
    Inventors: Alla Nadein, Dheeraj Kumar, Saithulasiram Ramachandruni
  • Publication number: 20220138087
    Abstract: Various methods, apparatuses/systems, and media for automatic risk-based testing of an application are disclosed. A processor accesses a database to obtain data corresponding to a plurality of test results of test runs conducted over a certain period of time for a set of plurality of tests and data corresponding to a change set; generates historical data based on the data corresponding to the plurality of test results and the change set; assigns a test failing probability value for each test among the set of plurality of tests based on analyzing the historical data; identities a first test whose assigned test failing probability value is below a predetermined threshold value; and filters out the identified first test from the set of plurality of tests whose assigned test failing probability value is below the predetermined threshold value so that the identified first test is not utilized for future test runs.
    Type: Application
    Filed: November 5, 2020
    Publication date: May 5, 2022
    Applicant: JPMorgan Chase Bank, N.A.
    Inventors: Alla NADEIN, Dheeraj KUMAR, Saithulasiram RAMACHANDRUNI
  • Publication number: 20210056012
    Abstract: Various methods, apparatuses/systems, and media for implementing a test optimization module are provided. A processor utilizes a static analysis technique which analyzes an application's byte code to determine what files and line-numbers have been changed in a source code based on comparing successive versions of the application. The processor creates a change dependency graph (CDG) based on a change scope and analyzed bytecode, traverses the CDG to generate a list of test cases among a plurality of test cases, accessed from a test repository, that are directly and/or indirectly related to the modification to the source code, and automatically executes only the test cases selected from the generated list to test the latest version of the application.
    Type: Application
    Filed: August 23, 2019
    Publication date: February 25, 2021
    Applicant: JPMorgan Chase Bank, N.A.
    Inventors: Alla NADEIN, Itai WISEMAN, Victor M. BONILLA PARDO, Viacheslav LISIANSKII, Zhi ZHANG
  • Patent number: 10922214
    Abstract: Various methods, apparatuses/systems, and media for implementing a test optimization module are provided. A processor utilizes a static analysis technique which analyzes an application's byte code to determine what files and line-numbers have been changed in a source code based on comparing successive versions of the application. The processor creates a change dependency graph (CDG) based on a change scope and analyzed bytecode, traverses the CDG to generate a list of test cases among a plurality of test cases, accessed from a test repository, that are directly and/or indirectly related to the modification to the source code, and automatically executes only the test cases selected from the generated list to test the latest version of the application.
    Type: Grant
    Filed: August 23, 2019
    Date of Patent: February 16, 2021
    Assignee: JPMORGAN CHASE BANK, N.A.
    Inventors: Alla Nadein, Itai Wiseman, Victor M. Bonilla Pardo, Viacheslav Lisianskii, Zhi Zhang