Abstract: An apparatus for use in testing a device includes a parametric measurement unit to measure a first signal from the device, and pin electronics to provide a second signal to the device. The pin electronics includes circuitry along a path to the device. The parametric measurement unit is electrically connected to the device via the circuitry to receive the first signal via the circuitry.

Abstract: A differential pair circuit includes a first transistor having a first control terminal, a first input terminal, and a first output terminal; a second transistor having a second control terminal, a second input terminal, and a second output terminal, a first buffer stage including a third transistor having a third control terminal, a third input terminal, and a third output terminal; and a second buffer stage including a fourth transistor having a fourth control terminal, a fourth input terminal, and a fourth output terminal. The first output terminal and the second output terminal are electrically connected; the third output terminal and the first control terminal are electrically connected; the fourth output terminal and the second control terminal are electrically connected; the first input terminal and the fourth input terminal are electrically connected; and the second input terminal and the third input terminal are electrically connected.