Patents by Inventor Aman Tiwari

Aman Tiwari has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11951567
    Abstract: A system for diagnosing an additive manufacturing device is provided. The system includes one or more processors, one or more non-transitory memory modules communicatively coupled to the one or more processors and storing machine-readable instructions. The machine-readable instructions, when executed, cause the one or more processors to: determine parameters associated with at least one subsystem of the additive manufacturing device, the parameters being related to a build generated by the additive manufacturing device; compare the parameters with threshold values; and determine a failure mode, among a plurality of failure modes, associated with a subsystem of the at least one subsystem of the additive manufacturing device based on the comparison of the parameters with the threshold values.
    Type: Grant
    Filed: November 13, 2020
    Date of Patent: April 9, 2024
    Assignee: General Electric Company
    Inventors: Ponnada V S S Srivatsa, Venkata Rachakonda, Mattias Fager, Paer Christoffer Arumskog, Megha Navalgund, Sharan Arumugam, Aman Tiwari, Anders Ingvarsson, Fredrik Tommy Mohlin, Simon Blomé
  • Patent number: 11950180
    Abstract: Various embodiments herein disclose a method camping a User Equipment (UE) on a cell, the method comprising: creating a combined Most Recently Used (MRU) list by merging a list 4G MRU frequencies with a Public Land Mobile Network (PLMN) having a 5GC and a list of 5G MRU frequencies, determining whether one of a 4G cell with 5G core (5GC) and a 5G cell is available for camping by performing a MRU scan on the combined MRU list; performing one of: camping on one of the 4G cell with 5G core and the 5G cell in response to determining that one of the 5G cell and the 4G cell with 5G core is available and performing a 4G MRU frequency scan on a list of 4G without 5GC MRU frequencies in response to determining that one of the 4G cell with 5G core and the 5G cell is not available.
    Type: Grant
    Filed: October 21, 2021
    Date of Patent: April 2, 2024
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Alok Kumar Jangid, Kailash Kumar Jha, Aman Agarwal, Avneesh Tiwari, Ravi Pandappa Kamaladinni, Samiran Bhowmik, Abhishek Kaswan
  • Publication number: 20240107407
    Abstract: A method for access control of a UE (120) connecting through a Mobile base station relay (MBSR)-UE (122) in a wireless network (1000) by an IAB-Donor gNB (108). The method includes connecting the UE (120) to the IAB-Donor gNB (108) through a first MBSR-UE (122) to receive an emergency service in the wireless network. Further, the method includes determining that the first MBSR-UE (122a) is about to become unavailable to provide the emergency service to the UE (120) in the wireless network. Further, the method includes transmitting a handover request message to the UE (120) to perform an handover procedure to move the UE (120) to a NG-RAN node (104) before the first MBSR-UE (122a) becomes unavailable in the wireless network upon determining that the first MBSR-UE (122a) is about to become unavailable.
    Type: Application
    Filed: September 28, 2023
    Publication date: March 28, 2024
    Inventors: Lalith KUMAR, Aman AGARWAL, Avneesh TIWARI, Kailash Kumar JHA
  • Publication number: 20210146480
    Abstract: A system for diagnosing an additive manufacturing device is provided. The system includes one or more processors, one or more non-transitory memory modules communicatively coupled to the one or more processors and storing machine-readable instructions. The machine-readable instructions, when executed, cause the one or more processors to: determine parameters associated with at least one subsystem of the additive manufacturing device, the parameters being related to a build generated by the additive manufacturing device; compare the parameters with threshold values; and determine a failure mode, among a plurality of failure modes, associated with a subsystem of the at least one subsystem of the additive manufacturing device based on the comparison of the parameters with the threshold values.
    Type: Application
    Filed: November 13, 2020
    Publication date: May 20, 2021
    Applicant: General Electric Company
    Inventors: Ponnada VSS Srivatsa, Venkata Rachakonda, Mattias Fager, Paer Christoffer Arumskog, Megha Navalgund, Sharan Arumugam, Aman Tiwari, Anders Ingvarsson, Fredrik Tommy Mohlin, Simon Blomé