Patents by Inventor Amirhossein Nateghi

Amirhossein Nateghi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230152211
    Abstract: The present disclosure is directed toward measurement systems capable of optical analysis of a test sample. Embodiments in accordance with the present disclosure include a sample holder having a plurality of projections that extend from a planar surface, where the projections and planar surface collectively define an open sample-collection surface that enables an interrogation signal direct access to the test sample. The projections can be dimensioned and arranged to collectively define a geometric anti-reflection surface that is substantially non-reflective for the interrogation signal even at large angles of incidence. In some embodiments, the sample holder is configured as a reflective element that enables multiple passes of the interrogation signal through the test sample. In some embodiments, the sample holder is configured as a transmissive element. In some embodiments, the projections themselves are reflective.
    Type: Application
    Filed: November 9, 2022
    Publication date: May 18, 2023
    Inventors: Jack Jewell, Axel Scherer, Ph.D., Amirhossein Nateghi, Taeyoon Jeon
  • Patent number: 11619577
    Abstract: The present disclosure is directed toward a measurement system capable of rapid spectroscopic and calorimetric analysis of the chemical makeup of a test sample. Systems in accordance with the present disclosure include a low-thermal-mass sample holder having a substrate whose surface has been engineered to create a large-area sample-collection surface. The sample holder includes an integrated temperature controller that can rapidly heat or cool the test sample. As a result, the sample holder enables differential scanning calorimetry Fourier-Transform Infrared Spectroscopy (DSC-FTIR) that can be performed in minutes rather than hours, as required in the prior art.
    Type: Grant
    Filed: July 13, 2022
    Date of Patent: April 4, 2023
    Assignee: California Institute of Technology
    Inventors: Axel Scherer, Amirhossein Nateghi, Taeyoon Jeon
  • Publication number: 20220349811
    Abstract: The present disclosure is directed toward a measurement system capable of rapid spectroscopic and calorimetric analysis of the chemical makeup of a test sample. Systems in accordance with the present disclosure include a low-thermal-mass sample holder having a substrate whose surface has been engineered to create a large-area sample-collection surface. The sample holder includes an integrated temperature controller that can rapidly heat or cool the test sample. As a result, the sample holder enables differential scanning calorimetry Fourier-Transform Infrared Spectroscopy (DSC-FTIR) that can be performed in minutes rather than hours, as required in the prior art.
    Type: Application
    Filed: July 13, 2022
    Publication date: November 3, 2022
    Inventors: Axel Scherer, Ph.D., Amirhossein Nateghi, Taeyoon Jeon
  • Patent number: 11442002
    Abstract: The present disclosure is directed toward optical elements, such as sample cuvettes, lenses, prisms, and the like, whose transmissivity is increased by the addition of a geometric anti-reflection layer disposed on at least one surface of the optical element, where the geometric anti-reflection layer includes a plurality of geometric features that collectively reduce the reflectivity of the interface between the surface and another medium. As a result, more of an optical signal incident on the surface passes through the interface. In some embodiments, every surface through which an optical signal passes includes a geometric anti-reflection layer. Due to the increased transmissivity of the optical element, in some embodiments, the use of low-cost, high-refractive-index materials, such as conventional silicon, is enabled.
    Type: Grant
    Filed: June 15, 2020
    Date of Patent: September 13, 2022
    Assignee: California Institute of Technology
    Inventors: Axel Scherer, Amirhossein Nateghi, Taeyoon Jeon, Frank T. Hartley
  • Patent number: 11422084
    Abstract: The present disclosure is directed toward a measurement system capable of rapid spectroscopic and calorimetric analysis of the chemical makeup of a test sample. Systems in accordance with the present disclosure include a low-thermal-mass sample holder having a substrate whose surface has been engineered to create a large-area sample-collection surface. The sample holder includes an integrated temperature controller that can rapidly heat or cool the test sample. As a result, the sample holder enables differential scanning calorimetry Fourier-Transform Infrared Spectroscopy (DSC-FTIR) that can be performed in minutes rather than hours, as required in the prior art.
    Type: Grant
    Filed: December 6, 2018
    Date of Patent: August 23, 2022
    Assignee: California Institute of Technology
    Inventors: Axel Scherer, Amirhossein Nateghi, Taeyoon Jeon
  • Publication number: 20200309676
    Abstract: The present disclosure is directed toward optical elements, such as sample cuvettes, lenses, prisms, and the like, whose transmissivity is increased by the addition of a geometric anti-reflection layer disposed on at least one surface of the optical element, where the geometric anti-reflection layer includes a plurality of geometric features that collectively reduce the reflectivity of the interface between the surface and another medium. As a result, more of an optical signal incident on the surface passes through the interface. In some embodiments, every surface through which an optical signal passes includes a geometric anti-reflection layer. Due to the increased transmissivity of the optical element, in some embodiments, the use of low-cost, high-refractive-index materials, such as conventional silicon, is enabled.
    Type: Application
    Filed: June 15, 2020
    Publication date: October 1, 2020
    Inventors: Axel Scherer, Amirhossein Nateghi, Taeyoon Jeon, Frank T. Hartley
  • Patent number: 10712258
    Abstract: The present disclosure is directed toward a cuvette for holding a test sample during optical interrogation with a light signal. The transmissivity of the cuvette is increased by a geometric anti-reflection layer disposed on at least one surface of the cuvette, where the geometric anti-reflection layer includes a plurality of geometric features that collectively reduce the reflectivity of the interface between the surface and another medium. As a result, more of the interrogation signal passes through the interface. In some embodiments, every surface through which the interrogation signal passes includes a geometric anti-reflection layer. Due to the increased transmissivity of the cuvette, light detected after passing through it can have an improved signal-to-noise ratio and/or the light signal used to interrogate the sample can have lower intensity. In addition, the reduction of the reflectivity of each surface enables the use of low-cost, high-refractive-index materials, such as conventional silicon.
    Type: Grant
    Filed: December 6, 2018
    Date of Patent: July 14, 2020
    Assignee: California Institute of Technology
    Inventors: Axel Scherer, Amirhossein Nateghi, Taeyoon Jeon, Frank T. Hartley
  • Publication number: 20190170633
    Abstract: The present disclosure is directed toward a cuvette for holding a test sample during optical interrogation with a light signal. The transmissivity of the cuvette is increased by a geometric anti-reflection layer disposed on at least one surface of the cuvette, where the geometric anti-reflection layer includes a plurality of geometric features that collectively reduce the reflectivity of the interface between the surface and another medium. As a result, more of the interrogation signal passes through the interface. In some embodiments, every surface through which the interrogation signal passes includes a geometric anti-reflection layer. Due to the increased transmissivity of the cuvette, light detected after passing through it can have an improved signal-to-noise ratio and/or the light signal used to interrogate the sample can have lower intensity. In addition, the reduction of the reflectivity of each surface enables the use of low-cost, high-refractive-index materials, such as conventional silicon.
    Type: Application
    Filed: December 6, 2018
    Publication date: June 6, 2019
    Inventors: Axel Scherer, Amirhossein Nateghi, Taeyoon Jeon, Frank T. Hartley
  • Publication number: 20190170637
    Abstract: The present disclosure is directed toward a measurement system capable of rapid spectroscopic and calorimetric analysis of the chemical makeup of a test sample. Systems in accordance with the present disclosure include a low-thermal-mass sample holder having a substrate whose surface has been engineered to create a large-area sample-collection surface. The sample holder includes an integrated temperature controller that can rapidly heat or cool the test sample. As a result, the sample holder enables differential scanning calorimetry Fourier-Transform Infrared Spectroscopy (DSC-FTIR) that can be performed in minutes rather than hours, as required in the prior art.
    Type: Application
    Filed: December 6, 2018
    Publication date: June 6, 2019
    Inventors: Axel Scherer, Amirhossein Nateghi, Taeyoon Jeon