Abstract: A method of polishing a target surface of a waveguide to achieve perpendicularity relative to a reference surface is disclosed. The method includes i) providing a polishing apparatus having a polishing plate with a flat surface defining a reference plane, and an adjustable mounting apparatus configured to hold the waveguide during polishing at a plurality of angular orientations; ii) positioning an optical alignment sensor and a light reflecting apparatus such that a first collimated light beam is reflected off of a surface parallel to the reference plane, and a second perpendicular collimated light beam is reflected off of the reference surface; iii) aligning the waveguide within the polishing apparatus such that the reflections received by the optical alignment sensor align within the optical alignment sensor, thereby being indicative of perpendicularity between the reference plane and the reference surface; and iv) polishing the target surface of the aligned waveguide.

Abstract: A method of polishing a target surface of a waveguide to achieve perpendicularity relative to a reference surface is disclosed. The method includes i) providing a polishing apparatus having a polishing plate with a flat surface defining a reference plane, and an adjustable mounting apparatus configured to hold the waveguide during polishing at a plurality of angular orientations; ii) positioning an optical alignment sensor and a light reflecting apparatus such that a first collimated light beam is reflected off of a surface parallel to the reference plane, and a second perpendicular collimated light beam is reflected off of the reference surface; iii) aligning the waveguide within the polishing apparatus such that the reflections received by the optical alignment sensor align within the optical alignment sensor, thereby being indicative of perpendicularity between the reference plane and the reference surface; and iv) polishing the target surface of the aligned waveguide.

Abstract: A method of polishing a target surface of a waveguide to achieve perpendicularity relative to a reference surface is disclosed. The method includes i) providing a polishing apparatus having a polishing plate with a flat surface defining a reference plane, and an adjustable mounting apparatus configured to hold the waveguide during polishing at a plurality of angular orientations; ii) positioning an optical alignment sensor and a light reflecting apparatus such that a first collimated light beam is reflected off of a surface parallel to the reference plane, and a second perpendicular collimated light beam is reflected off of the reference surface; iii) aligning the waveguide within the polishing apparatus such that the reflections received by the optical alignment sensor align within the optical alignment sensor, thereby being indicative of perpendicularity between the reference plane and the reference surface; and iv) polishing the target surface of the aligned waveguide.

Abstract: A symmetric light guide optical element (“LOE”) and methods of fabrication thereof are disclosed. The method includes providing a plurality of transparent plates, each plate having two parallel surfaces, stacking a first subset of the plurality of plates on a transparent base block to form a first stack of plates, forming a sloped surface on one side of the first stack plates and the base block, stacking a second subset of the plurality of plates on the sloped surface to form a second stack of plates, and extracting a slice of the first stack, the base block, and the second stack, such that the slice includes at least a part of the base block interposed between plates of the first stack and plates of the second stack.

Abstract: A method of polishing a target surface of a waveguide to achieve perpendicularity relative to a reference surface is disclosed. The method includes i) providing a polishing apparatus having a polishing plate with a flat surface defining a reference plane, and an adjustable mounting apparatus configured to hold the waveguide during polishing at a plurality of angular orientations; ii) positioning an optical alignment sensor and a light reflecting apparatus such that a first collimated light beam is reflected off of a surface parallel to the reference plane, and a second perpendicular collimated light beam is reflected off of the reference surface; iii) aligning the waveguide within the polishing apparatus such that the reflections received by the optical alignment sensor align within the optical alignment sensor, thereby being indicative of perpendicularity between the reference plane and the reference surface; and iv) polishing the target surface of the aligned waveguide.

Abstract: A light-guide optical element (LOE) and methods of manufacture are disclosed. The LOE includes a transparent substrate having a first refractive index, the substrate having a pair of parallel external surfaces along a length thereof, and a plurality of mutually parallel at least partially reflective internal surfaces, the mutually parallel internal surfaces being angled obliquely relative to the pair of external surfaces; and a transparent polymer resin encapsulating at least a part of the substrate to form an encapsulated structure, the polymer resin having a second refractive index that is matched to the first refractive index; wherein the encapsulated structure comprises a pair of parallel external surfaces of optical quality formed from the resin.

Abstract: A symmetric light guide optical element (“LOE”) and methods of fabrication thereof are disclosed. The method includes providing a plurality of transparent plates, each plate having two parallel surfaces, stacking a first subset of the plurality of plates on a transparent base block to form a first stack of plates, forming a sloped surface on one side of the first stack plates and the base block, stacking a second subset of the plurality of plates on the sloped surface to form a second stack of plates, and extracting a slice of the first stack, the base block, and the second stack, such that the slice includes at least a part of the base block interposed between plates of the first stack and plates of the second stack.