Abstract: Embodiments of the present invention generally relate to the field of semiconductor, in particular to a system and method for conveying and inspecting semiconductor package. More particularly, the present invention relates to the post-seal inspection system and method that performs automatic conveyance of semiconductor package for inspection process.

Abstract: A method and apparatus encoding and decoding data for storage on a mass storage device is described. The code used is a 5/6 rate code in which a maximum transition run constraint is imposed. This code is designed for use with an EEPR4 read channel and provides a Euclidian squared free distance, d2free, of 10 when used with an EEPR4 partial response filter and a Viterbi decoder.

Abstract: A burst error counting system determines for each sector-long error pattern a unique, minimum number of burst errors by (i) specifying, based on the statistical operation of the system, a maximum burst length, L; (ii) determining the location in the error pattern of a first erroneous bit, b.sub.FIRST ; (iii) associating the next L-1 bits with b.sub.FIRST ; (iv) incrementing a burst counter; (v) searching for a next b.sub.FIRST in the remaining bits of the error pattern; and (vi) repeating iii-v. The system may also store the position, that is, bit count, of these b.sub.FIRST 's. Each time the burst error count is incremented, the system compares the count to a predetermined burst error threshold, which is equal to or less than the maximum number of burst errors that can be expected in a sector that is not corrupted to a point at which error correction may produce an incorrect result.

Abstract: A simplified architecture is provided for a partial response read channel. One digital equalizer is used in conjunction with a simple shaping circuit to minimize power consumption while concurrently optimizing both the data recovery and timing extraction functions.