Abstract: A routing multiplexer system provides p outputs based on a selected permutation of p inputs. Each of a plurality of modules has two inputs, two outputs and a control input and is arranged to supply signals at the two inputs to the two outputs in a direct or transposed order based on a value of a bit at the control input. A first p/2 group of the modules are coupled to the n inputs and a second p/2 group of the modules provide the n outputs. A plurality of control bit tables each contains a plurality of bits in an arrangement based on a respective permutation. The memory is responsive to a selected permutation to supply bits to the respective modules based on respective bit values of a respective control bit table, thereby establishing a selected and programmable permutation of the inputs to the outputs.

Abstract: A method of storing sensitive data by generating randomization values, transforming the sensitive data and the randomization values into a result, and storing separate portions of the result on at least two storage devices, such that the sensitive data cannot be disclosed if any one of the storage devices is compromised.

Abstract: The present invention provides an architecture of a memory Built-In Self Repair (BISR) controller for connecting to N memory instances, where N is a positive integer greater than 1. The architecture includes N groups of data ports, N BISR_SUBMOD modules for connecting to the N memory instances, and a CLK_IN input port and a BISR_IN input port for setting configuration of the memory BISR controller. Each of the N groups of data ports includes (1) a PHY_IN output port for connecting to input of a corresponding memory instance; (2) a PHY_OUT input port for connecting to output of the corresponding memory instance; (3) a LOG_IN input port for sending signals to the corresponding memory instance; and (4) a LOG_OUT output port for receiving signals from the corresponding memory instance. Each of the N BISR_SUBMOD modules includes a flip-flop, a first mux and a second mux. The CLK_IN input port is connected to clock inputs of all N flip-flops of the memory BISR controller.

Abstract: A system for layout of a module in an integrated circuit layout pattern has a cell library and a cell placement system. The cell library includes a plurality of cells. The cell placement system is adapted to select one or more cells from the cell library and to locally place each selected cell within the module layout so that each cell pin of the selected cells and each port of the module layout occupies a unique vertical routing track within the module layout.

Abstract: A master controller for an RRAM subsystem. An interface communicates with at least one RRAM controller. A main control unit selects and implements test and repair operations on the RRAM subsystem through the RRAM controller. A timer determines a maximum number of test and repair operations that can be implemented within a given time. Thus, a master controller is included in the RRAM subsystem. The master controller has a relatively simple interface, and performs test and repair operations on the RRAM subsystem. The advantages of using the master controller include an elimination of additional test ports, simplification of the process of preparing the test vectors for RRAM testing, and the master controller is able to accumulate test results and initiate repairs based on those results. In this manner, the RRAM subsystem has a self-repair functionality.

Abstract: A routing multiplexer system provide p outputs based on a selected permutation of p inputs. Each of a plurality of modules has two inputs, two outputs and a control input and is arranged to supply signals at the two inputs to the two outputs in a direct or transposed order based on a value of a bit at the control input. A first p/2 group of the modules are coupled to the n inputs and a second p/2 group of the modules provide the n outputs. A plurality of control bit tables each contains a plurality of bits in an arrangement based on a respective permutation. The memory is responsive to a selected permutation to supply bits to the respective modules based on respective bit values of a respective control bit table, thereby establishing a selected and programmable permutation of the inputs to the outputs.

Abstract: The present invention is directed to a sequential tester for longest prefix search engines. The tester may include a longest prefix search engine, an inputs generator for providing a nearly random flow of input commands to the longest prefix search engine and for outputting a floating rectangle which may represent a search table of the longest prefix search engine, a coding module for providing address and prefix information to the longest prefix search engine, a mapping module for providing data information to the longest prefix search engine, a super search engine for performing super search operations, and an analyzer for computing predicted outputs of the longest prefix search engine and for comparing the predicted outputs with actual outputs computed by the longest prefix search engine.

Abstract: The present invention provides a RRAM communication system including at least one RRAM controller and a master controller. The master controller is communicatively coupled to each of at least one RRAM controller. The master controller is suitable for loading test input parameters into at least one RRAM controller, starting execution of a test and obtaining a result of test execution from at least one RRAM controller. Each of at least one RRAM controller is suitable for executing different tests depending on commands received from the master controller.

Abstract: A system for layout of a module in an integrated circuit layout pattern has a cell library and a cell placement system. The cell library includes a plurality of cells. The cell placement system is adapted to select one or more cells from the cell library and to locally place each selected cell within the module layout so that each cell pin of the selected cells and each port of the module layout occupies a unique vertical routing track within the module layout.

Abstract: A memory timing model is provided, which includes an address input, a multiple-bit data input, a multiple-bit data output, a capacity C and a width N. N one-bit wide memory modules are instantiated in parallel with one another between respective bits of the data input and the data output. Each memory module has a capacity of C bits addressed by the address input.

Abstract: A search engine architecture substitutes short indices for large data widths, thereby reducing widths required for input to and output from the search engine. The search engine system comprises a search engine responsive to an input address to access an index in the search engine. The index has a width no greater than logarithm on base 2 of the search engine capacity, thereby permitting the search engine to be embodied in an IC chip of reduced area. A driver responds to input commands and to the search engine status to manage indices in the search engine and enable the memory to access its addressable locations based on indices in the search engine.

Abstract: A plurality of user-defined memories are mapped to pre-defined basic memories, such as defined on a base platform. The user-defined memories are dividing into classes of similar memories. A mapping technique is selected for members of a selected class of user-defined memories that minimizes the ratio (maxi,j(USEDi,j/AVAILi,j)) of basic memories that have been mapped to basic memories that are available for mapping. If the number of different memory mappings is smaller than a threshold the mapping technique is applied to each user-defined memory. If the number of different memory mappings is greater than the threshold, the groups are arranged in ordered queues of single memory types based on a mapping price and the mapping technique is selected based on a memory of each group and is applied to each user-defined memory in the respective group.

Abstract: The present invention provides a method and BIST architecture for fast memory testing in a platform-based integrated circuit. The method may include steps as follows. An Mem-BIST controller transmitter is started to generate input signals for a memory in a platform using a deterministic and unconditional test algorithm. The input signals are delayed by a first group of pipelines by n clock cycles. The delayed input signals are received by the memory and an output signal is generated by the memory. The output signal is delayed by a second pipeline by m clock cycles. An Mem-BIST controller receiver is started to receive the delayed output signal for comparison.

Abstract: The present invention is directed to a sequential tester for longest prefix search engines. The tester may include a longest prefix search engine, an inputs generator for providing a nearly random flow of input commands to the longest prefix search engine and for outputting a floating rectangle which may represent a search table of the longest prefix search engine, a coding module for providing address and prefix information to the longest prefix search engine, a mapping module for providing data information to the longest prefix search engine, a super search engine for performing super search operations, and an analyzer for computing predicted outputs of the longest prefix search engine and for comparing the predicted outputs with actual outputs computed by the longest prefix search engine.

Abstract: The present invention provides a layout method for a top module including instances of a base module in a memory matrix such as a RRAM memory matrix, and the like. The top module and the base module may each include data pins and at least one control pin, or the top module and the base module may each include data pins only and may not include any control pins. The data pins of the instances of the base module are replicated in the top module. When at least one control pin is included in the top module and the base module, a control signal may be shared among the instances of the base module and the top module by tying together corresponding control pins of the instances and a corresponding control pin of the top module. The present method may include steps as follows. At a library preparation stage, data pins (and control pins, if applicable) of standard cells in the top module are extended vertically for easy access.

Abstract: The present invention is directed to a FIFO memory with single port memory modules that may allow simultaneous read and write operations. In an exemplary aspect of the present invention, a method for employing a FIFO memory with single port memory modules of half capacity to perform simultaneous read and write operations includes the following steps: (a) providing a first single port memory module for an even address of a read or write operation; (b) providing a second single port memory module for an odd address of a read or write operation; (c) alternating even address and odd address; and (d) when both a read request and a write request reach either the first single port memory module or the second single port memory module at a clock cycle, fulfilling the read request at the current clock cycle and fulfilling the write request at the next clock cycle.

Abstract: A search engine apparatus having a built-in functional test may include an input generator, a search engine, a pseudo search engine and a comparator. The inputs generator is suitable for generating outputs including commands and points associated with the commands. The search engine and the pseudo search engine are communicatively coupled to the inputs generator. The search engine suitable for performing search and edit operations and the pseudo search engine is suitable for simulating the search engine by generating pseudo search engine outputs. The comparator is communicatively coupled to the search engine and the pseudo search engine, and is suitable for comparing outputs received from the search engine and pseudo search engine.

Abstract: The present invention provides an architecture of a memory Built-In Self Repair (BISR) controller for connecting to N memory instances, where N is a positive integer greater than 1. The architecture includes N groups of data ports, N BISR_SUBMOD modules for connecting to the N memory instances, and a CLK_IN input port and a BISR_IN input port for setting configuration of the memory BISR controller. Each of the N groups of data ports includes (1) a PHY_IN output port for connecting to input of a corresponding memory instance; (2) a PHY_OUT input port for connecting to output of the corresponding memory instance; (3) a LOG_IN input port for sending signals to the corresponding memory instance; and (4) a LOG_OUT output port for receiving signals from the corresponding memory instance. Each of the N BISR_SUBMOD modules includes a flip-flop, a first mux and a second mux. The CLK_IN input port is connected to clock inputs of all N flip-flops of the memory BISR controller.

Abstract: The present invention provides a memory BISR architecture for a slice. The architecture includes (1) a plurality of physical memory instances; (2) a Mem_BIST controller, communicatively coupled to the plurality of physical memory instances, for testing the plurality of physical memory instances; (3) a FLARE module, communicatively coupled to the Mem_BIST controller, including a scan chain of registers for storing test results of the plurality of physical memory instances, each of the plurality of physical memory instances M_i being assigned one FLARE bit f_i, i=1, 2, . . . , n, the FLARE module being used by the Mem_BIST controller to scan in an error vector F=(f—1, f—2, . . . , f_n); (4) a BISR controller, communicatively coupled to the FLARE module, a ROM module and a REPAIR_CONFIGURATION module, for scanning out the error vector F from the FLARE module to computer a repair configuration vector R=(r—1, r—2, . . .

Abstract: The present invention provides a method and BIST architecture for fast memory testing in a platform-based integrated circuit. The method may include steps as follows. An Mem-BIST controller transmitter is started to generate input signals for a memory in a platform using a deterministic and unconditional test algorithm. The input signals are delayed by a first group of pipelines by n clock cycles. The delayed input signals are received by the memory and an output signal is generated by the memory. The output signal is delayed by a second pipeline by m clock cycles. An Mem-BIST controller receiver is started to receive the delayed output signal for comparison.