Patents by Inventor Andreas Duetting

Andreas Duetting has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Liquid metal ion source and secondary ion mass spectrometric method and use thereof
    Patent number: 8525125
    Abstract: A liquid metal ion source for use in an ion mass spectrometric analysis method contains, on the one hand, a first metal with an atomic weight ?190 U and, on the other hand, another metal with an atomic weight ?90 U. One of the two types of ions are filtered out alternately from the primary ion beam and directed onto the target as a mass-pure primary ion beam.
    Type: Grant
    Filed: March 15, 2013
    Date of Patent: September 3, 2013
    Assignee: ION-TOF Technologies GmbH
    Inventors: Felix Kollmer, Peter Hoerster, Andreas Duetting
  • LIQUID METAL ION SOURCE AND SECONDARY ION MASS SPECTROMETRIC METHOD AND USE THEREOF
    Publication number: 20130216427
    Abstract: A liquid metal ion source for use in an ion mass spectrometric analysis method contains, on the one hand, a first metal with an atomic weight ?190 U and, on the other hand, another metal with an atomic weight ?90 U. One of the two types of ions are filtered out alternately from the primary ion beam and directed onto the target as a mass-pure primary ion beam.
    Type: Application
    Filed: March 15, 2013
    Publication date: August 22, 2013
    Applicant: ION-TOF TECHNOLOGIES GMBH
    Inventors: Felix KOLLMER, Peter HOERSTER, Andreas DUETTING
  • Liquid metal ion source, secondary ion mass spectrometer, secondary ion mass spectrometric analysis method and use thereof
    Patent number: 8410425
    Abstract: A mass spectrometric method according to the Gentle SIMS (G-SIMS) method uses a liquid metal ion source which contains, on the one hand, a first metal with an atomic weight ?190 U and, on the other hand, another metal with an atomic weight ?90 U. One of the two types of ions are filtered out alternately from the primary ion beam and directed onto the target as a mass-pure primary ion beam.
    Type: Grant
    Filed: October 16, 2008
    Date of Patent: April 2, 2013
    Assignee: Ion-Tof Technologies GmbH
    Inventors: Felix Kollmer, Peter Hoerster, Andreas Duetting
  • LIQUID METAL ION SOURCE, SECONDARY IION MASS SPECTROMETER,SECONDARY ION MASS SPECTROMETRIC ANALYSIS METHOD AND USE THEREOF
    Publication number: 20100237234
    Abstract: A mass spectrometric method according to the Gentle SIMS (G-SIMS) method uses a liquid metal ion source which contains, on the one hand, a first metal with an atomic weight ?190 U and, on the other hand, another metal with an atomic weight ?90 U. One of the two types of ions are filtered out alternately from the primary ion beam and directed onto the target as a mass-pure primary ion beam.
    Type: Application
    Filed: October 16, 2008
    Publication date: September 23, 2010
    Applicant: ION-TOF TECHNOLOGIES GMBH
    Inventors: Felix Kollmer, Peter Hoerster, Andreas Duetting