Patents by Inventor Andreas Engberg

Andreas Engberg has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11774293
    Abstract: An ultra-small thermal imaging core, or micro-core. The design of the micro-core may include substrates for mounting optics and electronic connectors that are thermally matched to the imaging Focal Plane Array (FPA). Test fixtures for test and adjustment that allow for operation and image acquisition of multiple cores may also be provided. Tooling may be included to position the optics to set the core focus, either by moving the lens and lens holder as one or by pushing and/or pulling the lens against a lens positioning element within the lens holder, while observing a scene. Test procedures and fixtures that allow for full temperature calibration of each individual core, as well as providing data useful for uniformity correction during operation may also be included as part of the test and manufacture of the core.
    Type: Grant
    Filed: April 29, 2022
    Date of Patent: October 3, 2023
    Assignee: Seek Thermal, Inc.
    Inventors: William J. Parrish, Andreas Engberg, Jason Wolfe, Derek Moran, Blake Henry, Ross Williams, Russ Mead
  • Publication number: 20220260424
    Abstract: An ultra-small thermal imaging core, or micro-core. The design of the micro-core may include substrates for mounting optics and electronic connectors that are thermally matched to the imaging Focal Plane Array (FPA). Test fixtures for test and adjustment that allow for operation and image acquisition of multiple cores may also be provided. Tooling may be included to position the optics to set the core focus, either by moving the lens and lens holder as one or by pushing and/or pulling the lens against a lens positioning element within the lens holder, while observing a scene. Test procedures and fixtures that allow for full temperature calibration of each individual core, as well as providing data useful for uniformity correction during operation may also be included as part of the test and manufacture of the core.
    Type: Application
    Filed: April 29, 2022
    Publication date: August 18, 2022
    Inventors: William J. Parrish, Andreas Engberg, Jason Wolfe, Derek Moran, Blake Henry, Ross Williams, Russ Mead
  • Patent number: 11353365
    Abstract: An ultra-small thermal imaging core, or micro-core. The design of the micro-core may include substrates for mounting optics and electronic connectors that are thermally matched to the imaging Focal Plane Array (FPA). Test fixtures for test and adjustment that allow for operation and image acquisition of multiple cores may also be provided. Tooling may be included to position the optics to set the core focus, either by moving the lens and lens holder as one or by pushing and/or pulling the lens against a lens positioning element within the lens holder, while observing a scene. Test procedures and fixtures that allow for full temperature calibration of each individual core, as well as providing data useful for uniformity correction during operation may also be included as part of the test and manufacture of the core.
    Type: Grant
    Filed: June 20, 2018
    Date of Patent: June 7, 2022
    Assignee: Seek Thermal, Inc.
    Inventors: William J. Parrish, Andreas Engberg, Jason Wolfe, Derek Moran, Blake Henry, Ross Williams, Russ Mead
  • Publication number: 20200217719
    Abstract: An ultra-small thermal imaging core, or micro-core. The design of the micro-core may include substrates for mounting optics and electronic connectors that are thermally matched to the imaging Focal Plane Array (FPA). Test fixtures for test and adjustment that allow for operation and image acquisition of multiple cores may also be provided. Tooling may be included to position the optics to set the core focus, either by moving the lens and lens holder as one or by pushing and/or pulling the lens against a lens positioning element within the lens holder, while observing a scene. Test procedures and fixtures that allow for full temperature calibration of each individual core, as well as providing data useful for uniformity correction during operation may also be included as part of the test and manufacture of the core.
    Type: Application
    Filed: June 20, 2018
    Publication date: July 9, 2020
    Inventors: William J. Parrish, Andreas Engberg, Jason Wolfe, Derek Moran, Blake Henry, Ross Williams, Russ Mead
  • Patent number: 10600164
    Abstract: Imaging systems and methods are disclosed that use locally flat scenes to adjust image data. An imaging system includes an array of photodetectors configured to produce an array of intensity values corresponding to light intensity at the photodetectors. The imaging system can be configured to acquire a frame of intensity values, or an image frame, and analyze the image frame to determine if it is locally flat. If the image frame is locally flat, then that image data can be used to determine gradients present in the image frame. An offset mask can be determined from the image data and that offset mask can be used to adjust subsequently acquired image frames to reduce or remove gradients.
    Type: Grant
    Filed: June 20, 2018
    Date of Patent: March 24, 2020
    Assignee: Seek Thermal, Inc.
    Inventors: Jeffrey Lee, William J. Parrish, Andreas Engberg, Ross Williams
  • Patent number: 10467736
    Abstract: Imaging systems and methods are disclosed that use locally flat scenes to adjust image data. An imaging system includes an array of photodetectors configured to produce an array of intensity values corresponding to light intensity at the photodetectors. The imaging system can be configured to acquire a frame of intensity values, or an image frame, and analyze the image frame to determine if it is locally flat. If the image frame is locally flat, then that image data can be used to determine gradients present in the image frame. An offset mask can be determined from the image data and that offset mask can be used to adjust subsequently acquired image frames to reduce or remove gradients.
    Type: Grant
    Filed: March 29, 2018
    Date of Patent: November 5, 2019
    Assignee: Seek Thermal, Inc.
    Inventors: Jeffrey Lee, William J. Parrish, Andreas Engberg, Ross Williams
  • Publication number: 20190028658
    Abstract: A system and method for digitizing data from an imaging system includes sampling a signal from an optical detector with a first circuit having a first attenuation and with a second circuit having a second attenuation different than the first attenuation. The system and method further includes digitizing the sampled signal at a predetermined number of bits desired for an analog to digital conversion of the sampled signal by allocating a first portion of bits to digitizing a signal from the first circuit and allocating a second portion of bits to digitizing a signal from the second circuit. The system and method further includes encoding the first and second portion of bits into one monotonic digital word corresponding to a range of the sampled signal.
    Type: Application
    Filed: September 10, 2018
    Publication date: January 24, 2019
    Inventors: William J. Parrish, Andreas Engberg
  • Patent number: 10186020
    Abstract: Contrast adjustment of a digital image can include using at least two signal processing paths to adjust a display-formatted pixel value to enhance the appearance of edges in displayed image data. A digital image can be filtered by producing an edge enhancement factor, ?, per pixel from at least one look up table (LUT). Digital image data can also be adjusted using at least two signal processing paths, where the image data is adjusted if a pixel value and its neighboring pixel values are all within a smoothing range or where the pixel delta value is outside of a bad pixel range and its neighboring pixel delta values are all within the bad pixel range. In such cases, the image data can be adjusted by replacing the pixel value with an average or median value of the neighboring pixels.
    Type: Grant
    Filed: August 7, 2017
    Date of Patent: January 22, 2019
    Assignee: Seek Thermal, Inc.
    Inventors: Andreas Engberg, William J. Parrish
  • Publication number: 20180315171
    Abstract: Imaging systems and methods are disclosed that use locally flat scenes to adjust image data. An imaging system includes an array of photodetectors configured to produce an array of intensity values corresponding to light intensity at the photodetectors. The imaging system can be configured to acquire a frame of intensity values, or an image frame, and analyze the image frame to determine if it is locally flat. If the image frame is locally flat, then that image data can be used to determine gradients present in the image frame. An offset mask can be determined from the image data and that offset mask can be used to adjust subsequently acquired image frames to reduce or remove gradients.
    Type: Application
    Filed: June 20, 2018
    Publication date: November 1, 2018
    Inventors: Jeffrey Lee, William J. Parrish, Andreas Engberg, Ross Williams
  • Publication number: 20180276803
    Abstract: Imaging systems and methods are disclosed that use locally flat scenes to adjust image data. An imaging system includes an array of photodetectors configured to produce an array of intensity values corresponding to light intensity at the photodetectors. The imaging system can be configured to acquire a frame of intensity values, or an image frame, and analyze the image frame to determine if it is locally flat. If the image frame is locally flat, then that image data can be used to determine gradients present in the image frame. An offset mask can be determined from the image data and that offset mask can be used to adjust subsequently acquired image frames to reduce or remove gradients.
    Type: Application
    Filed: March 29, 2018
    Publication date: September 27, 2018
    Inventors: Jeffrey Lee, William J. Parrish, Andreas Engberg, Ross Williams
  • Patent number: 10075658
    Abstract: A system and method for digitizing data from an imaging system includes sampling a signal from an optical detector with a first circuit having a first attenuation and with a second circuit having a second attenuation different than the first attenuation. The system and method further includes digitizing the sampled signal at a predetermined number of bits desired for an analog to digital conversion of the sampled signal by allocating a first portion of bits to digitizing a signal from the first circuit and allocating a second portion of bits to digitizing a signal from the second circuit. The system and method further includes encoding the first and second portion of bits into one monotonic digital word corresponding to a range of the sampled signal.
    Type: Grant
    Filed: May 30, 2014
    Date of Patent: September 11, 2018
    Assignee: Seek Thermal, Inc.
    Inventors: William J. Parrish, Andreas Engberg
  • Patent number: 9947086
    Abstract: Imaging systems and methods are disclosed that use locally flat scenes to adjust image data. An imaging system includes an array of photodetectors configured to produce an array of intensity values corresponding to light intensity at the photodetectors. The imaging system can be configured to acquire a frame of intensity values, or an image frame, and analyze the image frame to determine if it is locally flat. If the image frame is locally flat, then that image data can be used to determine gradients present in the image frame. An offset mask can be determined from the image data and that offset mask can be used to adjust subsequently acquired image frames to reduce or remove gradients.
    Type: Grant
    Filed: December 1, 2015
    Date of Patent: April 17, 2018
    Assignee: Seek Thermal, Inc.
    Inventors: Jeffrey Lee, William J. Parrish, Andreas Engberg, Ross Williams
  • Patent number: 9924116
    Abstract: A method and an imaging system for adaptive shutter control wherein an imaging system can be configured to actuate a calibration element at various times and develop an offset correction or Non-Uniformity Correction (NUC). The system control processing units may acquire information derived from calibration data, regular imaging data or external data, which may be correlated with how fast the NUC is changing over time. How often calibration element is actuated may be adaptively determined from the correlating information and the actuation times may be adaptively controlled to optimally actuate as needed. In some embodiments the calibration element may be a shutter and calibration activation may include closing the shutter and providing a flat field image for calibration purposes.
    Type: Grant
    Filed: March 11, 2016
    Date of Patent: March 20, 2018
    Assignee: Seek Thermal, Inc.
    Inventors: Romeo Chahine, William J. Parrish, Jeffery Lee, Ross Williams, Andreas Engberg, Jason Wolfe
  • Publication number: 20170372458
    Abstract: Contrast adjustment of a digital image can include using at least two signal processing paths to adjust a display-formatted pixel value to enhance the appearance of edges in displayed image data. A digital image can be filtered by producing an edge enhancement factor, ?, per pixel from at least one look up table (LUT). Digital image data can also be adjusted using at least two signal processing paths, where the image data is adjusted if a pixel value and its neighboring pixel values are all within a smoothing range or where the pixel delta value is outside of a bad pixel range and its neighboring pixel delta values are all within the bad pixel range. In such cases, the image data can be adjusted by replacing the pixel value with an average or median value of the neighboring pixels.
    Type: Application
    Filed: August 7, 2017
    Publication date: December 28, 2017
    Inventors: Andreas Engberg, William J. Parrish
  • Patent number: 9797942
    Abstract: FPAs on a wafer can be tested prior to dicing the wafer into individual dies. A focal plane array (FPA) can comprise an array of photodetectors, such as microbolometers, on a semiconductor substrate or die. FPAs can be manufactured on a wafer to make multiple FPAs on a single wafer that can be later diced or divided into individual FPAs. Prior to dicing the wafer, the FPAs can be tested electrically and radiometrically in bulk to characterize individual FPAs, to identify bad pixels, to identify bad chips, to calibrate individual FPAs, and the like. These test results can be used to determine acceptable FPAs and can be used to provide initial settings for imaging systems with the tested and integrated FPA.
    Type: Grant
    Filed: August 27, 2015
    Date of Patent: October 24, 2017
    Assignee: Seek Thermal, Inc.
    Inventors: Andreas Engberg, William J. Parrish
  • Patent number: 9727954
    Abstract: Edge enhancement of a digital image can include using at least two signal processing paths to adjust a display-formatted pixel value to enhance the appearance of edges in displayed image data. A digital image can be filtered by producing an edge enhancement factor, ?, per pixel from at least one look up table (LUT). Digital image data can also be adjusted using at least two signal processing paths, where the image data is adjusted if a pixel value and its neighboring pixel values are all within a smoothing range or where the pixel delta value is outside of a bad pixel range and its neighboring pixel delta values are all within the bad pixel range. In such cases, the image data can be adjusted by replacing the pixel value with an average or median value of the neighboring pixels.
    Type: Grant
    Filed: August 4, 2015
    Date of Patent: August 8, 2017
    Assignee: Seek Thermal, Inc.
    Inventors: Andreas Engberg, William J. Parrish
  • Publication number: 20160198102
    Abstract: A method and an imaging system for adaptive shutter control wherein an imaging system can be configured to actuate a calibration element at various times and develop an offset correction or Non-Uniformity Correction (NUC). The system control processing units may acquire information derived from calibration data, regular imaging data or external data, which may be correlated with how fast the NUC is changing over time. How often calibration element is actuated may be adaptively determined from the correlating information and the actuation times may be adaptively controlled to optimally actuate as needed. In some embodiments the calibration element may be a shutter and calibration activation may include closing the shutter and providing a flat field image for calibration purposes.
    Type: Application
    Filed: March 11, 2016
    Publication date: July 7, 2016
    Inventors: Romeo Chahine, William J. Parrish, Jeffery Lee, Ross Williams, Andreas Engberg, Jason Wolfe
  • Publication number: 20160156858
    Abstract: Imaging systems and methods are disclosed that use locally flat scenes to adjust image data. An imaging system includes an array of photodetectors configured to produce an array of intensity values corresponding to light intensity at the photodetectors. The imaging system can be configured to acquire a frame of intensity values, or an image frame, and analyze the image frame to determine if it is locally flat. If the image frame is locally flat, then that image data can be used to determine gradients present in the image frame. An offset mask can be determined from the image data and that offset mask can be used to adjust subsequently acquired image frames to reduce or remove gradients.
    Type: Application
    Filed: December 1, 2015
    Publication date: June 2, 2016
    Inventors: Jeffery Lee, William J. Parrish, Andreas Engberg, Ross Williams
  • Publication number: 20160061883
    Abstract: Disclosed herein are systems and methods for testing FPAs on a wafer prior to dicing the wafer into individual dies. A focal plane array (FPA) can comprise an array of photodetectors, such as microbolometers, on a semiconductor substrate or die. FPAs can be manufactured on a wafer to make multiple FPAs on a single wafer that can be later diced or divided into individual FPAs. Prior to dicing the wafer, the FPAs can be tested electrically and radiometrically in bulk to characterize individual FPAs, to identify bad pixels, to identify bad chips, to calibrate individual FPAs, and the like. These test results can be used to determine acceptable FPAs and can be used to provide initial settings for imaging systems with the tested and integrated FPA.
    Type: Application
    Filed: August 27, 2015
    Publication date: March 3, 2016
    Inventors: Andreas Engberg, William J. Parrish
  • Publication number: 20160042500
    Abstract: Edge enhancement of a digital image can include using at least two signal processing paths to adjust a display-formatted pixel value to enhance the appearance of edges in displayed image data. A digital image can be filtered by producing an edge enhancement factor, a, per pixel from at least one look up table (LUT). Digital image data can also be adjusted using at least two signal processing paths, where the image data is adjusted if a pixel value and its neighboring pixel values are all within a smoothing range or where the pixel delta value is outside of a bad pixel range and its neighboring pixel delta values are all within the bad pixel range. In such cases, the image data can be adjusted by replacing the pixel value with an average or median value of the neighboring pixels.
    Type: Application
    Filed: August 4, 2015
    Publication date: February 11, 2016
    Inventors: Andreas Engberg, William J. Parrish