Patents by Inventor Andrei Aleinikov

Andrei Aleinikov has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for fast and accurate determination of the minority carrier diffusion length from simultaneously measured surface photovoltages
    Patent number: 6512384
    Abstract: Minority carrier diffusion lengths are determined fast, accurately, and conveniently by illuminating a surface of the semiconductor with a beam composed of a plurality of light fluxes each having a different wavelength modulated at a different frequency. Surface photovoltages induced by different light fluxes are simultaneously detected by monitoring surface photovoltage signals at the different modulation frequencies. The surface photovoltage signals are frequency calibrated and then used to calculated a minority carrier diffusion length.
    Type: Grant
    Filed: September 28, 2000
    Date of Patent: January 28, 2003
    Assignee: Semiconductor Diagnostics, Inc.
    Inventors: Jacek Lagowski, Vladimir Faifer, Andrei Aleinikov