Patents by Inventor Andrew J. Stevens
Andrew J. Stevens has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Patent number: 10656287Abstract: A method includes directing a probe beam to a target that includes an array of data portions in a data storage medium arranged so that a beam area of the probe beam extends across a plurality of adjacent data portions, the array including a data portion subset with each data portion of the subset responsive to the probe beam to produce a response illumination, receiving the response illumination at a detector, and determining data values corresponding to the plurality of adjacent data portions based on the received response illumination. Apparatus and systems are also disclosed.Type: GrantFiled: April 3, 2019Date of Patent: May 19, 2020Assignee: Battelle Memorial InstituteInventors: David W. Gotthold, Andrew J. Stevens, Nigel D. Browning, Eric Jensen, Nathan L. Canfield, Alan G. Joly
-
Patent number: 10580614Abstract: Mask-modulated spectra are incident to a sensor and are summed during a frame time. After the frame time, a compressed spectrum is read out based on the sum and decompressed to obtain spectra for some or all specimen locations. The mask-modulated spectrum that are summed are associated with different modulations produced by a common mask.Type: GrantFiled: April 7, 2017Date of Patent: March 3, 2020Assignee: Battelle Memorial InstituteInventors: Andrew J. Stevens, Libor Kovarik, Nigel D. Browning
-
Patent number: 10541109Abstract: Disclosed are methods for sensing conditions of an electron microscope system and/or a specimen analyzed thereby. Also disclosed are sensor systems and electron microscope systems able to sense system conditions, and/or conditions of the specimen being analyzed by such systems. In one embodiment, a sparse dataset can be acquired from a random sub-sampling of the specimen by an electron beam probe of the electron microscope system. Instrument parameters, specimen characteristics, or both can be estimated from the sparse dataset.Type: GrantFiled: July 26, 2017Date of Patent: January 21, 2020Assignee: BATTELLE MEMORIAL INSTITUTEInventors: Bryan A. Stanfill, Sarah M. Reehl, Margaret C. Johnson, Lisa M. Bramer, Nigel D. Browning, Andrew J. Stevens, Libor Kovarik
-
Patent number: 10431419Abstract: Sparse sampling approaches and probe systems for analytical instruments are disclosed providing for effective sub-sampling of a specimen and inpainting to reconstruct representations of actual information. The sub-sampling involves serial acquisition of contiguous measured values lying at positions along a scan path extending in a line toward a first direction and having random perturbations in a second direction. The perturbations are limited within a predetermined distance from the line. Inpainting techniques are utilized among the measured values to reconstruct a representation of actual information regarding the specimen.Type: GrantFiled: July 7, 2017Date of Patent: October 1, 2019Assignee: Battelle Memorial InstituteInventors: Libor Kovarik, Andrew J. Stevens, Andrey V. Liyu, Nigel D. Browning
-
Publication number: 20190227181Abstract: A method includes directing a probe beam to a target that includes an array of data portions in a data storage medium arranged so that a beam area of the probe beam extends across a plurality of adjacent data portions, the array including a data portion subset with each data portion of the subset responsive to the probe beam to produce a response illumination, receiving the response illumination at a detector, and determining data values corresponding to the plurality of adjacent data portions based on the received response illumination. Apparatus and systems are also disclosed.Type: ApplicationFiled: April 3, 2019Publication date: July 25, 2019Applicant: Battelle Memorial InstituteInventors: David W. Gotthold, Andrew J. Stevens, Nigel D. Browning, Eric Jensen, Nathan L. Canfield, Alan G. Joly
-
Patent number: 10295677Abstract: A method includes directing a probe beam to a target that includes an array of data portions in a data storage medium arranged so that a beam area of the probe beam extends across a plurality of adjacent data portions, the array including a data portion subset with each data portion of the subset responsive to the probe beam to produce a response illumination, receiving the response illumination at a detector, and determining data values corresponding to the plurality of adjacent data portions based on the received response illumination. Apparatus and systems are also disclosed.Type: GrantFiled: May 8, 2017Date of Patent: May 21, 2019Assignee: Battelle Memorial InstituteInventors: David W. Gotthold, Andrew J. Stevens, Nigel D. Browning, Eric Jensen, Nathan L. Canfield, Alan G. Joly
-
Patent number: 10256072Abstract: Disclosed are methods for optimized sub-sampling in an electron microscope. With regard at least to utilization of electron dose budgets, of time for acquisition of measurements, and of computing/processing capabilities, very high efficiencies can be achieved by informing and/or adapting subsequent sub-sampling measurements according to one or more earlier-acquired sparse datasets and/or according to analyzes thereof.Type: GrantFiled: August 1, 2017Date of Patent: April 9, 2019Assignee: Battelle Memorial InstituteInventors: Andrew J. Stevens, Libor Kovarik, Andrey V. Liyu, Nigel D. Browning
-
Patent number: 10224175Abstract: Transmission microscopy imaging systems include a mask and/or other modulator situated to encode image beams, e.g., by deflecting the image beam with respect to the mask and/or sensor. The beam is modulated/masked either before or after transmission through a sample to induce a spatially and/or temporally encoded signal by modifying any of the beam/image components including the phase/coherence, intensity, or position of the beam at the sensor. For example, a mask can be placed/translated through the beam so that several masked beams are received by a sensor during a single sensor integration time. Images associated with multiple mask displacements are then used to reconstruct a video sequence using a compressive sensing method. Another example of masked modulation involves a mechanism for phase-retrieval, whereby the beam is modulated by a set of different masks in the image plane and each masked image is recorded in the diffraction plane.Type: GrantFiled: March 18, 2016Date of Patent: March 5, 2019Assignee: Battelle Memorial InstituteInventors: Andrew J. Stevens, Libor Kovarik, Nigel D. Browning, Andrey V. Liyu, Xin Yuan, Lawrence Carin
-
Publication number: 20190043690Abstract: Disclosed are methods for optimized sub-sampling in an electron microscope. With regard at least to utilization of electron dose budgets, of time for acquisition of measurements, and of computing/processing capabilities, very high efficiencies can be achieved by informing and/or adapting subsequent sub-sampling measurements according to one or more earlier-acquired sparse datasets and/or according to analyses thereof.Type: ApplicationFiled: August 1, 2017Publication date: February 7, 2019Applicant: BATTELLE MEMORIAL INSTITUTEInventors: Andrew J. Stevens, Libor Kovarik, Andrey V. Liyu, Nigel D. Browning
-
Patent number: 10170274Abstract: Transmission microscopy imaging systems include a mask and/or other modulator situated to encode image beams, e.g., by deflecting the image beam with respect to the mask and/or sensor. The beam is modulated/masked either before or after transmission through a sample to induce a spatially and/or temporally encoded signal by modifying any of the beam/image components including the phase/coherence, intensity, or position of the beam at the sensor. For example, a mask can be placed/translated through the beam so that several masked beams are received by a sensor during a single sensor integration time. Images associated with multiple mask displacements are then used to reconstruct a video sequence using a compressive sensing method. Another example of masked modulation involves a mechanism for phase-retrieval, whereby the beam is modulated by a set of different masks in the image plane and each masked image is recorded in the diffraction plane.Type: GrantFiled: October 5, 2016Date of Patent: January 1, 2019Assignee: Battelle Memorial InstituteInventors: Andrew J. Stevens, Libor Kovarik, Nigel D. Browning
-
Publication number: 20180321390Abstract: A method includes directing a probe beam to a target that includes an array of data portions in a data storage medium arranged so that a beam area of the probe beam extends across a plurality of adjacent data portions, the array including a data portion subset with each data portion of the subset responsive to the probe beam to produce a response illumination, receiving the response illumination at a detector, and determining data values corresponding to the plurality of adjacent data portions based on the received response illumination. Apparatus and systems are also disclosed.Type: ApplicationFiled: May 8, 2017Publication date: November 8, 2018Applicant: Battelle Memorial InstituteInventors: David W. Gotthold, Andrew J. Stevens, Nigel D. Browning, Eric Jensen, Nathan L. Canfield, Alan G. Joly
-
Patent number: 10109453Abstract: Transmission microscopy imaging systems include a mask and/or other modulator situated to encode image beams, e.g., by deflecting the image beam with respect to the mask and/or sensor. The beam is modulated/masked either before or after transmission through a sample to induce a spatially and/or temporally encoded signal by modifying any of the beam/image components including the phase/coherence, intensity, or position of the beam at the sensor. For example, a mask can be placed/translated through the beam so that several masked beams are received by a sensor during a single sensor integration time. Images associated with multiple mask displacements are then used to reconstruct a video sequence using a compressive sensing method. Another example of masked modulation involves a mechanism for phase-retrieval, whereby the beam is modulated by a set of different masks in the image plane and each masked image is recorded in the diffraction plane.Type: GrantFiled: March 18, 2016Date of Patent: October 23, 2018Assignee: Battelle Memorial InstituteInventors: Andrew J. Stevens, Libor Kovarik, Nigel D. Browning, Andrey V. Liyu
-
Publication number: 20180033591Abstract: Disclosed are methods for sensing conditions of an electron microscope system and/or a specimen analyzed thereby. Also disclosed are sensor systems and electron microscope systems able to sense system conditions, and/or conditions of the specimen being analyzed by such systems. In one embodiment, a sparse dataset can be acquired from a random sub-sampling of the specimen by an electron beam probe of the electron microscope system. Instrument parameters, specimen characteristics, or both can be estimated from the sparse dataset.Type: ApplicationFiled: July 26, 2017Publication date: February 1, 2018Applicant: BATTELLE MEMORIAL INSTITUTEInventors: Bryan A. Stanfill, Sarah M. Reehl, Margaret C. Johnson, Lisa M. Bramer, Nigel D. Browning, Andrew J. Stevens, Libor Kovarik
-
Publication number: 20180025887Abstract: Sparse sampling approaches and probe systems for analytical instruments are disclosed providing for effective sub-sampling of a specimen and inpainting to reconstruct representations of actual information. The sub-sampling involves serial acquisition of contiguous measured values lying at positions along a scan path extending in a line toward a first direction and having random perturbations in a second direction. The perturbations are limited within a predetermined distance from the line. Inpainting techniques are utilized among the measured values to reconstruct a representation of actual information regarding the specimen.Type: ApplicationFiled: July 7, 2017Publication date: January 25, 2018Applicant: BATTELLE MEMORIAL INSTITUTEInventors: Libor Kovarik, Andrew J. Stevens, Andrey V. Liyu, Nigel D. Browning
-
Publication number: 20170316916Abstract: Mask-modulated spectra are incident to a sensor and are summed during a frame time. After the frame time, a compressed spectrum is read out based on the sum and decompressed to obtain spectra for some or all specimen locations. The mask-modulated spectrum that are summed are associated with different modulations produced by a common mask.Type: ApplicationFiled: April 7, 2017Publication date: November 2, 2017Applicant: Battelle Memorial InstituteInventors: Andrew J. Stevens, Libor Kovarik, Nigel D. Browning
-
Publication number: 20170025247Abstract: Transmission microscopy imaging systems include a mask and/or other modulator situated to encode image beams, e.g., by deflecting the image beam with respect to the mask and/or sensor. The beam is modulated/masked either before or after transmission through a sample to induce a spatially and/or temporally encoded signal by modifying any of the beam/image components including the phase/coherence, intensity, or position of the beam at the sensor. For example, a mask can be placed/translated through the beam so that several masked beams are received by a sensor during a single sensor integration time. Images associated with multiple mask displacements are then used to reconstruct a video sequence using a compressive sensing method. Another example of masked modulation involves a mechanism for phase-retrieval, whereby the beam is modulated by a set of different masks in the image plane and each masked image is recorded in the diffraction plane.Type: ApplicationFiled: October 5, 2016Publication date: January 26, 2017Applicant: Battelle Memorial InstituteInventors: Andrew J. Stevens, Libor Kovarik, Nigel D. Browning
-
Publication number: 20160276129Abstract: Transmission microscopy imaging systems include a mask and/or other modulator situated to encode image beams, e.g., by deflecting the image beam with respect to the mask and/or sensor. The beam is modulated/masked either before or after transmission through a sample to induce a spatially and/or temporally encoded signal by modifying any of the beam/image components including the phase/coherence, intensity, or position of the beam at the sensor. For example, a mask can be placed/translated through the beam so that several masked beams are received by a sensor during a single sensor integration time. Images associated with multiple mask displacements are then used to reconstruct a video sequence using a compressive sensing method. Another example of masked modulation involves a mechanism for phase-retrieval, whereby the beam is modulated by a set of different masks in the image plane and each masked image is recorded in the diffraction plane.Type: ApplicationFiled: March 18, 2016Publication date: September 22, 2016Applicant: Battelle Memorial InstituteInventors: Andrew J. Stevens, Libor Kovarik, Nigel D. Browning, Andrey V. Liyu, Xin Yuan, Lawrence Carin
-
Publication number: 20160276050Abstract: Transmission microscopy imaging systems include a mask and/or other modulator situated to encode image beams, e.g., by deflecting the image beam with respect to the mask and/or sensor. The beam is modulated/masked either before or after transmission through a sample to induce a spatially and/or temporally encoded signal by modifying any of the beam/image components including the phase/coherence, intensity, or position of the beam at the sensor. For example, a mask can be placed/translated through the beam so that several masked beams are received by a sensor during a single sensor integration time. Images associated with multiple mask displacements are then used to reconstruct a video sequence using a compressive sensing method. Another example of masked modulation involves a mechanism for phase-retrieval, whereby the beam is modulated by a set of different masks in the image plane and each masked image is recorded in the diffraction plane.Type: ApplicationFiled: March 18, 2016Publication date: September 22, 2016Applicant: Battelle Memorial InstituteInventors: Andrew J. Stevens, Libor Kovarik, Nigel D. Browning, Andrey V. Liyu
-
Patent number: 7991686Abstract: Various embodiments show a system for conducting an auction for a plurality of financially settled contracts: The system may comprise at least one computer. The at least one computer may be programmed to receive a plurality of first participant bids from a first participant and a plurality of second participant bids from a second participant. The at least one computer may also be programmed to match a batch of bids, where the matched bids may be modified to reduce the trade risk of a portfolio of the first participant, or to liquidate a defaulted portfolio subject to a Maximum Portfolio Liquidation Cost Constraint. The contracts may include, for example, an oil contract, a coal contract, a natural gas contract, an electricity contract, a weather contract, a weather-related events contract, a commodities contract, a location specific service contract (e.g., a passenger contract and/or freight contract), a financial derivative contract, or a credit default contract on any of an entity's issued securities.Type: GrantFiled: June 5, 2009Date of Patent: August 2, 2011Assignee: DC Energy LLCInventors: Andrew J. Stevens, Matthew R. Tate, Mark A. Bulkeley, Dean L. Wilde, II, Paul S. Gibbs, Stefan Jacob
-
Patent number: 7885888Abstract: Various embodiments show a system for conducting an auction for a plurality of financially settled contracts: The system may comprise at least one processor. The at least one processor may be programmed to receive a plurality of first participant bids from a first participant and a plurality of second participant bids from a second participant. The at least one processor may also be programmed to match a batch of bids to create a plurality of awarded bids. The contracts may include, for example, an oil contract, a coal contract, a natural gas contract, an electricity contract, a weather contract, a weather-related events contract, a commodities contract, location specific service contracts (e.g., passenger contract and/or freight contracts).Type: GrantFiled: January 22, 2010Date of Patent: February 8, 2011Assignee: DC Energy LLCInventors: Andrew J. Stevens, Matthew R. Tate, Mark A. Bulkeley, Dean L. Wilde, II