Patents by Inventor Anirudha Vaidya

Anirudha Vaidya has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of measuring coating thickness using infrared light
    Patent number: 8300232
    Abstract: A method of measuring a thickness of a coating on a substrate material. A first pulse of monochromatic light having a predetermined first wavelength is emitted toward the coating and substrate material. A second pulse of monochromatic light having a predetermined second wavelength is emitted toward the coating and substrate material, the second wavelength being different than the first wavelength. A first elapsed time is measured from emission of the first pulse of light to reception of a reflection of the first pulse of light from a surface of the substrate material at an interface with the coating. A second elapsed time is measured from emission of the second pulse of light to reception of a reflection of the second pulse of light from an outer surface of the coating. A thickness of the coating is determined as a function of a difference between the first and second elapsed times.
    Type: Grant
    Filed: August 19, 2009
    Date of Patent: October 30, 2012
    Assignee: Siemens Energy, Inc.
    Inventors: David G. Sansom, David B. Allen, Anirudha Vaidya
  • Method of Measuring Coating Thickness Using Infrared Light
    Publication number: 20110043820
    Abstract: A method of measuring a thickness of a coating on a substrate material. A first pulse of monochromatic light having a predetermined first wavelength is emitted toward the coating and substrate material. A second pulse of monochromatic light having a predetermined second wavelength is emitted toward the coating and substrate material, the second wavelength being different than the first wavelength. A first elapsed time is measured from emission of the first pulse of light to reception of a reflection of the first pulse of light from a surface of the substrate material at an interface with the coating. A second elapsed time is measured from emission of the second pulse of light to reception of a reflection of the second pulse of light from an outer surface of the coating. A thickness of the coating is determined as a function of a difference between the first and second elapsed times.
    Type: Application
    Filed: August 19, 2009
    Publication date: February 24, 2011
    Inventors: David G. Sansom, David B. Allen, Anirudha Vaidya