Patents by Inventor Anthony Bonanno

Anthony Bonanno has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Measuring Diffractive Structures By Parameterizing Spectral Features
    Publication number: 20080049214
    Abstract: Structures are characterized by exposing a sample to optical radiation, measuring a spectrum associated with the exposure, detecting at least one characteristic parameter in the measured spectrum, and computing at least one structural parameter based on the at least one characteristic parameter.
    Type: Application
    Filed: August 28, 2007
    Publication date: February 28, 2008
    Inventors: Alexei Maznev, Carlos Duran, Michael Gostein, Alexander Mazurenko, Gregory Merklin, Peter Rosenthal, Anthony Bonanno