Patents by Inventor Anthony G. Klele

Anthony G. Klele has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • High-frequency test probe assembly for microcircuits and associated methods
    Patent number: 6489795
    Abstract: A test probe for microcircuits includes a unitary elongated electrically conductive arm. A rear end portion is for connecting to a test circuit; a front end portion is for contacting a circuit to be tested and has an upwardly extending tip. A rear central portion is positioned adjacent the rear end portion, and a front central portion between the rear central portion and the front end portion, which has a slot extending between the side surfaces. Typically the test probe is sandwiched in spaced relation between two ground probes having rear portions for connecting to ground, which are movably affixed to a retaining block having slots for holding the probes. The configuration of the signal probe, the probe slot, and the ground probe is dependent upon the spacing between the probes, the retainer block material, the frequency of the signal, and the impedance.
    Type: Grant
    Filed: May 18, 2001
    Date of Patent: December 3, 2002
    Inventors: Anthony G. Klele, Seymour S. Lenz, Sr.
  • HIGH-FREQUENCY TEST PROBE ASSEMBLY FOR MICROCIRCUITS AND ASSOCIATED METHODS
    Publication number: 20020171445
    Abstract: A test probe for microcircuits includes a unitary elongated electrically conductive arm. A rear end portion is for connecting to a test circuit; a front end portion is for contacting a circuit to be tested and has an upwardly extending tip. A rear central portion is positioned adjacent the rear end portion, and a front central portion between the rear central portion and the front end portion, which has a slot extending between the side surfaces. Typically the test probe is sandwiched in spaced relation between two ground probes having rear portions for connecting to ground, which are movably affixed to a retaining block having slots for holding the probes. The configuration of the signal probe, the probe slot, and the ground probe is dependent upon the spacing between the probes, the retainer block material, the frequency of the signal, and the impedance.
    Type: Application
    Filed: May 18, 2001
    Publication date: November 21, 2002
    Inventors: Anthony G. Klele, Seymour Lenz