Abstract: A programmable logic device (PLD) with a programmable logic core, block memory, and I/O circuitry has one or more blocks of standard-cell logic (SLBs) that are integrated into the PLD design to enable each SLB to be programmably connected to any one or more of the programmable core, the block memory, and/or the I/O circuitry. The addition of standard-cell-based functional blocks creates a PLD with increased overall logic density, a net smaller die size per function, lowered cost, and improvements to both power and performance characteristics relative to equivalent conventional PLDs, such as FPGAs.

Abstract: Antenna errors are corrected in an integrated circuit design utilizing spare gates distributed throughout the integrated circuit. An integrated circuit in accordance with the invention includes standard cells interspersed with spare gates. For example, the circuit may include one or more rows of spare gates arranged between groups of rows of standard cells, or islands of spare gates arranged between groups of rows of standard cells. A signal line of the integrated circuit having a detected antenna error associated therewith is coupled via one or more conductors associated with at least one metal layer of the integrated circuit to a diode or other antenna error control circuitry formed using at least one of the spare gates. The standard cells and spare gates are preferably placed in accordance with a placement operation of an automated place and route process of a standard cell computer-aided design (CAD) tool.

Abstract: A programmable logic device (PLD) with a programmable logic core, block memory, and I/O circuitry has one or more blocks of standard-cell logic (SLBs) that are integrated into the PLD design to enable each SLB to be programmably connected to any one or more of the programmable core, the block memory, and/or the I/O circuitry. The addition of standard-cell-based functional blocks creates a PLD with increased overall logic density, a net smaller die size per function, lowered cost, and improvements to both power and performance characteristics relative to equivalent conventional PLDs, such as FPGAs.

Abstract: An integrated circuit includes standard cells interspersed with islands of spare gates. The spare gates are arranged in multiple groups of spare gates, with each group of spare gates within a corresponding designated spare gate area of a standard cell portion of the integrated circuit. At least a given one of the groups of spare gates is arranged between first and second rows of the standard cells and includes one or more rows of spare gates. The spare gate islands may be distributed throughout the standard cell portion of the integrated circuit in a substantially uniform manner, for example, in accordance with a predetermined geometric pattern. The spare gates may be converted to active gates in conjunction with the automated place and route process using only conductors in one or more metal layers of the integrated circuit.

Abstract: Antenna errors are corrected in an integrated circuit design utilizing spare gates distributed throughout the integrated circuit. An integrated circuit in accordance with the invention includes standard cells interspersed with spare gates. For example, the circuit may include one or more rows of spare gates arranged between groups of rows of standard cells, or islands of spare gates arranged between groups of rows of standard cells. A signal line of the integrated circuit having a detected antenna error associated therewith is coupled via one or more conductors associated with at least one metal layer of the integrated circuit to a diode or other antenna error control circuitry formed using at least one of the spare gates. The standard cells and spare gates are preferably placed in accordance with a placement operation of an automated place and route process of a standard cell computer-aided design (CAD) tool.

Abstract: A programmable logic device (PLD) with a programmable logic core, block memory, and I/O circuitry has one or more blocks of standard-cell logic (SLBs) that are integrated into the PLD design to enable each SLB to be programmably connected to any one or more of the programmable core, the block memory, and/or the I/O circuitry. The addition of standard-cell-based functional blocks creates a PLD with increased overall logic density, a net smaller die size per function, lowered cost, and improvements to both power and performance characteristics relative to equivalent conventional PLDs, such as FPGAs.

Abstract: An integrated circuit includes standard cells interspersed with islands of spare gates. The spare gates are arranged in multiple groups of spare gates, with each group of spare gates within a corresponding designated spare gate area of a standard cell portion of the integrated circuit. At least a given one of the groups of spare gates is arranged between first and second rows of the standard cells and includes one or more rows of spare gates, with each row of spare gates including multiple base transistor structures arranged adjacent to one another along longitudinal dimensions of the structures. The standard cells and spare gates are preferably placed in accordance with a placement operation of an automated place and route process of a standard cell computer-aided design (CAD) tool. The spare gates may be implemented using a base transistor structure compatible with the standard cell CAD tool.

Abstract: Antenna errors are corrected in an integrated circuit design utilizing spare gates distributed throughout the integrated circuit. An integrated circuit in accordance with the invention includes standard cells interspersed with spare gates. For example, the circuit may include one or more rows of spare gates arranged between groups of rows of standard cells, or islands of spare gates arranged between groups of rows of standard cells. A signal line of the integrated circuit having a detected antenna error associated therewith is coupled via one or more conductors associated with at least one metal layer of the integrated circuit to a diode or other antenna error control circuitry formed using at least one of the spare gates. The standard cells and spare gates are preferably placed in accordance with a placement operation of an automated place and route process of a standard cell computer-aided design (CAD) tool.

Abstract: An integrated circuit includes standard cells interspersed with islands of spare gates. The spare gates are arranged in multiple groups of spare gates, with each group of spare gates within a corresponding designated spare gate area of a standard cell portion of the integrated circuit. At least a given one of the groups of spare gates is arranged between first and second rows of the standard cells and includes one or more rows of spare gates, with each row of spare gates including multiple base transistor structures arranged adjacent to one another along longitudinal dimensions of the structures. The standard cells and spare gates are preferably placed in accordance with a placement operation of an automated place and route process of a standard cell computer-aided design (CAD) tool. The spare gates may be implemented using a base transistor structure compatible with the standard cell CAD tool.