Abstract: Described embodiments provide for a semiconductor device comprising a core and one or more input/output (I/O) buffers surrounding the core. The I/O buffers are adapted to transfer signals associated with core circuitry of the core. The I/O buffers comprise I/O cells having a first orientation and I/O cells having a second orientation. Each I/O cell has a corresponding translator having low voltage transistors in a corresponding footprint. The low voltage transistors in the first orientation I/O cells have the first orientation, and the low voltage transistors in the second orientation I/O cells have the first orientation. The footprints of the first orientation I/O cells and the second orientation I/O cells are compatible with one another.

Abstract: A compensation circuit for compensating an output impedance of at least a first MOS device over PVT variations to which the first MOS device may be subjected includes a first current source generating a first current having a value which is substantially constant and a second current source generating a second current having a value which is programmable as a function of at least one control signal presented to the second current source. A comparator is connected to respective outputs of the first and second current sources and is operative to measure a difference between the respective values of the first and second currents and to generate an output signal indicative of relative magnitudes of the first current and the second current. A processor connected in a feedback arrangement between the comparator and the second current source receives the output signal generated by the comparator and generates the control signal for controlling the second current as a function of the output signal.

Abstract: A compensation circuit for compensating an output impedance of at least a first MOS device over PVT variations to which the first MOS device may be subjected includes a first current source generating a first current having a value which is substantially constant and a second current source generating a second current having a value which is programmable as a function of at least one control signal presented to the second current source. A comparator is connected to respective outputs of the first and second current sources and is operative to measure a difference between the respective values of the first and second currents and to generate an output signal indicative of relative magnitudes of the first current and the second current. A processor connected in a feedback arrangement between the comparator and the second current source receives the output signal generated by the comparator and generates the control signal for controlling the second current as a function of the output signal.

Abstract: A PUR circuit for generating a reset signal includes a first node for receiving a reference voltage and a second node for receiving a supply voltage that is referenced with respect to the reference voltage. The circuit further includes a voltage level detector coupled between the first node and a third node, the voltage level detector being configured to generate a first control signal at the third node. The voltage level detector includes a first transistor having a first threshold voltage associated therewith. A resistance element is coupled between the second node and the third node, the resistance element having a first resistance value associated therewith. The circuit also includes an inverter having an input coupled to the third node and having an output for generating a second control signal in response to the first control signal. The inverter includes a second transistor having a second threshold voltage associated therewith which is lower than the first threshold voltage.

Abstract: A voltage level translator circuit for translating an input signal referenced to a first voltage level to an output signal referenced to a second voltage level includes an input stage for receiving the input signal. The input stage includes at least one transistor device having a first threshold voltage associated therewith. The voltage level translator circuit further includes a latch circuit operative to store a signal representative of a logical state of the input signal. The latch circuit includes at least one transistor device having a second threshold voltage associated therewith, the second threshold voltage being greater than the first threshold voltage. A voltage clamp is operatively connected between the input stage and the latch circuit, the voltage clamp being configured to limit a voltage across the input stage based, at least in part, on a control signal presented thereto.