Patents by Inventor Antonius T. M. Van Gogh

Antonius T. M. Van Gogh has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8175690
    Abstract: An optical device for assessing optical depth in a sample illuminated by polarized radiation from a source include two radiation guides having their end portions arranged for capturing reflected radiation from the sample. A detector measures two polarizations of the reflected radiation, and two intensities of the reflected radiation in the two radiation guides, respectively. A processor is configured to calculate two pectral functions, which are indicative of single scattering events in the sample. The processor is further configured to calculate a measure of the correlation between the two spectral functions so as to assess whether the single scattering events originate from substantially the same optical depth within the sample. Thus, the causal relation between the two spectral functions can be used for assessing whether the single scattering events giving rise to the two spectral functions come from substantially the same optical depth within the sample.
    Type: Grant
    Filed: February 18, 2008
    Date of Patent: May 8, 2012
    Assignee: Koninklijke Philips Electronics N.V.
    Inventors: Bernardus H. W. Hendriks, Antonius T. M. Van Gogh, Hans Zou
  • Publication number: 20100113941
    Abstract: The present invention relates to an optical device for assessing optical depth (D) in a sample (100) illuminated by polarized radiation (20) from a source (10). A first and a second radiation guide have their end portions (3Oa?, 30b?) arranged for capturing reflected radiation (25a, 25b) from the sample. A detector (40) measures a first polarization (P1) and a second polarization (P—2) of the reflected radiation (25), and a first and a second intensity (II, 12) of the reflected radiation (25a, 25b) in the first (30a) and the second (30b) radiation guide, respectively. Processing means (60) then calculates a first (f) and a second (g) spectral function, both spectral functions (f, g) being indicative of single scattering events in the sample.
    Type: Application
    Filed: February 18, 2008
    Publication date: May 6, 2010
    Applicant: KONINKLIJKE PHILIPS ELECTRONICS N.V.
    Inventors: Bernardus H.W. Hendriks, Antonius T.M. Van Gogh, Hans Zou
  • Publication number: 20100068714
    Abstract: The invention relates to detection of target molecules in an assay, such as a bio-assay, and in particular to multi-variate detection of target molecules. A detector system is disclosed, the detection system comprising an optical guide element (16) for directing luminescence radiation (7) from an associated sample towards a multivariate element (8), the sample contains probe molecules that specifically binds to target molecules; a multivariate element (8) for spatially separating the luminescence radiation (7; 14; 15) to create a plurality of spectral patterns; and a detector (13) for detecting the intensity of a set of spectral patterns, so as to determine the presence of binding complexes between probe molecules and target molecules in the sample.
    Type: Application
    Filed: November 23, 2007
    Publication date: March 18, 2010
    Applicant: KONINKLIJKE PHILIPS ELECTRONICS N.V.
    Inventors: Maarten M.J.W. Van Herpen, Antonius T.M. Van Gogh
  • Publication number: 20100056927
    Abstract: A system (40) for diagnosis and staging of early stages of cancer in the tissue of a patient is provided. The system is configured to combine information from a Polarized Light Scattering Spectroscopy measurement (70) having a first probe depth, and a Differential Path Length Spectroscopy measurement (60) having a second probe depth, wherein the second probe depth is set larger than' the first probe depth. By comparing the results of the Polarized Light Scattering Spectroscopy and Differential Path Length Spectroscopy measurements early stages of cancer, such as dysplasia may be detected. Also hyperplasia, carcinoma in situ, and carcinoma may be detected. A computer-readable medium, method and use are also provided.
    Type: Application
    Filed: March 7, 2008
    Publication date: March 4, 2010
    Applicant: KONINKLIJKE PHILIPS ELECTRONICS N.V.
    Inventors: Antonius T.M. Van Gogh, Bernardus H.W. Hendriks, Hans Zou, Maarten M.J.W. Van Herpen