Abstract: A dashboard control system of a vehicle includes: one or more sensors positioned in the vehicle for generating sensor outputs; one or more control inputs located on at least one of the vehicle and a user device communicatively coupled to the vehicle; and a dashboard assembly positioned in the vehicle facing a rider of the vehicle, the dashboard assembly including at least one visor unit coupled with a rotatable display unit with at least one display face. The rotatable display unit includes at least one drive unit and at least one controller for controlling operation of at least one of the at least one visor unit and the rotatable display unit, based on the sensor outputs and the one or more control inputs.

Abstract: A multi-faceted dashboard assembly (107) of a vehicle with a visor assembly and a display assembly is disclosed. The visor assembly (106) slidably engages with a handle bar cover (101) of the vehicle. The display assembly (105) comprising at least one display face (105a, 105b) is accommodated in a cavity (101a) of the handle bar cover (101). The display assembly (105) is one of stationary and rotatable from 0 degrees to about 360 degrees.

Abstract: Systems and methods are disclosed for storing dynamic layer content in a design file. A design file is received having design data corresponding to a plurality of process layers. A geometric operation formula is also received. A processor generates a polygon having dynamic layer content that is formed by applying the geometric operation formula on two or more of the plurality of process layers. The updated design file is stored, the design file now having a polygon having dynamic layer content.

Abstract: Systems and methods are disclosed for storing dynamic layer content in a design file. A design file is received having design data corresponding to a plurality of process layers. A geometric operation formula is also received. A processor generates a polygon having dynamic layer content that is formed by applying the geometric operation formula on two or more of the plurality of process layers. The updated design file is stored, the design file now having a polygon having dynamic layer content.

Abstract: Methods and systems for detecting defects on a wafer are provided. One method includes determining characteristics of care areas for a wafer based on wafer patterns. Determining the characteristics includes determining locations of care areas, identifying at least one pattern of interest (POI) in the wafer patterns for each of the care areas, allowing any of the care areas to have a free-form shape, allowing the care areas to be larger than frame images and selecting two or more POIs for at least one of the care areas. The method also includes searching for POIs in images generated for the wafer using an inspection system. In addition, the method includes detecting defects on the wafer by determining positions of the care areas in the images and applying one or more defect detection methods to the images based on the positions of the care areas in the images.

Abstract: Methods and systems for detecting defects on a wafer are provided. One method includes determining characteristics of care areas for a wafer based on wafer patterns. Determining the characteristics includes determining locations of care areas, identifying at least one pattern of interest (POI) in the wafer patterns for each of the care areas, allowing any of the care areas to have a free-form shape, allowing the care areas to be larger than frame images and selecting two or more POIs for at least one of the care areas. The method also includes searching for POIs in images generated for the wafer using an inspection system. In addition, the method includes detecting defects on the wafer by determining positions of the care areas in the images and applying one or more defect detection methods to the images based on the positions of the care areas in the images.