Abstract: A spectrometer system (1) comprising an IR (infrared) spectrometer (2) and an IR microscope (3), wherein a sample (42) and a first detector (21; 31) are provided in the IR microscope (3), wherein the IR microscope (3) is designed such that during measurement, the sample (42) is imaged on the first detector (21; 31) via an intermediate focus (44), is characterized in that at least one second detector (24, 25; 33) is provided whose detector surface (26, 27; 34) extends parallel to the detector surface (22; 32) of the first detector (21; 31), the detector surface (26, 27; 34) of the at least one second detector (24, 25; 33) is at least 5 times larger than the detector surface (22; 32) of the first detector (21; 31), and the first (21; 31) and the at least one second detector (24, 25; 33) are disposed directly next to each other, wherein the detector surface (26, 27; 34) of the at least one second detector (24, 25; 33) largely surrounds the detector surface (22; 32) of the first detector (21, 31), and the first d

Abstract: The present invention relates to an FTIR spectrometer comprising a single-element detector to analyze a detector light beam emitted by a sample, with a unit to digitize the voltage available at the detector output and with a unit to process the digitized voltage. The single-element detector and the dedicated unit to digitize the detector voltage are located immediately adjacent to each other.

Abstract: A method for measuring a spectrum of a sample by means of an infrared spectrometer is described, the spectrometer comprising at least one component whose operating behavior is influenced by at least one operating parameter which, in the event of a change, changes the operating behavior of the at least one component and thereby influences the spectrum to be measured, the method comprising detecting the at least one operating parameter at least once during the measurement of the spectrum, reckoning back the operating behavior of the at least one component in a manner dependent on the detected operating parameter to a predetermined reference value of the operating parameter, and further conducting at least one of the following steps: measuring the spectrum on the basis of the predetermined reference value of the operating parameter, correcting the spectrum on the basis of the predetermined reference value of the operating parameter.

Abstract: The present invention relates to an FTIR spectrometer comprising a single-element detector to analyze a detector light beam emitted by a sample, with a unit to digitize the voltage available at the detector output and with a unit to process the digitized voltage. The single-element detector and the dedicated unit to digitize the detector voltage are located immediately adjacent to each other.

Abstract: A method for taking a spatially resolved spectrum, in particular an infrared (IR) spectrum, of a sample by means of a Fourier-transform (FT)-spectrometer, is described wherein light emitted by a light source is fed to an interferometer, directed onto the sample and detected by an array-detector, wherein a movable reflector of the interferometer is displaced over a distance s and the array-detector is read out at a number n of predetermined discrete way points s1, . . . , sn of the distance s, respectively. When the movable reflector is displaced over the distance s, the array-detector is first read out at respective non-adjacent way points sd separated by at least one respective intermediate way point si, and that the movable reflector is displaced over the distance s at least twice, wherein the array-detector is read out at the way points si upon a second or further repeated displacement over the distance s.

Abstract: A device for the optical spectroscopic examination of interior surfaces (2, 2′) of a body, e.g. of blood vessels (1), comprising an optical spectrometer and an endoscope (3) with a light guide for illuminating the surfaces, wherein at the proximal end of the light guide it is supplied with light and at the distal of the light guide the light can be launched to the surfaces to be examined, wherein at the distal end of this endoscope there is provided a device for receiving the light reflected by the surfaces to be examined, is characterized in that the distal end of the light guide is arranged within an inflatable balloon (4) with an elastic exterior, and that the light decoupled from the light guide and the light reflected by the surfaces to be examined to the receiving device penetrates in each case the exterior of the balloon. In this way, the light launched by the light guide and also the light directed to the surface to be examined and the light scattered by them, if e.g.

Abstract: The present invention relates to an FTIR spectrometer comprising a single-element detector to analyze a detector light beam emitted by a sample, with a unit to digitize the voltage available at the detector output and with a unit to process the digitized voltage. The single-element detector and the dedicated unit to digitize the detector voltage are located immediately adjacent to each other.

Abstract: The present invention relates to an imaging FTIR spectrometer comprising a housing with an integrated interferometer, sample and detector. The light of the source first passes through the interferometer, then it is focused on the sample which is imaged on the surface of a detector array. The present invention also provides an FTIR spectrometer with a detector array and ADCs integrated on the detector array chip such that each pixel has an individual dedicated ADC.

Abstract: A method for taking a spatially resolved spectrum, in particular an infrared (IR) spectrum, of a sample by means of a Fourier-transform (FT)-spectrometer, is described wherein light emitted by a light source is fed to an interferometer, directed onto the sample and detected by an array-detector, wherein a movable reflector of the interferometer is displaced over a distance s and the array-detector is read out at a number n of predetermined discrete way points s1, . . . , sn of the distance s, respectively. When the movable reflector is displaced over the distance s, the array-detector is first read out at respective non-adjacent way points sd separated by at least one respective intermediate way point si, and that the movable reflector is displaced over the distance s at least twice, wherein the array-detector is read out at the way points si upon a second or further repeated displacement over the distance s.

Abstract: A switchable infrared radiation method and device provides for optical analysis of a sample using a Fourier transform spectrometer for illumination thereof. A housing accommodates an optical delineation means mounted therein which transmits infrared radiation following interaction with the sample. The radiation is passed through an optical switch mounted in the housing having a first switching position and a second switching position for reflecting infrared radiation transmitted by the optical delineation means. A single element detector is mounted in the housing for detecting infrared radiation transmitted by the optical switch in its first switching position. An array detector is also mounted in the housing to accept radiation from the optical switch in the second switching position. The array detector comprises a plurality of pixel-like infrared sensors for two-dimensional detection of the radiation.

Abstract: A method for providing position sensitive information about an object has been described. This method is performed using an observation position and an observation direction in relation to the object and selecting information relevant for this observation position and observation direction from an information data bank and displaying this information. In this case, the observation position and observation direction are taken by a learning phase and a recognition phase.

Abstract: The invention concerns a method and a device for process control of reaction processes using Fourier transform infrared spectroscopy. In accordance with the invention, an interferogram is generated before or after interaction with the compositions. Subsequent thereto, the interferogram is inspected in segments for externally introduced intensity fluctuations. The intensity fluctuations are subjected to an analysis procedure involving integration, differentiation, or the like, and on the basis of this evaluation, a decision is made as to whether or not the interferogram has an acceptable degree of interfering signals. The interferogram is labeled with this evaluation result and the procedure is repeated a plurality of times. After a sufficient number of acceptable interferograms have been collected, the acceptable interferograms are summed and subjected to a Fourier transform process to extract the frequency dependence.

Abstract: A device for infrared (IR) spectroscopic investigation of internal surfaces of a body, for example of blood vessels, comprising an endoscope (10) with light guide means to illuminate the surfaces is characterized in that at the distal end of the light guide means there is arranged a detector (12) for detecting IR light scattered from the illuminated surface and transforming it into electric signals. For otherwise identical conditions, compared to comparable known devices, the device according to the invention offers a higher signal strength and thereby the possibility to shorten the measuring time for equal signal quality.

Abstract: The invention relates to a grazing angle microscope for spectroscopic applications. A novel light path having two shifting planar mirrors permits spectroscopic investigation of a sample area off the optical microscope axis at grazing angles as well as visual viewing at steeper angles of incidence of the light.

Abstract: An optical spectrometer (1) with an interferometer having a means for varying the optical path difference comprising a drive (8), and with a detector (6) for recording optical signals from the interferometer and converting them into electrical analog signals, wherein an analog-to-digital converter (ADC) (9) is connected to the detector (6) digitizing the electrical analog signals in a time-equidistant manner, is characterized in that the data acquisition electronics (17) are supplied by a switched power supply (14), the clock of which is derived from the same reference oscillator (16) as the clock of the signal digitization by the ADC (9). In contrast to known spectrometers with spatially equidistant sampling of the detector signal, the design of the spectrometer according to the invention is considerably cheaper and more compact with respect to its voltage supply elements. Galvanic separation of the data acquisition electronics and the electronic control unit of the linear drive is no longer required.

Abstract: In a self-supporting beam-splitter (1), in particular for use in an FTIR-spectrometer for the far-infrared region, with an optical thickness on the order of the interesting wavelength region, the foil beam-splitter (1) consists of an undoped semi-conducter material or carbon which is transparent in the far-infrared, and is preferentially made from thin silicon sheets or diamond foil in the thickness region between 2 .mu.m and 125 .mu.m. In this fashion, an extremely high efficiency for the beam-splitter is achieved, whereby little or no resonant absorption takes place due to the beam-splitter in the interesting wavelength region.

Abstract: In an analytic spectrometer (50) having a central computer (9), permanently installed and exchangeable components (5), such as a radiation source, a detector, a beam splitter, a filter, external measurement probes and the like, each of which exhibiting a readable data carrier (7) with encoded data of parameters characterizing the respective component (5), the data media (7) can be written to and contains changeable time dependent data concerning the history and/or the actual properties of the corresponding component (5) for example length of operation, performance deterioration parameters or calibration curves of the component (5). These data can be continuously adjusted by the central computer (9) to the current state of the component (5) so that the data medium (7) connected to the component (5) can immediately supply information concerning the current actual properties of the component (5) when installing the component (5) in another spectrometer.

Abstract: A method for routine identification of materials of plastic components with the assistance of infrared spectroscopy with which an infrared reflection spectrum is taken from the surface of a plastic component to be investigated and compared to a set of reference spectra, whereby the material of the plastic component under investigation is correlated to a class of plastic materials represented by one of the reference spectrum, is characterized in that the plastic component under investigation is positioned with the assistance of a video device (25, 26) and in that the infrared reflection spectrum is recorded in the range of the mid-infrared (MIR) in a wave length region between 400 and 4,000 cm.sup.-1. In this fashion even plastics which, for example, are filled with carbon can be routinely identified. It is preferred when the first derivative of the recorded IR spectrum with respect to wave number is taken and compared to the first derivative of the IR spectra of the reference spectra.

Abstract: The invention concerns an optical or infrared Fourier spectrometer with a plurality of entrances and exits for the coupling on of external sources or samples. The entrances can also be used as exits and vice versa.

Abstract: In a Raman microscope, in particular for a Fourier transform (FT) spectrometer with a lens for magnified imaging of a point-shaped region (1) on a surface of a measuring sample (2) and with a laser for irradiating laser radiation onto the point-shaped region (1), the laser radiation is in the infrared (IR), preferentially in the near-infrared (NIR) region and the lens is a Cassegrain mirror-lens (3, 4) with a convex mirror (3) arranged rotationally symmetrically to an optical axis (5) and with a concave mirror (4) which is likewise rotationally symmetric to the optical axis (5) of the lens, whereby the focal point of the concave mirror (4), lying on the optical axis (5), coincides with the point-shaped region (1) on the surface of the measuring sample (2). In this fashion distortion-free NIR Raman spectra can be taken with simple optical elements.