Abstract: Computer-implemented methods and systems described herein perform intelligent sampling of application traces generated by an application. Computer-implemented methods and systems determine different sampling rates based on frequency of occurrence of trace types and/or frequency of occurrence of durations of the traces. Each sampling rate corresponds to a different trace type and/or different duration. The sampling rates for low frequency trace types and durations are larger than the sampling rates for high frequency trace types and durations. The relatively larger sampling rates for low frequency trace types and low frequency durations ensures that low frequency trace types and low frequency durations are sampled in sufficient numbers and are not passed over during sampling of the application traces. The set of sampled traces are stored in a data storage device.

Abstract: A radiation detector for detecting ionizing radiation. The detector includes a semiconductor having at least two sides. A bias electrode is formed on one side of the semiconductor. A signal electrode is formed on a side of the semiconductor and is used to detect the energy level of the ionizing radiation. A third electrode (the control electrode) is also formed on the semiconductor. The control electrode shares charges induced by the ionizing radiation with the signal electrode, until the charge clouds are close to the signal electrode. The control electrode also alters the electric field within the semiconductor, such that the field guides the charge clouds toward the signal electrode when the clouds closely approach the signal electrode. As a result, trapping of charge carrying radiation (i.e., electrons or holes) is minimized, and low-energy tailing is virtually eliminated.