Patents by Inventor Ashuraj Sirohi

Ashuraj Sirohi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6862562
    Abstract: Computer method and apparatus determines state of physical properties, i.e. product quality, of a chemical manufacturing process. A steady state modeler provides a rigorous steady state model of the process and instantaneous state of physical properties. An estimator or inferential sensing member determines state of the physical properties over time based on the steady state (instantaneous) values of the physical properties. To that end, a dynamic model of the subject process is formed from the steady state model. The computer method and apparatus may be part of a network such that laboratory and sensor measured process data is made accessible by the steady state modeler and the estimator, and the estimator provides process parameter values for maintaining state of the physical properties. The network also enables online and user-interactive access to the steady state model, the dynamic model and/or the parameter values for enabling control of the subject process.
    Type: Grant
    Filed: October 4, 2000
    Date of Patent: March 1, 2005
    Assignee: Aspen Technology, Inc.
    Inventors: Steven Treiber, Ashuraj Sirohi, Subhash Ghorpade, Simon Lingard, Sundaram Ramanathan, Chau-Chyun Chen
  • Patent number: 6093211
    Abstract: A process simulator and modeling methodology employs instantaneous property measures. The instantaneous measures of various polymer properties are tracked throughout the subject polymer manufacturing system and used to calculate respective property distribution functions. For example, property distributions of composition, molecular weight, stereoregularity and long chain branching are calculated, tracked in time and location throughout the manufacturing system, and used to model the polymer manufacturing system and polymerization process performed by the system. More specifically, the present invention calculates full distribution of polymer properties from the instantaneous property measures and tracked instantaneous property distributions. This enables accurate and computationally efficient modeling of the polymerization process and manufacturing system for carrying out the same.
    Type: Grant
    Filed: April 9, 1998
    Date of Patent: July 25, 2000
    Assignee: Aspen Technology, Inc.
    Inventors: Alvin E. Hamielec, Martine Osias, Sundaram Ramanathan, Ashuraj Sirohi, Chau-Chyun Chen