Patents by Inventor Assaf Naor

Assaf Naor has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10313104
    Abstract: In some aspects, the disclosure is directed to methods and systems for controlling periodic jitter arising from a phase interpolator (PI). A receiver can receive incoming data. A fractional-N phase-locked loop (PLL) can receive a reference clock. Measurement circuitry can measure a parts per million (PPM) offset between the incoming data and the reference clock, of a PI. The fractional-N PLL can restrict jitter arising from the PI, to frequencies within a predefined bandwidth, by tuning a center frequency of the fractional-N PLL to reduce the PPM offset of the PI.
    Type: Grant
    Filed: September 18, 2017
    Date of Patent: June 4, 2019
    Assignee: Avago Technologies International Sales Pte. Limited
    Inventors: Amiad Dvir, Mike Rolfe Ferrara, Vitaly Zborovski, Mario Caresosa, Ryan Hirth, Assaf Naor
  • Patent number: 10305708
    Abstract: Methods, systems, and apparatuses are described for improving the signal integrity of a differential pair of signals by mitigating a non-balanced channel deficiency. For example, signal integrity may be improved by independently shaping and/or independently controlling the slopes (e.g., the rising edge and/or falling edge) of each signal of a differential pair of signals to counteract the effects caused by non-balanced deficiencies to provide a balanced differential pair of signals (i.e., signals having symmetrical impedances, loads, etc.).
    Type: Grant
    Filed: July 20, 2018
    Date of Patent: May 28, 2019
    Assignee: Avago Technologies International Sales Pte. Limited
    Inventors: Shwetabh Verma, Bhaskar Banerjee, Amiad Dvir, Assaf Naor
  • Publication number: 20190089520
    Abstract: In some aspects, the disclosure is directed to methods and systems for controlling periodic jitter arising from a phase interpolator (PI). A receiver can receive incoming data. A fractional-N phase-locked loop (PLL) can receive a reference clock. Measurement circuitry can measure a parts per million (PPM) offset between the incoming data and the reference clock, of a PI. The fractional-N PLL can restrict jitter arising from the PI, to frequencies within a predefined bandwidth, by tuning a center frequency of the fractional-N PLL to reduce the PPM offset of the PI.
    Type: Application
    Filed: September 18, 2017
    Publication date: March 21, 2019
    Applicant: Avago Technologies General IP (Singapore) Pte. Ltd.
    Inventors: Amiad Dvir, Mike Rolfe Ferrara, Vitaly Zborovski, Mario Caresosa, Ryan Hirth, Assaf Naor
  • Publication number: 20180331862
    Abstract: Methods, systems, and apparatuses are described for improving the signal integrity of a differential pair of signals by mitigating a non-balanced channel deficiency. For example, signal integrity may be improved by independently shaping and/or independently controlling the slopes (e.g., the rising edge and/or falling edge) of each signal of a differential pair of signals to counteract the effects caused by non-balanced deficiencies to provide a balanced differential pair of signals (i.e., signals having symmetrical impedances, loads, etc.).
    Type: Application
    Filed: July 20, 2018
    Publication date: November 15, 2018
    Inventors: Shwetabh VERMA, Bhaskar Banerjee, Amiad DVIR, Assaf NAOR
  • Patent number: 10033556
    Abstract: Methods, systems, and apparatuses are described for improving the signal integrity of a differential pair of signals by mitigating a non-balanced channel deficiency. For example, signal integrity may be improved by independently shaping and/or independently controlling the slopes (e.g., the rising edge and/or falling edge) of each signal of a differential pair of signals to counteract the effects caused by non-balanced deficiencies to provide a balanced differential pair of signals (i.e., signals having symmetrical impedances, loads, etc.).
    Type: Grant
    Filed: October 3, 2016
    Date of Patent: July 24, 2018
    Assignee: Avago Technologies General IP (Singapore) Pte. Ltd.
    Inventors: Shwetabh Verma, Bhaskar Banerjee, Amiad Dvir, Assaf Naor
  • Publication number: 20170104615
    Abstract: Methods, systems, and apparatuses are described for improving the signal integrity of a differential pair of signals by mitigating a non-balanced channel deficiency. For example, signal integrity may be improved by independently shaping and/or independently controlling the slopes (e.g., the rising edge and/or falling edge) of each signal of a differential pair of signals to counteract the effects caused by non-balanced deficiencies to provide a balanced differential pair of signals (i.e., signals having symmetrical impedances, loads, etc.).
    Type: Application
    Filed: October 3, 2016
    Publication date: April 13, 2017
    Inventors: Shwetabh Verma, Bhaskar Banerjee, Amiad Dvir, Assaf Naor
  • Patent number: 9118412
    Abstract: A system for performing in-band reflection analysis in a passive optical network. The system comprises an optical line terminal (OLT) that includes a transceiver for transmitting continuous downstream data modulated on a first wavelength and receiving upstream burst data modulated on a second wavelength, the OLT further includes a receiver for receiving signals reflected from the PON that are modulated on the first wavelength, wherein the continuous downstream data comprises user data and a test data pattern; and a reflection analysis unit for cross-correlating between a time-shifted version of the transmitted test data pattern and the reflected signals, wherein the test data pattern is time-shifted relatively for an optical location to be tested.
    Type: Grant
    Filed: September 27, 2011
    Date of Patent: August 25, 2015
    Assignee: Broadcom Corporation
    Inventors: Amiad Dvir, Assaf Naor
  • Publication number: 20130077975
    Abstract: A system for performing in-band reflection analysis in a passive optical network. The system comprises an optical line terminal (OLT) that includes a transceiver for transmitting continuous downstream data modulated on a first wavelength and receiving upstream burst data modulated on a second wavelength, the OLT further includes a receiver for receiving signals reflected from the PON that are modulated on the first wavelength, wherein the continuous downstream data comprises user data and a test data pattern; and a reflection analysis unit for cross-correlating between a time-shifted version of the transmitted test data pattern and the reflected signals, wherein the test data pattern is time-shifted relatively for an optical location to be tested.
    Type: Application
    Filed: September 27, 2011
    Publication date: March 28, 2013
    Applicant: BROADLIGHT, LTD.
    Inventors: Amiad Dvir, Assaf Naor