Patents by Inventor Atieh Aminian

Atieh Aminian has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • METHODS AND DEVICES FOR PREPARING SAMPLE FOR CRYOGENIC ELECTRON MICROSCOPY
    Publication number: 20210072170
    Abstract: Various methods and devices are provided for searching the optimum sample condition of a sample for cryogenic electron microscopy. Multiple samples with different sample conditions may be screened using a sample inspection device. The sample inspection device includes at least a chamber formed between a top electron transparent layer and a bottom electron transparent layer for holding the sample. Multiple pillars are arranged within the chamber. The sample inspection device includes a window covering at least one of the multiple pillars.
    Type: Application
    Filed: September 9, 2019
    Publication date: March 11, 2021
    Applicant: FEI Company
    Inventors: Bas HENDRIKSEN, Maarten KUIJPER, Luigi MELE, Pleun DONA, Erum RAJA, Atieh AMINIAN
  • Methods and devices for preparing sample for cryogenic electron microscopy
    Patent number: 10921268
    Abstract: Various methods and devices are provided for searching the optimum sample condition of a sample for cryogenic electron microscopy. Multiple samples with different sample conditions may be screened using a sample inspection device. The sample inspection device includes at least a chamber formed between a top electron transparent layer and a bottom electron transparent layer for holding the sample. Multiple pillars are arranged within the chamber. The sample inspection device includes a window covering at least one of the multiple pillars.
    Type: Grant
    Filed: September 9, 2019
    Date of Patent: February 16, 2021
    Assignee: FEI Company
    Inventors: Bas Hendriksen, Maarten Kuijper, Luigi Mele, Pleun Dona, Erum Raja, Atieh Aminian