Patents by Inventor Atsushi Hukushima

Atsushi Hukushima has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8172960
    Abstract: Provided is a tantalum sputtering target manufactured by working a molten and cast tantalum ingot or billet through forging, annealing and rolling, wherein the structure of the tantalum target comprises a non-recrystallized structure. The tantalum sputtering target having a high deposition speed and excellent uniformity of film, producing less arcings and particles and having excellent film forming properties, and the method capable of stably manufacturing the target can be provided by improving and devising plastic working steps such as forging and rolling, and the heat treatment step.
    Type: Grant
    Filed: February 19, 2004
    Date of Patent: May 8, 2012
    Assignee: JX Nippon Mining & Metals Corporation
    Inventors: Kunihiro Oda, Atsushi Hukushima
  • Patent number: 8029629
    Abstract: A sputtering target manufactured by die forging is provided. It is characterized in that an average crystal grain size D at a portion where an average crystal grain size is the largest and an average crystal grain size d at a portion where an average crystal grain size is the smallest are related as 1.0<D/d<2.0. Further provided is a method capable of constantly manufacturing a sputtering target excellent in characteristics by improving and elaborating forging and heat treatment processes to render a crystal size fine and uniform, and a sputtering target excellent in quality obtained by this method.
    Type: Grant
    Filed: November 13, 2009
    Date of Patent: October 4, 2011
    Assignee: JX Nippon Mining & Metals Corporation
    Inventor: Atsushi Hukushima
  • Publication number: 20100058827
    Abstract: A sputtering target manufactured by die forging is provided. It is characterized in that an average crystal grain size D at a portion where an average crystal grain size is the largest and an average crystal grain size d at a portion where an average crystal grain size is the smallest are related as 1.0<D/d<2.0. Further provided is a method capable of constantly manufacturing a sputtering target excellent in characteristics by improving and elaborating forging and heat treatment processes to render a crystal size fine and uniform, and a sputtering target excellent in quality obtained by this method.
    Type: Application
    Filed: November 13, 2009
    Publication date: March 11, 2010
    Applicant: NIPPON MINING & METALS CO., LTD.
    Inventor: Atsushi Hukushima
  • Publication number: 20070102288
    Abstract: Provided is a tantalum sputtering target manufactured by working a molten and cast tantalum ingot or billet through forging, annealing and rolling, wherein the structure of the tantalum target comprises a non-recrystallized structure. The tantalum sputtering target having a high deposition speed and excellent uniformity of film, producing less arcings and particles and having excellent film forming properties, and the method capable of stably manufacturing the target can be provided by improving and devising plastic working steps such as forging and rolling, and the heat treatment step.
    Type: Application
    Filed: February 19, 2004
    Publication date: May 10, 2007
    Applicant: Nikko Materials Co., Ltd
    Inventors: Kunihiro Oda, Atsushi Hukushima
  • Publication number: 20040245099
    Abstract: Provided is a sputtering target manufactured by die forging, characterized in that an average crystal grain size D at a portion where an average crystal grain size is the largest and an average crystal grain size d at a portion where an average crystal grain size is the smallest are related as 1.0<D/d<2.0. Further provided is a method capable of constantly manufacturing a sputtering target excellent in characteristics by improving and elaborating forging and heat treatment processes to render a crystal size fine and uniform, and a sputtering target excellent in quality obtained by this method.
    Type: Application
    Filed: April 12, 2004
    Publication date: December 9, 2004
    Inventor: Atsushi Hukushima