Abstract: A method of analyzing a biopsy sample containing tissue extracted from a prostate gland of a subject comprises measuring zinc level and an epithelial glandular tissue concentration in the sample, determining the likelihood that the sample is cancerous based on at least the zinc level and the epithelial glandular tissue concentration in the sample, and generating an output indicative of the likelihood.

Abstract: A method of analyzing a plurality of biopsy cores extracted from a plurality of respective biopsy locations in a prostate is disclosed. The method comprises: measuring a level of a chemical element in each of the biopsy cores, and generating a chemical element map of at least a portion of the prostate based on the levels and the respective biopsy locations. In some embodiments, the method determines at least one additional biopsy location for a future biopsy in the prostate.

Abstract: A method of analyzing a plurality of biopsy cores extracted from a plurality of respective biopsy locations in a prostate is disclosed. The method comprises: measuring a level of a chemical element in each of the biopsy cores, and generating a chemical element map of at least a portion of the prostate based on the levels and the respective biopsy locations. In some embodiments, the method determines at least one additional biopsy location for a future biopsy in the prostate.

Abstract: A method for production testing includes receiving a wafer including a semiconductor substrate and a non-conducting layer formed over the substrate, following etching of contact openings through the non-conducting layer to the substrate, the contact openings including an array of the contact openings arranged in a predefined test pattern in a test area on the wafer. An electron beam is directed to irradiate the test area, a specimen current flowing through the substrate responsive to the electron beam is measured. The specimen current is analyzed so as to assess a dimension of the contact openings.

Abstract: Apparatus for analysis of a thin film formed over an underlying layer on a surface of a sample, the thin film including first elements, while the underlying layer includes second elements. The apparatus includes an electron gun, which directs a beam of electrons to impinge on a point on the surface of the sample at which the thin film is formed. An electron detector receives Auger electrons emitted by the first and second elements responsive to the impinging beam of electrons, and to output a signal indicative of a distribution of energies of the emitted electrons. A controller receives the signal and analyzes the distribution of the energies so as to determine a composition of the first elements in the thin film and a thickness of the thin film.

Abstract: A method for production testing includes receiving a wafer including a semiconductor substrate and a non-conducting layer formed over the substrate, following etching of contact openings through the non-conducting layer to the substrate, the contact openings including an array of the contact openings arranged in a predefined test pattern in a test area on the wafer. An electron beam is directed to irradiate the test area, a specimen current flowing through the substrate responsive to the electron beam is measured. The specimen current is analyzed so as to assess a dimension of the contact openings.

Abstract: Apparatus for analysis of a thin film formed over an underlying layer on a surface of a sample, the thin film including first elements, while the underlying layer includes second elements. The apparatus includes an electron gun, which directs a beam of electrons to impinge on a point on the surface of the sample at which the thin film is formed. An electron detector receives Auger electrons emitted by the first and second elements responsive to the impinging beam of electrons, and to output a signal indicative of a distribution of energies of the emitted electrons. A controller receives the signal and analyzes the distribution of the energies so as to determine a composition of the first elements in the thin film and a thickness of the thin film.

Abstract: A multi-axes positioning system is described, such as used in X-Y plotters, including an X-carriage movable on a frame along the X-axis, a Y-carriage movable on the frame along the Y-axis, and a single closed loop trained over a plurality of guide wheels. Some of the guide wheels are located on the frame on opposite sides of both the X- and Y-carriages, and others are located on the carriages themselves, on opposite sides thereof, and are arranged such that the single closed loop can be used for positioning the object along either two or three axes, according to single-motor, two-motor, or three-motor modes of operation.

Abstract: A clamping-type article holder is described particularly useful for clamping test tubes in a conveyor system, the holder comprising a sleeve axially movable within a housing from a first position to a second position, and a plurality of balls carried by the housing and adapted to project through openings formed in one end of the sleeve for clamping the article when the sleeve is in the first position. The latter end of the sleeve is formed with a cam surface effective, upon axial movement of the sleeve to the second position, to withdraw the balls from the opening and thereby to release the article. The holder further includes an electro-magnet effective, when energized, to retain the sleeve in the article-releasing position, which electro-magnet is incapable, when the sleeve is in the article-clamping position, of moving the sleeve to the article-releasing position.