Abstract: The present disclosure is directed toward the simultaneous formation of a plurality of optical elements on a common substrate, where each optical element includes at least one layer having a desired non-uniform-thickness variation. Each such layer is formed such that it includes a plurality of material patterns characterized by the non-uniform thickness variation, where each material pattern is disposed on a different deposition site on the substrate. The material patterns are configured such that adjacent optical elements are separated by a boundary region for facilitating dicing of the substrate into individual optical elements. The non-uniform-thickness layer is formed by direct deposition through a shadow mask that includes a plurality of mask patterns that are either (1) configured to pass material flux in a non-uniform manner or (2) configured to shadow different portions of their respective deposition regions while being moved relative to the substrate.

Abstract: The present disclosure is directed toward measurement systems capable of optical analysis of a test sample. Embodiments in accordance with the present disclosure include a sample holder having a plurality of projections that extend from a planar surface, where the projections and planar surface collectively define an open sample-collection surface that enables an interrogation signal direct access to the test sample. The projections can be dimensioned and arranged to collectively define a geometric anti-reflection surface that is substantially non-reflective for the interrogation signal even at large angles of incidence. In some embodiments, the sample holder is configured as a reflective element that enables multiple passes of the interrogation signal through the test sample. In some embodiments, the sample holder is configured as a transmissive element. In some embodiments, the projections themselves are reflective.

Abstract: The present disclosure is directed toward a measurement system capable of rapid spectroscopic and calorimetric analysis of the chemical makeup of a test sample. Systems in accordance with the present disclosure include a low-thermal-mass sample holder having a substrate whose surface has been engineered to create a large-area sample-collection surface. The sample holder includes an integrated temperature controller that can rapidly heat or cool the test sample. As a result, the sample holder enables differential scanning calorimetry Fourier-Transform Infrared Spectroscopy (DSC-FTIR) that can be performed in minutes rather than hours, as required in the prior art.