Abstract: Systems and methods in which circuitry programmability is tested through observing a change in voltage on a circuit node that is affected by the programmability under test. For example, one or more particular circuit node may be identified at which some measurable change in voltage occurs upon a change in state of a programmable circuit under test (PCUT). Thus, by detecting a change in voltage at such a circuit node in association with a programmable state change, embodiments may determine that respective circuit programmability is functional. Test circuitry of embodiments provides for circuitry programmability testing, through observing a change in voltage on a circuit node that is affected by the programmability under test, suitable for testing digital programmability which is deeply embedded in analog circuitry.

Abstract: The present disclosure provides for an analog-to-digital converter (ADC) which selectively compresses an analog input signal to improve noise performance and dynamic input range. The ADC selectively scales an analog input signal when it is closer to an expected value of one or more signal metrics more than when it is further from the expected value of the one or more signal metrics. For example, during the conversion process, the ADC amplifies the analog input signal when it is closer to a mean value ? by a gain factor while selectively adjusting the gain factor when the analog input signal is further from its mean value ? to selectively compress the analog input signal. This selective compression improves input noise performance and dynamic input range of the ADC when compared to the conventional ADC.

Abstract: The present disclosure provides for an analog-to-digital converter (ADC) which selectively compresses an analog input signal to improve noise performance and dynamic input range. The ADC selectively scales an analog input signal when it is closer to an expected value of one or more signal metrics more than when it is further from the expected value of the one or more signal metrics. For example, during the conversion process, the ADC amplifies the analog input signal when it is closer to a mean value ? by a gain factor while selectively adjusting the gain factor when the analog input signal is further from its mean value ? to selectively compress the analog input signal. This selective compression improves input noise performance and dynamic input range of the ADC when compared to the conventional ADC.

Abstract: Systems and methods which implement a transconductor replica feedback (TRF) block in a transconductor circuit are shown. In accordance with embodiments, the TRF block comprises a feedback transistor disposed as a replica of a corresponding transconductance transistor of the transconductor circuit. The TRF block provides enhanced looking-in degeneration impedance for the transconductor circuit, thereby allowing for higher linearity and lower power at the same time. TRF transconductors of embodiments can be implemented in, or otherwise applied to, various different circuits such as LNAs, filters, etc.

Abstract: Systems and methods in which circuitry programmability is tested through observing a change in voltage on a circuit node that is affected by the programmability under test. For example, one or more particular circuit node may be identified at which some measurable change in voltage occurs upon a change in state of a programmable circuit under test (PCUT). Thus, by detecting a change in voltage at such a circuit node in association with a programmable state change, embodiments may determine that respective circuit programmability is functional. Test circuitry of embodiments provides for circuitry programmability testing, through observing a change in voltage on a circuit node that is affected by the programmability under test, suitable for testing digital programmability which is deeply embedded in analog circuitry.

Abstract: Systems and methods which implement a transconductor replica feedback (TRF) block in a transconductor circuit are shown. In accordance with embodiments, the TRF block comprises a feedback transistor disposed as a replica of a corresponding transconductance transistor of the transconductor circuit. The TRF block provides enhanced looking-in degeneration impedance for the transconductor circuit, thereby allowing for higher linearity and lower power at the same time. TRF transconductors of embodiments can be implemented in, or otherwise applied to, various different circuits such as LNAs, filters, etc.

Abstract: A stage of a pipelined ADC used as a sub-ADC in a time-interleaved ADC is operated using a first set of clock signals, with a next stage being operated using a second set of clock signals. The first set and second set of clock signals are designed to cause the start of hold phases of the stage to occur earlier than the sample phases of the next stage. In an embodiment, the start of the hold phases is coincident with the end of an immediately preceding sample phase of the stage. As a result, more time is provided for the output of an amplifier used in the stage to settle to a final value, thus permitting use of a low speed amplifier and reduction in power consumption in the interleaved ADC. In an embodiment, the stage corresponds to an earliest stage in the pipelined sub-ADC.

Abstract: A stage of a pipelined ADC used as a sub-ADC in a time-interleaved ADC is operated using a first set of clock signals, with a next stage being operated using a second set of clock signals. The first set and second set of clock signals are designed to cause the start of hold phases of the stage to occur earlier than the sample phases of the next stage. In an embodiment, the start of the hold phases is coincident with the end of an immediately preceding sample phase of the stage. As a result, more time is provided for the output of an amplifier used in the stage to settle to a final value, thus permitting use of a low speed amplifier and reduction in power consumption in the interleaved ADC. In an embodiment, the stage corresponds to an earliest stage in the pipelined sub-ADC.