Patents by Inventor Bak Leng LIM

Bak Leng LIM has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11650167
    Abstract: A defect inspection system provides an image of a surface of a hard drive media to a machine learning model that is trained to identify predefined classifications of abnormal surface patterns on the hard drive media, each of the predefined classifications being associated in system memory with a severity indicator. The defect inspection model analyzes the image and generates and output indicating that the image includes a pattern consistent with a select classification of the predefined classifications of abnormal surface patterns. When the severity indicator for the select classification satisfies a failure condition, the defect inspection system automatically implements a corrective action.
    Type: Grant
    Filed: December 17, 2020
    Date of Patent: May 16, 2023
    Assignee: SEAGATE TECHNOLOGY LLC
    Inventors: Yen Eng Fam, Jun Lee Kok, Bak Leng Lim, Yen Ling Lim
  • Publication number: 20220196571
    Abstract: A defect inspection system provides an image of a surface of a hard drive media to a machine learning model that is trained to identify predefined classifications of abnormal surface patterns on the hard drive media, each of the predefined classifications being associated in system memory with a severity indicator. The defect inspection model analyzes the image and generates and output indicating that the image includes a pattern consistent with a select classification of the predefined classifications of abnormal surface patterns. When the severity indicator for the select classification satisfies a failure condition, the defect inspection system automatically implements a corrective action.
    Type: Application
    Filed: December 17, 2020
    Publication date: June 23, 2022
    Inventors: Yen Eng FAM, Jun Lee KOK, Bak Leng LIM, Yen Ling LIM