Patents by Inventor Barry Eppler

Barry Eppler has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9231491
    Abstract: In an embodiment, a compact factory assembled and tested cabinet-based Direct Current (DC) power system includes at least one Alternating Current (AC) to DC converter disposed in a cabinet as at least one interchangeable module. An AC input section is also disposed in the cabinet and supplies AC power to the converter(s). At least one other electrical component is disposed in the cabinet, possibly as a module and it receives DC power from the converter(s). Other embodiments are also disclosed.
    Type: Grant
    Filed: December 6, 2013
    Date of Patent: January 5, 2016
    Assignee: Stored Energy Systems
    Inventors: Michael A. Benson, Jeffrey L. Chilson, Jack Strandquist, William F. Kaewert, Barry Eppler
  • Publication number: 20140160686
    Abstract: In an embodiment, a compact factory assembled and tested cabinet-based Direct Current (DC) power system includes at least one Alternating Current (AC) to DC converter disposed in a cabinet as at least one interchangeable module. An AC input section is also disposed in the cabinet and supplies AC power to the converter(s). At least one other electrical component is disposed in the cabinet, possibly as a module and it receives DC power from the converter(s). Other embodiments are also disclosed.
    Type: Application
    Filed: December 6, 2013
    Publication date: June 12, 2014
    Inventors: Michael A. Benson, Jeffrey L. Chilson, Jack Strandquist, William F. Kaewert, Barry Eppler
  • Patent number: 6977985
    Abstract: An x-ray laminography imaging system and a positioning system to be used therewith. The positioning system is configured to move the object in the X, Y and Z-directions (i.e., pitch and roll) to ensure that the object planes of the object that are being imaged are at least substantially parallel to the focal plane of the imaging system. The object is positioned so that object planes associated with the X, Y and Z-coordinates of points along the contour of the surface of the object are at least substantially parallel to the focal plane of the imaging system during imaging of the object plane. Because some objects, such as printed circuit boards, for example, are sometimes warped, by ensuring that the object plane being imaged is at least substantially parallel to the focal plane of the imaging system, precise laminographs are obtained.
    Type: Grant
    Filed: December 17, 2002
    Date of Patent: December 20, 2005
    Assignee: Agilent Technologies, Inc.
    Inventors: David D Bohn, Donald R Nohavec, Barry Eppler
  • Patent number: 6965662
    Abstract: An x-ray laminography imaging system that utilizes a nonplanar anode target to enable objects that are oblique to the direction of projection of electron beams onto the target to be precisely imaged. Because many objects that laminography techniques are used to inspect are oblique or have portions that are oblique, the nonplanar anode target of the present invention enables enables spot patterns to be traced that are parallel to the plane of the object, regardless of whether it is oblique or orthogonal.
    Type: Grant
    Filed: December 17, 2002
    Date of Patent: November 15, 2005
    Assignee: Agilent Technologies, Inc.
    Inventors: Barry Eppler, Ronald K Kerschner
  • Patent number: 6819739
    Abstract: An x-ray laminography imaging system and an apparatus and method for calibrating the system. The x-ray laminography imaging system utilizes a stationary x-ray source and generates a moving pattern of x-ray spots on a target anode synchronously with rotation of an x-ray detector to reduce or eliminate the need to move an object being imaged. The present invention provides an apparatus and a method for calibrating the system based in part on empirical data gathered during physical calibration and in part on data analytically derived from the empirical data. Because calibration of the system can be performed in great part analytically rather than relying entirely on empirically generated data, the calibration process can be performed very quickly.
    Type: Grant
    Filed: November 27, 2002
    Date of Patent: November 16, 2004
    Assignee: Agilent Technologies, Inc.
    Inventor: Barry Eppler
  • Publication number: 20040114712
    Abstract: An x-ray laminography imaging system that utilizes a nonplanar anode target to enable objects that are oblique to the direction of projection of electron beams onto the target to be precisely imaged. Because many objects that laminography techniques are used to inspect are oblique or have portions that are oblique, the nonplanar anode target of the present invention enables enables spot patterns to be traced that are parallel to the plane of the object, regardless of whether it is oblique or orthogonal.
    Type: Application
    Filed: December 17, 2002
    Publication date: June 17, 2004
    Inventors: Barry Eppler, Ronald K. Kerschner
  • Publication number: 20040114713
    Abstract: An x-ray laminography imaging system and a positioning system to be used therewith. The positioning system is configured to move the object in the X, Y and Z-directions (i.e., pitch and roll) to ensure that the object planes of the object that are being imaged are at least substantially parallel to the focal plane of the imaging system. The object is positioned so that object planes associated with the X, Y and Z-coordinates of points along the contour of the surface of the object are at least substantially parallel to the focal plane of the imaging system during imaging of the object plane. Because some objects, such as printed circuit boards, for example, are sometimes warped, by ensuring that the object plane being imaged is at least substantially parallel to the focal plane of the imaging system, precise laminographs are obtained.
    Type: Application
    Filed: December 17, 2002
    Publication date: June 17, 2004
    Inventors: David D. Bohn, Donald R. Nohavec, Barry Eppler
  • Publication number: 20040101110
    Abstract: An x-ray laminography imaging system and an apparatus and method for calibrating the system. The x-ray laminography imaging system utilizes a stationary x-ray source and generates a moving pattern of x-ray spots on a target anode synchronously with rotation of an x-ray detector to reduce or eliminate the need to move an object being imaged. The present invention provides an apparatus and a method for calibrating the system based in part on empirical data gathered during physical calibration and in part on data analytically derived from the empirical data. Because calibration of the system can be performed in great part analytically rather than relying entirely on empirically generated data, the calibration process can be performed very quickly.
    Type: Application
    Filed: November 27, 2002
    Publication date: May 27, 2004
    Inventor: Barry Eppler
  • Patent number: 6628746
    Abstract: A image-based system for inspecting objects utilizes an imaging chain that defines a focal plane, a manipulator for translating and rotating either the object under inspection or the imaging chain, a surface mapping system that generates a representation of the surface of the object under inspection, and a controller that uses the representation of the surface of the object to control the manipulator so that a portion of the object under inspection lies within the focal plane of the imaging chain.
    Type: Grant
    Filed: October 30, 2001
    Date of Patent: September 30, 2003
    Assignee: Agilent Technologies, Inc.
    Inventors: Barry Eppler, Ronald K Kerschner, Martin C. Shipley
  • Publication number: 20030081717
    Abstract: A image-based system for inspecting objects utilizes an imaging chain that defines a focal plane, a manipulator for translating and rotating either the object under inspection or the imaging chain, a surface mapping system that generates a representation of the surface of the object under inspection, and a controller that uses the representation of the surface of the object to control the manipulator so that a portion of the object under inspection lies within the focal plane of the imaging chain.
    Type: Application
    Filed: October 30, 2001
    Publication date: May 1, 2003
    Inventors: Barry Eppler, Ronald K. Kerschner, Martin C. Shipley