Patents by Inventor Bas Hendriksen

Bas Hendriksen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Laser-based phase plate image contrast manipulation
    Patent number: 11101101
    Abstract: Methods and systems for implementing laser-based phase plate image contrast enhancement are disclosed herein. An example method at least includes forming at least one optical peak in a diffraction plane of an electron microscope, and directing an electron beam through the at least one optical peak at a first location, where the first location determines an amount of phase manipulation the optical peak imparts to an electron of the electron beam.
    Type: Grant
    Filed: April 22, 2020
    Date of Patent: August 24, 2021
    Assignee: FEI Company
    Inventors: Bart Buijsse, Bas Hendriksen, Pleun Dona
  • METHODS AND DEVICES FOR PREPARING SAMPLE FOR CRYOGENIC ELECTRON MICROSCOPY
    Publication number: 20210072170
    Abstract: Various methods and devices are provided for searching the optimum sample condition of a sample for cryogenic electron microscopy. Multiple samples with different sample conditions may be screened using a sample inspection device. The sample inspection device includes at least a chamber formed between a top electron transparent layer and a bottom electron transparent layer for holding the sample. Multiple pillars are arranged within the chamber. The sample inspection device includes a window covering at least one of the multiple pillars.
    Type: Application
    Filed: September 9, 2019
    Publication date: March 11, 2021
    Applicant: FEI Company
    Inventors: Bas HENDRIKSEN, Maarten KUIJPER, Luigi MELE, Pleun DONA, Erum RAJA, Atieh AMINIAN
  • Methods and devices for preparing sample for cryogenic electron microscopy
    Patent number: 10921268
    Abstract: Various methods and devices are provided for searching the optimum sample condition of a sample for cryogenic electron microscopy. Multiple samples with different sample conditions may be screened using a sample inspection device. The sample inspection device includes at least a chamber formed between a top electron transparent layer and a bottom electron transparent layer for holding the sample. Multiple pillars are arranged within the chamber. The sample inspection device includes a window covering at least one of the multiple pillars.
    Type: Grant
    Filed: September 9, 2019
    Date of Patent: February 16, 2021
    Assignee: FEI Company
    Inventors: Bas Hendriksen, Maarten Kuijper, Luigi Mele, Pleun Dona, Erum Raja, Atieh Aminian
  • LASER-BASED PHASE PLATE IMAGE CONTRAST MANIPULATION
    Publication number: 20200365366
    Abstract: Methods and systems for implementing laser-based phase plate image contrast enhancement are disclosed herein. An example method at least includes forming at least one optical peak in a diffraction plane of an electron microscope, and directing an electron beam through the at least one optical peak at a first location, where the first location determines an amount of phase manipulation the optical peak imparts to an electron of the electron beam.
    Type: Application
    Filed: April 22, 2020
    Publication date: November 19, 2020
    Applicant: FEI Company
    Inventors: Bart Buijsse, Bas Hendriksen, Pleun Dona