Patents by Inventor Ben Li Chen

Ben Li Chen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9893878
    Abstract: Embodiments include systems and methods for on-chip random jitter (RJ) measurement in a clocking circuit (e.g., in a phase-locked loop of a serializer/deserializer circuit). Some embodiments determine a reference delay code sweep window to capture at least a candidate RJ range of a feedback clock signal, the reference delay code sweep window comprising a sequence of reference delay codes. A distribution of one-scores can be computed over the reference delay code sweep window, so that the distribution indicates a relatively likelihood, for each reference delay code, of obtaining a ‘1’ sample when sampling the feedback clock signal according to the delayed clock signal (delayed by an amount according to the reference delay code). The distribution can be transformed into a time domain by computing code offset times for the reference delay codes. A RJ output can be computed as a function of the distribution in the time domain.
    Type: Grant
    Filed: March 15, 2017
    Date of Patent: February 13, 2018
    Assignee: ORACLE INTERNATIONAL CORPORATION
    Inventors: Long Kong, Ben Li Chen, Philip Kwan, Zuxu Qin, Dawei Huang
  • Patent number: 9832013
    Abstract: Embodiments include systems and methods for detecting and correcting phased clock error (PCE) in phased clock circuits (e.g., in context of serializer/deserializer (SERDES) transmission (TX) clock circuits). For example, phased input clock signals can be converted into unit interval (UI) clocks, which can be combined to form an output clock signal. PCE in the output clock signal can be detected by digitally sampling the UI clocks to characterize their respective clock pulse widths, and comparing the respective clock pulse widths (i.e., PCE in the output clock signal can result from pulse width differences in UI clocks). Delay can be applied to one or more UI clock generation paths to shift UI clock pulse transitions, thereby adjusting output clock pulse widths to correct for the detected PCE. Approaches described herein can achieve PCE detection over a wide error range and can achieve error correction with small resolution.
    Type: Grant
    Filed: February 1, 2016
    Date of Patent: November 28, 2017
    Assignee: ORACLE INTERNATIONAL CORPORATION
    Inventors: Ben Li Chen, Zuxu Qin, Nima Edelkhani
  • Publication number: 20170222796
    Abstract: Embodiments include systems and methods for detecting and correcting phased clock error (PCE) in phased clock circuits (e.g., in context of serializer/deserializer (SERDES) transmission (TX) clock circuits). For example, phased input clock signals can be converted into unit interval (UI) clocks, which can be combined to form an output clock signal. PCE in the output clock signal can be detected by digitally sampling the UI clocks to characterize their respective clock pulse widths, and comparing the respective clock pulse widths (i.e., PCE in the output clock signal can result from pulse width differences in UI clocks). Delay can be applied to one or more UI clock generation paths to shift UI clock pulse transitions, thereby adjusting output clock pulse widths to correct for the detected PCE. Approaches described herein can achieve PCE detection over a wide error range and can achieve error correction with small resolution.
    Type: Application
    Filed: February 1, 2016
    Publication date: August 3, 2017
    Inventors: Ben Li Chen, Zuxu Qin, Nima Edelkhani