Patents by Inventor Ben Norris
Ben Norris has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10072982Abstract: An apparatus for optically analyzing a sample may include an imaging subsystem that images the sample, one or more analyzing subsystems that analyze the sample, a temperature control subsystem that controls a temperature of the atmosphere within the apparatus, a gas control subsystem that controls a composition of the atmosphere within the apparatus, and a control module that controls the various subsystems of the apparatus.Type: GrantFiled: December 23, 2016Date of Patent: September 11, 2018Assignee: BIOTEK INSTRUMENTS, INC.Inventors: Oleg Zimenkov, Xavier Amouretti, Michael Kontorovich, Ben Norris, Richard N. Sears, Dan J. Venditti, Jr., Christopher Many, Bill Anderson, Ben Knight, James Piette, Ross Piette, Joe Tobey, Brian Ferris
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Patent number: 10025084Abstract: Optimized automatic focusing of a microscope objective based on a cross correlation between a representative focus metric scan and a focus metric scan of a sample to be imaged.Type: GrantFiled: October 8, 2015Date of Patent: July 17, 2018Assignee: BIOTEK INSTRUMENTS, INC.Inventors: Ben Norris, Ben Knight, James Piette, Joe Tobey, Eddy Delpierre
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Patent number: 9772540Abstract: Non-image based autofocusing in an imaging system including an autofocus light source on a movable carriage variably positioned with offset in parallel to an optical axis of an objective.Type: GrantFiled: July 11, 2016Date of Patent: September 26, 2017Assignee: BIO-TEK INSTRUMENTS, INC.Inventors: Ben Norris, James Piette, Benjamin Knight, Ross Piette, G. Gerard Gormley, Oleg Zimenkov
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Publication number: 20170108438Abstract: An apparatus for optically analyzing a sample may include an imaging subsystem that images the sample, one or more analyzing subsystems that analyze the sample, a temperature control subsystem that controls a temperature of the atmosphere within the apparatus, a gas control subsystem that controls a composition of the atmosphere within the apparatus, and a control module that controls the various subsystems of the apparatus.Type: ApplicationFiled: December 23, 2016Publication date: April 20, 2017Applicant: BTI HOLDINGS, INC.Inventors: Oleg ZIMENKOV, Xavier AMOURETTI, Michael KONTOROVICH, Ben NORRIS, Richard N. SEARS, Dan J. VENDITTI, JR., Christopher MANY, Bill ANDERSON, Ben KNIGHT, James PIETTE, Ross PIETTE, Joe TOBEY, Brian FERRIS
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Patent number: 9557217Abstract: An apparatus for optically analyzing a sample may include an imaging subsystem that images the sample, one or more analyzing subsystems that analyze the sample, a temperature control subsystem that controls a temperature of the atmosphere within the apparatus, a gas control subsystem that controls a composition of the atmosphere within the apparatus, and a control module that controls the various subsystems of the apparatus.Type: GrantFiled: May 31, 2012Date of Patent: January 31, 2017Assignee: BTI HOLDINGS, INC.Inventors: Oleg Zimenkov, Xavier Amouretti, Michael Kontorovich, Ben Norris, Richard N. Sears, Dan J. Venditti, Jr., Christopher Many, Bill Anderson, Ben Knight, James Piette, Ross Piette, Joe Tobey, Brian Ferris
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Publication number: 20170013186Abstract: Non-image based autofocusing in an imaging system including an autofocus light source on a movable carriage variably positioned with offset in parallel to an optical axis of an objective.Type: ApplicationFiled: July 11, 2016Publication date: January 12, 2017Applicant: BIO-TEK INSTRUMENTS, INC.Inventors: Ben NORRIS, James PIETTE, Benjamin KNIGHT, Ross PIETTE, G. Gerard GORMLEY, Oleg ZIMENKOV
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Publication number: 20160131887Abstract: Optimized automatic focusing of a microscope objective based on a cross correlation between a representative focus metric scan and a focus metric scan of a sample to be imaged.Type: ApplicationFiled: October 8, 2015Publication date: May 12, 2016Applicant: BIOTEK INSTRUMENTS, INC.Inventors: Ben NORRIS, Ben KNIGHT, James PIETTE, Joe TOBEY, Eddy DELPIERRE
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Publication number: 20120300194Abstract: An apparatus for optically analyzing a sample may include an imaging subsystem that images the sample, one or more analyzing subsystems that analyze the sample, a temperature control subsystem that controls a temperature of the atmosphere within the apparatus, a gas control subsystem that controls a composition of the atmosphere within the apparatus, and a control module that controls the various subsystems of the apparatus.Type: ApplicationFiled: May 31, 2012Publication date: November 29, 2012Applicant: BTI HOLDINGS, INC.Inventors: Oleg ZIMENKOV, Xavier AMOURETTI, Michael KONTOROVICH, Ben NORRIS, Richard N. SEARS, Dan J. VENDITTI, JR., Christopher MANY, Bill Anderson, Ben Knight, James Piette, Ross Piette, Joe Tobey, Brian Ferris
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Patent number: 8218141Abstract: An apparatus and a method for optically analyzing a sample are provided. The apparatus includes a first optical device that transmits a narrow waveband of light and has a first filter and a first monochromator that provide different paths for the narrow waveband of the light. The apparatus may also include a light source that generates the light as broadband excitation light, in which case the first optical device transmits a narrow waveband of the broadband excitation light through the first filter or the first monochromator. Further, the apparatus may include a second optical device that directs the narrow waveband of the broadband excitation light onto the sample and receives emission light from the sample, a third optical device that transmits a narrow waveband of the emission light, and a detector that converts the narrow waveband of the emission light into an electrical signal.Type: GrantFiled: July 19, 2010Date of Patent: July 10, 2012Assignee: BTI Holdings, Inc.Inventors: Oleg Zimenkov, Xavier Amouretti, Robert M. Gifford, Mark R. Kennedy, Michael Kontorovich, Ben Norris, Richard N. Sears, Dan Venditti, Christopher Many
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Publication number: 20100277725Abstract: An apparatus and a method for optically analyzing a sample are provided. The apparatus includes a first optical device that transmits a narrow waveband of light and has a first filter and a first monochromator that provide different paths for the narrow waveband of the light. The apparatus may also include a light source that generates the light as broadband excitation light, in which case the first optical device transmits a narrow waveband of the broadband excitation light through the first filter or the first monochromator. Further, the apparatus may include a second optical device that directs the narrow waveband of the broadband excitation light onto the sample and receives emission light from the sample, a third optical device that transmits a narrow waveband of the emission light, and a detector that converts the narrow waveband of the emission light into an electrical signal.Type: ApplicationFiled: July 19, 2010Publication date: November 4, 2010Inventors: Oleg Zimenkov, Xavier Amouretti, Robert M. Gifford, Mark R. Kennedy, Michael Kontorovich, Ben Norris, Richard N. Sears, Dan Venditti, Christopher Many
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Patent number: 7782454Abstract: An apparatus and a method for optically analyzing a sample are provided. The apparatus includes a first optical device that transmits a narrow waveband of light and has a first filter and a first monochromator that provide different paths for the narrow waveband of the light. The apparatus may also include a light source that generates the light as broadband excitation light, in which case the first optical device transmits a narrow waveband of the broadband excitation light through the first filter or the first monochromator. Further, the apparatus may include a second optical device that directs the narrow waveband of the broadband excitation light onto the sample and receives emission light from the sample, a third optical device that transmits a narrow waveband of the emission light, and a detector that converts the narrow waveband of the emission light into an electrical signal.Type: GrantFiled: May 25, 2007Date of Patent: August 24, 2010Assignee: BTI Holdings, Inc.Inventors: Oleg Zimenkov, Xavier Amouretti, Robert M. Gifford, Mark R. Kennedy, Michael Kontorovich, Ben Norris, Richard N. Sears, Dan Venditti, Christopher Many
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Publication number: 20080250068Abstract: A method of preparing customised reports from source data comprises: retrieving a report definition from a first database; loading the retrieved report definition into a report-generating means, wherein the report-generating means is independent of said first database; retrieving source data from a second database into said report-generating means as specified by said report definition; and performing operations on said retrieved source data to produce a report in accordance with the report definition.Type: ApplicationFiled: June 5, 2007Publication date: October 9, 2008Applicant: EXCEL WIZARDS LTD.Inventors: SIMON JOHN MARTYN, BEN NORRIS
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Publication number: 20080191149Abstract: An apparatus and a method for optically analyzing a sample are provided. The apparatus includes a first optical device that transmits a narrow waveband of light and has a first filter and a first monochromator that provide different paths for the narrow waveband of the light. The apparatus may also include a light source that generates the light as broadband excitation light, in which case the first optical device transmits a narrow waveband of the broadband excitation light through the first filter or the first monochromator. Further, the apparatus may include a second optical device that directs the narrow waveband of the broadband excitation light onto the sample and receives emission light from the sample, a third optical device that transmits a narrow waveband of the emission light, and a detector that converts the narrow waveband of the emission light into an electrical signal.Type: ApplicationFiled: May 25, 2007Publication date: August 14, 2008Inventors: Oleg Zimenkov, Xavier Amouretti, Robert M. Gifford, Mark R. Kennedy, Michael Kontorovich, Ben Norris, Richard N. Sears, Dan Venditti, Christopher Many