Abstract: A sorting or classifying apparatus comprising an illumination device for providing illumination or foreground illumination, the illumination device comprising a reflector (61) which has a reflecting surface (63) providing a reflection envelope, a first light source (70) which is disposed in spaced relation in front of the reflecting surface (63) and provides light of a first spectral output to the reflecting surface (63) for reflection thereby and which first light source (70) comprises a plurality of light elements or incandescent lamps (72), wherein the light elements or lamps (72) are disposed on or near a focal axis (X) of the reflector (61), and a second light source (71) which is disposed in spaced relation in front of the reflecting surface (63) and provides light of a second spectral output, different to the first spectral output to the reflecting surface (63) for reflection thereby and which second light source (71) comprises a plurality of light elements or light-emitting diodes (LEDs) (75) arranged

Abstract: An inspection apparatus for inspecting a flow of particulate material, comprising: a background reflector (105) adjacent which in use falls a flow of particulate material (F); and a lighting unit (107) for illuminating an elongate viewing field (VF) across the background reflector (105), the viewing field (VF) having a first width (w1); wherein the lighting unit (107) comprises a fixed, non-scanning light source (115), and the light source (115) is formed of one or more light elements (120) which define a second width (w2) which is shorter than the first width (w1) of the viewing field (VF).

Abstract: A sorting or classifying apparatus comprising an illumination device for providing illumination or foreground illumination, the illumination device comprising a reflector (61) which has a reflecting surface (63) providing a reflection envelope, a first light source (70) which is disposed in spaced relation in front of the reflecting surface (63) and provides light of a first spectral output to the reflecting surface (63) for reflection thereby and which first light source (70) comprises a plurality of light elements or incandescent lamps (72), wherein the light elements or lamps (72) are disposed on or near a focal axis (X) of the reflector (61), and a second light source (71) which is disposed in spaced relation in front of the reflecting surface (63) and provides light of a second spectral output, different to the first spectral output to the reflecting surface (63) for reflection thereby and which second light source (71) comprises a plurality of light elements or light-emitting diodes (LEDs) (75) arranged

Abstract: An inspection apparatus for inspecting a flow of particulate material, comprising: a background reflector (105) adjacent which in use falls a flow of particulate material (F); and a lighting unit (107) for illuminating an elongate viewing field (VF) across the background reflector (105), the viewing field (VF) having a first width (w1); wherein the lighting unit (107) comprises a fixed, non-scanning light source (115), and the light source (115) is formed of one or more light elements (120) which define a second width (w2)which is shorter than the first width (w1) of the viewing field (VF).

Abstract: A method of and apparatus for sorting foreign matter from a flow, the method comprising the steps of: identifying objects within a flow; for each identified object, determining reflectance intensities at at least two different wavelengths or ranges of wavelengths; and for each identified object, comparing the reflectance intensities at the at least two different wavelengths or ranges of wavelengths to a reference intensity profile, wherein the identified object is characterized as foreign matter when the reflectance intensities at the at least two different wavelengths or ranges of wavelengths fall within a predetermined region of the reference intensity profile.

Abstract: A method of and apparatus for sorting foreign matter from a flow, the method comprising the steps of: identifying objects within a flow; for each identified object, determining reflectance intensities at at least two different wavelengths or ranges of wavelengths; and for each identified object, comparing the reflectance intensities at the at least two different wavelengths or ranges of wavelengths to a reference intensity profile, wherein the identified object is characterized as foreign matter when the reflectance intensities at the at least two different wavelengths or ranges of wavelengths fall within a predetermined region of the reference intensity profile.

Abstract: A chute for inspection and sorting apparatus is disclosed. It comprises two sections; a first, upper section (6) and a lower, grooved section (2). The first section has a smooth, normally polished surface which allows product pieces thereon to move laterally as well as downwards. In the lower section (2) product pieces are restricted in their lateral movement by the grooves (12) and move into alignment with the grooves before being discharged into the inspection zone (22) of the apparatus. If the apparatus is for inspection only, then the product pieces continue to a collection receptacle. If the apparatus is for sorting, then an ejector (26) is included which acts in response to signals from the inspection station to eject selected pieces from the product stream. Those are deflected into a reject receptacle (28) while the remainder proceed into the collection receptacle (24).