Patents by Inventor Benjamin E.C. Koltenbah

Benjamin E.C. Koltenbah has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Integrated surface protection system, composite structure, and method for protecting the same
    Patent number: 11220351
    Abstract: An integrated surface protection system includes a single layer comprising an electrically conductive network and a fiber reinforcement material.
    Type: Grant
    Filed: August 29, 2018
    Date of Patent: January 11, 2022
    Assignee: The Boeing Company
    Inventors: Mary S. Ayyadurai, Benjamin E. C. Koltenbah, Quynhgiao N. Le
  • INTEGRATED SURFACE PROTECTION SYSTEM, COMPOSITE STRUCTURE, AND METHOD FOR PROTECTING THE SAME
    Publication number: 20200070998
    Abstract: An integrated surface protection system includes a single layer comprising an electrically conductive network and a fiber reinforcement material.
    Type: Application
    Filed: August 29, 2018
    Publication date: March 5, 2020
    Applicant: The Boeing Company
    Inventors: Mary S. Ayyadurai, Benjamin E.C. Koltenbah, Quynhgiao N. Le
  • Quantum signal detection systems and methods
    Patent number: 10107680
    Abstract: A quantum signal detection system includes a signal source configured to emit a transmit signal towards a target, and a photon adder that is configured to add at least one photon to a return signal that reflects from the target to form a combined signal. The combined signal increases a signal to noise ratio of the return signal.
    Type: Grant
    Filed: January 13, 2016
    Date of Patent: October 23, 2018
    Assignee: The Boeing Company
    Inventors: Barbara A. Capron, Benjamin E. C. Koltenbah, Claudio Parazzoli
  • Phase measurement by phase transfer
    Patent number: 9612161
    Abstract: The present disclosure generally relates to techniques for measuring a phase difference between a first set of photons and a second set of photons. The techniques can include directing the first set of photons to a first parametric downconverter, directing the second set of photons to a second parametric downconverter, directing photons output from an exotic photon source to the first downconverter and directing photons output from the first parametric downconverter to a first beam splitter, directing photons output from an exotic photon source to the first beam splitter, directing photons output from the second parametric downconverter to a second beam splitter, directing photons output from the first beam splitter to the second beam splitter, detecting photons output from the second beam splitter, deriving, from the detecting, a phase difference between the first set of photons and the second set of photons, and outputting the phase difference.
    Type: Grant
    Filed: January 21, 2015
    Date of Patent: April 4, 2017
    Assignee: THE BOEING COMPANY
    Inventors: Barbara A. Capron, Benjamin E. C. Koltenbah, Claudio G. Parazzoli
  • Methods and systems for inspection of composite irregularities
    Patent number: 9595092
    Abstract: A method for inspecting a composite structure includes acquiring an image of the composite structure. The composite structure includes at least a first ply and a second ply adjacent the first ply. The method also includes transforming the image into a binary image, and determining a first boundary line between the first ply and the second ply. The method further includes characterizing an irregularity in the composite structure based at least partially on the first boundary line.
    Type: Grant
    Filed: May 10, 2013
    Date of Patent: March 14, 2017
    Assignee: The Boeing Company
    Inventors: Yuan-Jye Wu, Hong Tat, Benjamin E. C. Koltenbah, Vicki Wu
  • PHASE MEASUREMENT BY PHASE TRANSFER
    Publication number: 20160209274
    Abstract: The present disclosure generally relates to techniques for measuring a phase difference between a first set of photons and a second set of photons. The techniques can include directing the first set of photons to a first parametric downconverter, directing the second set of photons to a second parametric downconverter, directing photons output from an exotic photon source to the first downconverter and directing photons output from the first parametric downconverter to a first beam splitter, directing photons output from an exotic photon source to the first beam splitter, directing photons output from the second parametric downconverter to a second beam splitter, directing photons output from the first beam splitter to the second beam splitter, detecting photons output from the second beam splitter, deriving, from the detecting, a phase difference between the first set of photons and the second set of photons, and outputting the phase difference.
    Type: Application
    Filed: January 21, 2015
    Publication date: July 21, 2016
    Inventors: Barbara A. Capron, Benjamin E.C. Koltenbah, Claudio G. Parazzoli